smartctl 6.1 2013-03-16 r3800 [x86_64-w64-mingw32-win7-sp1] (sf-6.1-1) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: KINGSTON SV200S3128G Serial Number: 12BA319XKAWK Firmware Version: E120506a User Capacity: 128 035 676 160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sat Apr 06 22:37:18 2013 SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 32) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off supp ort. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 1) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_ FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 1698 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 1511 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 1 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 0 173 Unknown_Attribute 0x0012 200 200 000 Old_age Always - 0 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0023 048 048 030 Pre-fail Always - 48 (Min/Max 31/49) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 1537 hours (64 days + 1 hours) When the command that caused the error occurred, the device was active or idle . After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 00 00 00 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ec 00 00 00 00 00 00 00 00:19:35.000 IDENTIFY DEVICE e5 00 00 00 00 00 00 ff 00:19:34.500 CHECK POWER MODE b0 da 00 00 4f c2 00 00 00:17:57.100 SMART RETURN STATUS ef 02 00 00 00 00 a0 00 00:17:57.100 SET FEATURES [Enable write cache] ef aa 00 00 00 00 a0 00 00:17:57.100 SET FEATURES [Enable read look-ahea d] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.