smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-137-generic] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA THNSNJ128GCSU Serial Number: 45AS10OKTB3W LU WWN Device Id: 5 00080d 910376d23 Firmware Version: JURA0101 User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Oct 17 08:08:00 2018 MDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0 2 Throughput_Performance P-S--- 100 100 050 - 0 3 Spin_Up_Time POS--- 100 100 050 - 0 5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0 7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0 8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0 9 Power_On_Hours -O--C- 100 100 000 - 23249 10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0 12 Power_Cycle_Count -O--C- 100 100 000 - 76 167 Unknown_Attribute -O---K 100 100 000 - 0 168 Unknown_Attribute -O--C- 100 100 000 - 0 169 Unknown_Attribute PO--C- 100 100 010 - 100 173 Unknown_Attribute -O--C- 193 193 000 - 0 175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0 192 Power-Off_Retract_Count -O--C- 100 100 000 - 47 194 Temperature_Celsius PO---K 074 065 020 - 26 (Min/Max 20/35) 197 Current_Pending_Sector -O--C- 100 100 000 - 0 240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (64 sectors) Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 7509 hours (312 days + 21 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 84 -- 51 00 28 00 00 b0 72 87 d8 ee 08 Error: ICRC, ABRT at LBA = 0xbe7287d8 = 3195176920 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- ca 00 00 00 28 72 87 b0 72 87 d8 ee 08 27d+11:58:59.005 WRITE DMA ca 00 00 00 20 72 87 48 72 87 b0 ee 08 27d+11:58:59.004 WRITE DMA ca 00 00 00 48 72 87 10 72 87 48 ee 08 27d+11:58:59.004 WRITE DMA ca 00 00 00 18 72 87 00 72 87 10 ee 08 27d+11:58:59.004 WRITE DMA ca 00 00 00 08 72 86 e0 72 87 00 ee 08 27d+11:58:59.004 WRITE DMA SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 23249 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 3 (0x0003) SCT Support Level: 0 Device State: Active (0) Current Temperature: 26 Celsius Power Cycle Min/Max Temperature: 23/28 Celsius Lifetime Min/Max Temperature: 20/35 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 00 00 04 00 01 01 00 05 05 00 00 00 00 00 00 00 00 02 00 00 fc 26 fd 04 02 02 00 00 00 00 00 06 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 5/40 Celsius Min/Max Temperature Limit: 0/80 Celsius Temperature History Size (Index): 128 (6) Index Estimated Time Temperature Celsius 7 2018-10-17 06:01 26 ******* 8 2018-10-17 06:02 25 ****** 9 2018-10-17 06:03 25 ****** 10 2018-10-17 06:04 26 ******* 11 2018-10-17 06:05 25 ****** 12 2018-10-17 06:06 26 ******* 13 2018-10-17 06:07 26 ******* 14 2018-10-17 06:08 26 ******* 15 2018-10-17 06:09 25 ****** 16 2018-10-17 06:10 26 ******* ... ..(108 skipped). .. ******* 125 2018-10-17 07:59 26 ******* 126 2018-10-17 08:00 28 ********* 127 2018-10-17 08:01 28 ********* 0 2018-10-17 08:02 27 ******** 1 2018-10-17 08:03 27 ******** 2 2018-10-17 08:04 27 ******** 3 2018-10-17 08:05 26 ******* ... ..( 2 skipped). .. ******* 6 2018-10-17 08:08 26 ******* SCT Error Recovery Control: Read: 600 (60.0 seconds) Write: 600 (60.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 76 --- Lifetime Power-On Resets 0x01 0x018 6 4465687868 --- Logical Sectors Written 0x01 0x020 6 61310078 --- Number of Write Commands 0x01 0x028 6 824941262 --- Logical Sectors Read 0x01 0x030 6 14270413 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 26 --- Current Temperature 0x05 0x010 1 24 --- Average Short Term Temperature 0x05 0x018 1 24 --- Average Long Term Temperature 0x05 0x020 1 32 --- Highest Temperature 0x05 0x028 1 22 --- Lowest Temperature 0x05 0x030 1 29 --- Highest Average Short Term Temperature 0x05 0x038 1 22 --- Lowest Average Short Term Temperature 0x05 0x040 1 26 --- Highest Average Long Term Temperature 0x05 0x048 1 23 --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 40 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 5 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 775 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 7 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 18 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 19 Device-to-host register FISes sent due to a COMRESET 0x000b 4 0 CRC errors within host-to-device FIS 0x000d 4 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC