Opened 5 years ago

Closed 4 years ago

Last modified 15 months ago

#1241 closed defect (wontfix)

BUG: Dead ssd during Extended test (KingDian S200)

Reported by: josh.viklef Owned by:
Priority: critical Milestone:
Component: all Version: 6.6
Keywords: Cc:

Description

I made Extended test (10 minutes) and during test the ssd became KO.
I can see only small dialog : smartctrl is finding disk (or something like this)
If I restart PC, the bios cannot find SDD.

Antix Linux - Kingdian S200 60GB - I tried 2 SSD and both of them is now unreadable.

Change History (10)

in reply to:  description comment:1 by josh.viklef, 5 years ago

Test was running by GSmartControl 0.8.7.
Unfortunately I have no log file:(

Last edited 5 years ago by josh.viklef (previous) (diff)

comment:2 by Christian Franke, 4 years ago

Component: smartctlall
Priority: minorcritical
Summary: BUG: Dead sdd during Extended testBUG: Dead sdd during Extended test (KingDian S200)

This is bad news. Possibly a serious bug in S200 drive firmware. I don't remember any similar bug report.

The smartctl -t long sends a single command (SMART EXECUTE OFF-LINE IMMEDIATE with LBA_LOW=2) to start the test. This is the case since the early days (2002) of smartmontools. The actual test is done by drive firmware.

If run from GSmartControl, test execution status is frequently checked during the test.

AFAIK the KingDian S200 is, like S280 and S400, a Silicon Motion based SSD. Due to the widespread use of this controller it is unlikely that this is a common problem with Silicon Motion firmware. We got various outputs from such SSDs which show successful extended tests in the self-test logs (see for example tickets #597, #936 and #949).

All we could do for now is to add a drivedb entry which prints a related warning.

Did you use the latest S200 firmware?
Do you have any old smartctl output or other info about model and firmware identify strings?

comment:3 by josh.viklef, 4 years ago

If run from GSmartControl, test execution status is frequently checked during the test.

Yes and during one of checks the system/gsmartcontrol shows I am finding hdd (or something similar).

I have done couple of Extended test (+-5) without any problem, but now 2 SDD crashed at the same moment.
I think on the other ones were no errors before crash.

No, I am using factory firmware.
I have the last ssd, where is firmware R0724A0 (read by Gsmartcontrol) and I dont want to try Extended test :-) This one passed 7 extended tests.

Here is output of gsmartcontrol of still running ssd:

smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.9.193-0409193-lowlatency] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     KingDian S200 60GB
Serial Number:    2018101800107
Firmware Version: R0724A0
User Capacity:    60,022,480,896 bytes [60.0 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ACS-2 T13/2015-D revision 3
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 1.5 Gb/s)
Local Time is:    Mon Sep 30 18:54:13 2019 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x11) SMART execute Offline immediate.
					No Auto Offline data collection support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					No Selective Self-test supported.
SMART capabilities:            (0x0002)	Does not save SMART data before
					entering power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  10) minutes.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x0032   100   100   050    Old_age   Always       -       0
  5 Reallocated_Sector_Ct   0x0032   100   100   050    Old_age   Always       -       0
  9 Power_On_Hours          0x0032   100   100   050    Old_age   Always       -       1087
 12 Power_Cycle_Count       0x0032   100   100   050    Old_age   Always       -       406
160 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       0
161 Unknown_Attribute       0x0033   100   100   050    Pre-fail  Always       -       86
163 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       18
164 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       38689
165 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       124
166 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       3
167 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       54
168 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       7000
169 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       100
175 Program_Fail_Count_Chip 0x0032   100   100   050    Old_age   Always       -       0
176 Erase_Fail_Count_Chip   0x0032   100   100   050    Old_age   Always       -       0
177 Wear_Leveling_Count     0x0032   100   100   050    Old_age   Always       -       0
178 Used_Rsvd_Blk_Cnt_Chip  0x0032   100   100   050    Old_age   Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   050    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   050    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0032   100   100   050    Old_age   Always       -       27
194 Temperature_Celsius     0x0022   100   100   050    Old_age   Always       -       40
195 Hardware_ECC_Recovered  0x0032   100   100   050    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   100   100   050    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   100   050    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0032   100   100   050    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x0032   100   100   050    Old_age   Always       -       0
232 Available_Reservd_Space 0x0032   100   100   050    Old_age   Always       -       86
241 Total_LBAs_Written      0x0030   100   100   050    Old_age   Offline      -       24040
242 Total_LBAs_Read         0x0030   100   100   050    Old_age   Offline      -       33882
245 Unknown_Attribute       0x0032   100   100   050    Old_age   Always       -       41103

SMART Error Log Version: 1
Warning: ATA error count 0 inconsistent with error log pointer 2

ATA Error Count: 0
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 0 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 00 00 00 00 a0  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d0 01 00 4f c2 00 08      00:00:00.000  SMART READ DATA
  b0 d1 01 01 4f c2 00 08      00:00:00.000  SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
  b0 da 00 00 4f c2 00 08      00:00:00.000  SMART RETURN STATUS
  b0 d5 01 00 4f c2 00 08      00:00:00.000  SMART READ LOG
  b0 d5 01 01 4f c2 00 08      00:00:00.000  SMART READ LOG

Error -4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  04 51 00 00 00 00 a0  Error: ABRT

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  b0 d0 01 00 4f c2 00 08      00:00:00.000  SMART READ DATA
  b0 d1 01 01 4f c2 00 08      00:00:00.000  SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
  b0 da 00 00 4f c2 00 08      00:00:00.000  SMART RETURN STATUS
  b0 d5 01 00 4f c2 00 08      00:00:00.000  SMART READ LOG
  b0 d5 01 01 4f c2 00 08      00:00:00.000  SMART READ LOG

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%       821         -
# 2  Extended offline    Completed without error       00%       740         -
# 3  Extended offline    Completed without error       00%       670         -
# 4  Extended offline    Completed without error       00%       362         -
# 5  Extended offline    Completed without error       00%       152         -
# 6  Extended offline    Completed without error       00%        12         -
# 7  Extended offline    Completed without error       00%         0         -

Selective Self-tests/Logging not supported
Last edited 4 years ago by josh.viklef (previous) (diff)

comment:4 by josh.viklef, 4 years ago

Summary: BUG: Dead sdd during Extended test (KingDian S200)BUG: Dead ssd during Extended test (KingDian S200)

comment:5 by josh.viklef, 4 years ago

I remember, I upgraded ext driver (from debian repository). Is it possible, that can be the problem? I think the collision between ext driver and the firmware of ssd.

There is list of installed packages:
e2fslibs:amd64 1.43.4-2 1.43.4-2+deb9u1
e2fsprogs:amd64 1.43.4-2 1.43.4-2+deb9u1
libcomerr2:amd64 1.43.4-2 1.43.4-2+deb9u1
libss2:amd64 1.43.4-2 1.43.4-2+deb9u1

Version 5, edited 4 years ago by josh.viklef (previous) (next) (diff)

comment:6 by Christian Franke, 4 years ago

Unlikely. These are unrelated to smartctl and (AFAIK) only do regular raw-I/O through the kernel and no ATA pass-through.

comment:7 by Alex Samorukov, 4 years ago

I don't think there is anything we can do here. Device may die during test or in other time. Test can potentially cause failure faster, just due to increased disk/controller activity during it, however, most likely same would just happens during normal I/O at some point.

comment:8 by Alex Samorukov, 4 years ago

Resolution: wontfix
Status: newclosed

comment:9 by Christian Franke, 4 years ago

Milestone: undecided
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