smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.15.0-117-generic] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: ATP SATA III aMLC M.2 2280 Embedded SSD Device Model: ATP I-Temp M.2 2280 Serial Number: 99001200831100003111 LU WWN Device Id: 0 000000 000000000 Firmware Version: R0822A User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Apr. 18 13:12:07 2023 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unknown === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x71) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 1) minutes. Conveyance self-test routine recommended polling time: ( 1) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Count ------ 100 100 000 - 0 5 Reallocated_Sectors ------ 100 100 000 - 0 9 Power_On_Hours ------ 100 100 000 - 18 12 Power_Cycle_Count ------ 100 100 000 - 15 14 Device_Raw_Capacity ------ 100 100 000 - 287309824 15 Device_User_Capacity ------ 100 100 000 - 250000000 16 Initial_Spare_Blocks ------ 100 100 000 - 39 17 Remaining_Spare_Blocks ------ 100 100 000 - 39 100 Total_Erease_Count ------ 100 100 000 - 1 160 Uncorrectable_Sectors ------ 100 100 000 - 0 172 Block_Erase_Failure ------ 100 100 000 - 0 173 Max_Erase_Count ------ 100 100 000 - 1 174 Unexpected_Power_Cycle ------ 100 100 000 - 0 175 Average_Erase_Count ------ 100 100 000 - 0 181 Program_Fail_Blocks ------ 100 100 000 - 0 187 Reported_UE_Counts ------ 100 100 000 - 0 194 Device_Temperature ------ 039 041 000 - 39 195 Hardware_ECC_Recovered PO---- 100 100 000 - 0 197 Pending_Block_Counts ------ 100 100 000 - 0 198 Offline_Surface_Scan ------ 100 100 000 - 0 199 SATA_FIS_CRC_Errors ------ 100 100 000 - 0 202 PCT_Drive_Life_Used ------ 100 100 000 - 0 205 Thermal_Asperity_Rate ------ 100 100 000 - 0 231 Controller_Temperature ------ 052 056 000 - 52 234 Nand_Sectors_Read ------ 100 100 000 - 192000 235 Device_Sectors_Written ------ 100 100 000 - 0 241 Nand_Sectors_Written ------ 100 100 000 - 169344 242 Device_Bytes_Read ------ 100 100 000 - 13214 248 PCT_Life_Remaining ------ 100 100 005 - 100 249 Spare_Block_Remaining ------ 100 100 020 - 100 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 18 - # 2 Short offline Completed without error 00% 14 - # 3 Short offline Self-test routine in progress 60% 14 - # 4 Short offline Self-test routine in progress 30% 14 - # 5 Short offline Completed without error 00% 14 - # 6 Short offline Self-test routine in progress 50% 14 - # 7 Short offline Completed without error 00% 0 - # 8 Short offline Completed without error 00% 0 - # 9 Short offline Completed without error 00% 0 - #10 Abort offline test Aborted by host 00% 0 - #11 Short offline Self-test routine in progress 20% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 7 0 65535 Read_scanning was completed without error Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) SCT Support Level: 0 Device State: Active (0) Current Temperature: 0 Celsius Power Cycle Min/Max Temperature: 36/52 Celsius Lifetime Min/Max Temperature: 0/56 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/100 Celsius Min/Max Temperature Limit: 0/100 Celsius Temperature History Size (Index): 128 (98) Index Estimated Time Temperature Celsius 99 2020-09-10 11:05 52 ********************************* ... ..(126 skipped). .. ********************************* 98 2020-09-10 13:12 52 ********************************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 15 --- Lifetime Power-On Resets 0x01 0x010 4 18 --- Power-on Hours 0x01 0x018 6 0 --- Logical Sectors Written 0x01 0x020 6 0 --- Number of Write Commands 0x01 0x028 6 13214 --- Logical Sectors Read 0x01 0x030 6 480 --- Number of Read Commands 0x02 ===== = = === == Free-Fall Statistics (empty) == 0x03 ===== = = === == Rotating Media Statistics (empty) == 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (empty) == 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 11 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) not supported