smartctl 6.4 (build date Jun 5 2015) [x86_64-apple-darwin10.8.0] (local build) Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TS256GSSD370S Firmware Version: N1114H User Capacity: 256 060 514 304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Jul 19 19:44:28 2015 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x71) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 9 Power_On_Hours ------ 100 100 000 - 2 12 Power_Cycle_Count ------ 100 100 000 - 11 160 Unknown_Attribute ------ 100 100 000 - 0 161 Unknown_Attribute ------ 100 100 000 - 45 163 Unknown_Attribute ------ 100 100 000 - 24 164 Unknown_Attribute ------ 100 100 000 - 703 165 Unknown_Attribute ------ 100 100 000 - 5 166 Unknown_Attribute ------ 100 100 000 - 0 167 Unknown_Attribute ------ 100 100 000 - 0 168 Unknown_Attribute ------ 100 100 000 - 3000 169 Unknown_Attribute ------ 100 100 000 - 100 175 Program_Fail_Count_Chip ------ 100 100 000 - 0 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0 177 Wear_Leveling_Count ------ 100 100 050 - 0 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 192 Power-Off_Retract_Count ------ 100 100 000 - 5 194 Temperature_Celsius ------ 100 100 000 - 30 195 Hardware_ECC_Recovered ------ 100 100 000 - 116 196 Reallocated_Event_Count ------ 100 100 016 - 0 197 Current_Pending_Sector ------ 100 100 000 - 0 198 Offline_Uncorrectable ------ 100 100 000 - 0 199 UDMA_CRC_Error_Count ------ 100 100 050 - 2 232 Available_Reservd_Space ------ 100 100 000 - 100 241 Total_LBAs_Written ------ 100 100 000 - 4766 242 Total_LBAs_Read ------ 100 100 000 - 1813 245 Unknown_Attribute ------ 100 100 000 - 5624 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 SL R/O 1 Ext. Comprehensive SMART error log 0x04 SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 SL R/O 1 SATA NCQ Queued Error log 0x30 SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (SMART Log 0x04) Page Offset Size Value Flags Description ATA_SMART_READ_LOG failed: Undefined error: 0 Read Device Statistics pages 0x00-0x07 failed SATA Phy Event Counters (GP Log 0x11) not supported