smartctl 6.6 2017-11-05 r4594 [x86_64-x86pc-nto-qnx7.0.0] (local build) Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Samsung SSD 860 PRO 1TB Firmware Version: RVM01B6Q User Capacity: 1,024,209,543,168 bytes [1.02 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Oct 12 11:38:16 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Write SCT (Get) Feature Control Command failed: No error Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 2 177 Wear_Leveling_Count PO--C- 100 100 000 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 075 071 000 - 25 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0 235 Unknown_Attribute -O--C- 100 100 000 - 0 241 Total_LBAs_Written -O--CK 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x04 SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x30 SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce-0xcf SL VS 16 Device vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 25 Celsius Power Cycle Min/Max Temperature: 22/22 Celsius Lifetime Min/Max Temperature: 40/40 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) Write SCT Data Table failed: No error Read SCT Temperature History failed Write SCT (Get) Error Recovery Control Command failed: No error SCT (Get) Error Recovery Control command failed Device Statistics (SMART Log 0x04) Page Offset Size Value Flags Description ATA_SMART_READ_LOG failed: Multi-sector ATA commands not implemented Read Device Statistics pages 0x00-0x07 failed Pending Defects log (GP Log 0x0c) not supported ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented Read SATA Phy Event Counters failed