C:\>smartctl -t short /dev/sdc smartctl 7.5 2025-04-30 r5714 [x86_64-w64-mingw32-w11-b26200] (AppVeyor) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Sending command: "Execute SMART Short self-test routine immediately in off-line mode". Drive command "Execute SMART Short self-test routine immediately in off-line mode" successful. Testing has begun. Please wait 2 minutes for test to complete. Test will complete after Thu Apr 23 18:08:08 2026 MDT Use smartctl -X to abort test. C:\> C:\>smartctl -x -a /dev/sdc smartctl 7.5 2025-04-30 r5714 [x86_64-w64-mingw32-w11-b26200] (AppVeyor) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: BIWIN Storage Technology SSDs Device Model: Acer SSD SA100 480GB Serial Number: ASBA32130200120 Firmware Version: U0302B0 User Capacity: 480,103,981,056 bytes [480 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Apr 23 18:09:03 2026 MDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 9 Power_On_Hours -O--CK 100 100 050 - 11864 12 Power_Cycle_Count -O--CK 100 100 050 - 96 160 Uncorrectable_Sectors -O--CK 100 100 050 - 0 161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100 163 Initial_Bad_Block_Count -O--CK 100 100 050 - 19 164 Total_Erase_Count -O--CK 100 100 050 - 4159 165 Max_Erase_Count -O--CK 100 100 050 - 49 166 Min_Erase_Count -O--CK 100 100 050 - 2 167 Average_Erase_Count -O--CK 100 100 050 - 23 168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 5050 169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 192 Power-Off_Retract_Count -O--CK 100 100 050 - 25 194 Device_Temperature -O---K 100 100 050 - 62 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 197 Current_Pending_Sector -O--CK 100 100 050 - 0 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 1 232 Available_Reservd_Space -O--CK 100 100 050 - 100 241 Total_LBAs_Written ----CK 100 100 050 - 119518 242 Total_LBAs_Read ----CK 100 100 050 - 118664 245 Flash_Writes_Sectors -O--CK 100 100 050 - 91239 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x25 GPL R/O 32 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] log entry is empty SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error -3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 00 00 00 00 00 00 at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 10 00 00 00 00 40 00 00:00:00.000 READ FPDMA QUEUED b0 d4 00 01 4f c2 00 00 00:00:00.000 SMART EXECUTE OFF-LINE IMMEDIATE ec 00 01 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE b0 d0 01 00 4f c2 00 00 00:00:00.000 SMART READ DATA ec 00 01 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 11864 - # 2 Short offline Completed without error 00% 11863 - # 3 Short offline Completed without error 00% 11863 - SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 11864 - # 2 Short offline Completed without error 00% 11863 - # 3 Short offline Completed without error 00% 11863 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 96 --- Lifetime Power-On Resets 0x01 0x010 4 11864 --- Power-on Hours 0x01 0x018 6 3537776140 --- Logical Sectors Written 0x01 0x020 6 167027833 --- Number of Write Commands 0x01 0x028 6 3481845869 --- Logical Sectors Read 0x01 0x030 6 68683084 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET C:\>