smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.0-39-generic] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: KINGSTON SEDC1000HA480G Serial Number: 50026B725C033B16 LU WWN Device Id: 0 550380 440010057 Firmware Version: 0C4005T4 User Capacity: 480,103,981,056 bytes [480 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: M.2 Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS T13/1699-D revision 6 Transport Type: PCIe (0x000) Local Time is: Wed Mar 1 11:10:49 2017 PST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: scsi error badly formed scsi parameters Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x50) No SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x00) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 40 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 005 - 61 5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 000 100 000 - 21 12 Power_Cycle_Count -O--CK 100 100 000 - 2 100 Unknown_Attribute -O--CK 100 100 000 - 3608448 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 170 Unknown_Attribute -O--CK 000 100 000 - 0 171 Unknown_Attribute -O--CK 100 100 010 - 0 172 Unknown_Attribute -O--CK 100 100 010 - 0 174 Unknown_Attribute -O--CK 100 100 000 - 0 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 176 Erase_Fail_Count_Chip -O--CK 000 000 000 - 0 177 Wear_Leveling_Count -O--CK 100 100 000 - 27 178 Used_Rsvd_Blk_Cnt_Chip PO---- 100 100 000 - 42 180 Unused_Rsvd_Blk_Cnt_Tot ------ 100 100 000 - 17998 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 000 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 052 100 000 - 52 (Min/Max 24/55) 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 61 196 Reallocated_Event_Count PO--CK 100 100 000 - 0 197 Current_Pending_Sector ----CK 100 100 000 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 199 UDMA_CRC_Error_Count ----CK 100 100 000 - 0 201 Unknown_SSD_Attribute PO--CK 100 100 000 - 21 204 Soft_ECC_Correction ------ 100 100 000 - 61 231 Temperature_Celsius PO--CK 100 100 000 - 0 234 Unknown_Attribute PO--CK 100 100 000 - 12445 241 Total_LBAs_Written -O-RCK 100 100 000 - 9423 242 Total_LBAs_Read -O-RCK 100 100 000 - 7924 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 61 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x30 GPL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 9 Device vendor specific log 0xaa SL VS 25 Device vendor specific log 0xab SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 0 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 0 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Reserved (0x10) Completed without error 00% 0 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 0 Device State: Active (0) Current Temperature: 59 Celsius Power Cycle Min/Max Temperature: 24/55 Celsius Lifetime Min/Max Temperature: 24/55 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) Write SCT Data Table failed: scsi error badly formed scsi parameters Read SCT Temperature History failed Write SCT (Get) Error Recovery Control Command failed: scsi error badly formed scsi parameters SCT (Get) Error Recovery Control command failed Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2 --- Lifetime Power-On Resets 0x01 0x010 4 21 --- Power-on Hours 0x01 0x018 6 19763460175 --- Logical Sectors Written 0x01 0x020 6 359913494 --- Number of Write Commands 0x01 0x028 6 16618894224 --- Logical Sectors Read 0x01 0x030 6 446825933 --- Number of Read Commands 0x01 0x038 6 3600000 --- Date and Time TimeStamp 0x02 ===== = = === == Free-Fall Statistics (empty) == 0x03 ===== = = === == Rotating Media Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 52 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 0 --- Average Long Term Temperature 0x05 0x020 1 55 --- Highest Temperature 0x05 0x028 1 24 --- Lowest Temperature 0x05 0x030 1 - --- Highest Average Short Term Temperature 0x05 0x038 1 - --- Lowest Average Short Term Temperature 0x05 0x040 1 0 --- Highest Average Long Term Temperature 0x05 0x048 1 0 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 6 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) not supported