smartctl 6.3 2014-07-26 r3976 [i686-w64-mingw32-win7(64)-sp1] (sf-6.3-1) Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HFS512G32MND-3210A Firmware Version: 20100P00 User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed May 25 18:00:43 2016 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 7) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 60) minutes. SMART Attributes Data Structure revision number: 0 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 166 166 006 - 0 5 Reallocated_Sector_Ct -O--CK 253 253 036 - 0 9 Power_On_Hours -O--CK 100 100 000 - 451 12 Power_Cycle_Count -O--CK 100 100 020 - 6234 100 Unknown_Attribute -O--CK 100 100 000 - 8586025 171 Unknown_Attribute -O--CK 253 253 000 - 0 172 Unknown_Attribute -O--CK 253 253 000 - 0 174 Unknown_Attribute ----CK 100 100 000 - 6217 175 Program_Fail_Count_Chip -O--CK 253 253 000 - 0 176 Erase_Fail_Count_Chip -O--CK 253 253 000 - 0 177 Wear_Leveling_Count -O--CK 099 099 000 - 52 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 27 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 327 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 8505 181 Program_Fail_Cnt_Total -O--CK 253 253 000 - 0 182 Erase_Fail_Count_Total -O--CK 253 253 000 - 0 183 Runtime_Bad_Block -O--CK 100 100 000 - 2 187 Reported_Uncorrect -O--CK 253 253 000 - 0 188 Command_Timeout -O--CK 253 253 000 - 0 191 Unknown_SSD_Attribute -O--CK 253 253 000 - 0 194 Temperature_Celsius -O---- 028 000 000 - 28 (Min/Max 21/54) 195 Hardware_ECC_Recovered -O--CK 253 253 000 - 0 201 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0 204 Soft_ECC_Correction -OSR-- 100 100 000 - 0 231 Temperature_Celsius PO--CK 253 253 010 - 0 234 Unknown_Attribute -O--CK 100 100 000 - 21653 241 Total_LBAs_Written -O--CK 100 100 000 - 16606 242 Total_LBAs_Read -O--CK 100 100 000 - 579 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 160 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 4 Comprehensive SMART error log 0x03 GPL R/O 5 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 2 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters 0x30 GPL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (5 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 451 - # 2 Short offline Completed without error 00% 69 - # 3 Extended offline Aborted by host 90% 69 - # 4 Extended offline Completed without error 00% 68 - # 5 Short offline Completed without error 00% 67 - # 6 Short offline Completed without error 00% 9 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Description 1 ===== = = == General Statistics (empty) == 4 ===== = = == General Errors Statistics (empty) == 5 ===== = = == Temperature Statistics (empty) == 6 ===== = = == Transport Statistics (empty) == 7 ===== = = == Solid State Device Statistics (rev 1) == SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET