Device Name : /dev/sdb ID Attribute Name Attribute Data 1 Raw Read Error Rate 0 Errors/Page 5 Reallocated NAND Block Count 0 NAND Blocks 9 Power On Hours Count 6 Hours 12 Power Cycle Count 5 Power Cycles 171 Program Fail Count 0 NAND Page Program Failures 172 Erase Fail Count 0 NAND Block Erase Failures 173 Block Wear-Leveling Count 1 Erases 174 Unexpected Power Loss Count 3 Unexpected Power Loss events 180 Unused Reserved Block Count 2053 Blocks 183 SATA Interface Downshift 0 Downshifts 184 Error Correction Count 0 Correction Events 187 Reported Uncorrectable Errors 0 ECC Correction Failures 194 Enclosure Temperature 33 Current Temperature (C) 48 Highest Lifetime Temperature (C) 196 Reallocation Event Count 0 Events 197 Current Pending ECC Count 0 ECC Counts 198 SMART Off-line Scan 0 Errors Uncorrectable Errors 199 Ultra-DMA CRC Error Count 0 Errors 202 Percentage Lifetime Remaining 100 % Lifetime Remaining 206 Write Error Rate 0 Program Fails/MB 210 RAIN Successful Recovery 0 TUs successfully recovered by Page Count RAIN 246 Cumulative Host Write 485913471 512 Byte Sectors Sector Count 247 Host Program Page Count 15184796 NAND Page 248 FTL Program Page Count 1712740 NAND Page SMART attributes are retrieved successfully CMD_STATUS : Success STATUS_CODE : 0 Copyright (C) 2016 Micron Technology, Inc.