| 1 |
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| 2 | Device Name : /dev/sdb
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| 3 |
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| 4 | ID Attribute Name Attribute Data
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| 5 |
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| 6 | 1 Raw Read Error Rate 0 Errors/Page
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| 7 |
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| 8 | 5 Reallocated NAND Block Count 0 NAND Blocks
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| 9 |
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| 10 | 9 Power On Hours Count 6 Hours
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| 11 |
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| 12 | 12 Power Cycle Count 5 Power Cycles
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| 13 |
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| 14 | 171 Program Fail Count 0 NAND Page Program Failures
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| 15 |
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| 16 | 172 Erase Fail Count 0 NAND Block Erase Failures
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| 17 |
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| 18 | 173 Block Wear-Leveling Count 1 Erases
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| 19 |
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| 20 | 174 Unexpected Power Loss Count 3 Unexpected Power Loss events
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| 21 |
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| 22 | 180 Unused Reserved Block Count 2053 Blocks
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| 23 |
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| 24 | 183 SATA Interface Downshift 0 Downshifts
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| 25 |
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| 26 | 184 Error Correction Count 0 Correction Events
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| 27 |
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| 28 | 187 Reported Uncorrectable Errors 0 ECC Correction Failures
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| 29 |
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| 30 | 194 Enclosure Temperature 33 Current Temperature (C)
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| 31 |
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| 32 | 48 Highest Lifetime Temperature (C)
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| 33 |
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| 34 | 196 Reallocation Event Count 0 Events
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| 35 |
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| 36 | 197 Current Pending ECC Count 0 ECC Counts
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| 37 |
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| 38 | 198 SMART Off-line Scan 0 Errors
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| 39 |
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| 40 | Uncorrectable Errors
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| 41 |
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| 42 | 199 Ultra-DMA CRC Error Count 0 Errors
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| 43 |
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| 44 | 202 Percentage Lifetime Remaining 100 % Lifetime Remaining
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| 45 |
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| 46 | 206 Write Error Rate 0 Program Fails/MB
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| 47 |
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| 48 | 210 RAIN Successful Recovery 0 TUs successfully recovered by
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| 49 |
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| 50 | Page Count RAIN
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| 51 |
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| 52 | 246 Cumulative Host Write 485913471 512 Byte Sectors
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| 53 |
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| 54 | Sector Count
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| 55 |
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| 56 | 247 Host Program Page Count 15184796 NAND Page
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| 57 |
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| 58 | 248 FTL Program Page Count 1712740 NAND Page
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| 59 |
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| 60 |
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| 61 | SMART attributes are retrieved successfully
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| 62 | CMD_STATUS : Success
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| 63 | STATUS_CODE : 0
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| 64 |
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| 65 | Copyright (C) 2016 Micron Technology, Inc.
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| 66 |
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