Output diff showing that it's picking up the drives appropriately. root@prod-data06-block01:/var/tmp/smartmontools-code-r4761-trunk-smartmontools# smartctl -i /dev/sds smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.19.0-80-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Micron_5100_MTFDDAK3T8TCB Serial Number: 173219FBD8ED LU WWN Device Id: 5 00a075 119fbd8ed Firmware Version: D0MU410 User Capacity: 3,840,755,982,336 bytes [3.84 TB] Sector Sizes: 512 bytes logical, 8192 bytes physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3 (unknown minor revision code: 0x006d) SATA Version is: SATA >3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 21 21:59:29 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled root@prod-data06-block01:/var/tmp/smartmontools-code-r4761-trunk-smartmontools# ./smartctl -i /dev/sds smartctl 6.7 2018-08-20 r4761 [x86_64-linux-3.19.0-80-generic] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org Internal error: unable to compile regular expression "Crucial_CT(128|256|512)MX100SSD1|Crucial_CT(200|250|256|500|512|1000|1024)MX200SSD[1346]|Crucial_CT(275|525|1050|2050)MX300SSD[14]|Crucial_CT(120|240|480|960)M500SSD[134]|Crucial_CT(128|256|512|1024)M550SSD[134]|Micron_M500_MTFDDA[KTV](120|240|480|960)MAV|(Micron_)?M510[_-]MTFDDA[KTV](128|256)MAZ|(Micron_)?M550[_-]MTFDDA[KTV](064|128|256|512|1T0)MAY|Micron_M600_(EE|MT)FDDA[KTV](128|256|512|1T0)MBF[25Z]?|Micron_M500DC_(EE|MT)FDDA[AK](120|240|480|800)MBB|Micron_1100_MTFDDA[KV](256|512|1T0|2T0)TBN|MICRON_M510DC_(EE|MT)FDDAK(120|240|480|800|960)MBP|": Empty '|' subexpression Please inform smartmontools developers at smartmontools-support@listi.jpberlin.de === START OF INFORMATION SECTION === Model Family: Micron 5100 Pro / 5200 drives Device Model: Micron_5100_MTFDDAK3T8TCB Serial Number: 173219FBD8ED LU WWN Device Id: 5 00a075 119fbd8ed Firmware Version: D0MU410 User Capacity: 3,840,755,982,336 bytes [3.84 TB] Sector Sizes: 512 bytes logical, 8192 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 21 21:59:40 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled root@prod-data06-block01:/var/tmp/smartmontools-code-r4761-trunk-smartmontools# smartctl -a /dev/sds smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.19.0-80-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Micron_5100_MTFDDAK3T8TCB Serial Number: 173219FBD8ED LU WWN Device Id: 5 00a075 119fbd8ed Firmware Version: D0MU410 User Capacity: 3,840,755,982,336 bytes [3.84 TB] Sector Sizes: 512 bytes logical, 8192 bytes physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3 (unknown minor revision code: 0x006d) SATA Version is: SATA >3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 21 22:00:35 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (13395) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 24) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x0035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 1 5 Reallocated_Sector_Ct 0x0032 100 100 001 Old_age Always - 2 9 Power_On_Hours 0x0032 100 100 001 Old_age Always - 3951 12 Power_Cycle_Count 0x0032 100 100 001 Old_age Always - 2 170 Unknown_Attribute 0x0033 100 100 010 Pre-fail Always - 2 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 001 Old_age Always - 0 173 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 29 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 1 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0 184 End-to-End_Error 0x0032 100 100 000 Old_age Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 2 194 Temperature_Celsius 0x0022 074 068 000 Old_age Always - 26 (Min/Max 22/32) 195 Hardware_ECC_Recovered 0x0032 100 100 000 Old_age Always - 1 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 2 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 202 Unknown_SSD_Attribute 0x0030 100 100 001 Old_age Offline - 0 206 Unknown_SSD_Attribute 0x000e 100 100 000 Old_age Always - 0 246 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 198702929693 247 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 6807826787 248 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 5570175058 180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 000 000 000 Pre-fail Always - 108339 210 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 4 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Vendor (0xff) Completed without error 00% 88 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. root@prod-data06-block01:/var/tmp/smartmontools-code-r4761-trunk-smartmontools# ./smartctl -a /dev/sds smartctl 6.7 2018-08-20 r4761 [x86_64-linux-3.19.0-80-generic] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org Internal error: unable to compile regular expression "Crucial_CT(128|256|512)MX100SSD1|Crucial_CT(200|250|256|500|512|1000|1024)MX200SSD[1346]|Crucial_CT(275|525|1050|2050)MX300SSD[14]|Crucial_CT(120|240|480|960)M500SSD[134]|Crucial_CT(128|256|512|1024)M550SSD[134]|Micron_M500_MTFDDA[KTV](120|240|480|960)MAV|(Micron_)?M510[_-]MTFDDA[KTV](128|256)MAZ|(Micron_)?M550[_-]MTFDDA[KTV](064|128|256|512|1T0)MAY|Micron_M600_(EE|MT)FDDA[KTV](128|256|512|1T0)MBF[25Z]?|Micron_M500DC_(EE|MT)FDDA[AK](120|240|480|800)MBB|Micron_1100_MTFDDA[KV](256|512|1T0|2T0)TBN|MICRON_M510DC_(EE|MT)FDDAK(120|240|480|800|960)MBP|": Empty '|' subexpression Please inform smartmontools developers at smartmontools-support@listi.jpberlin.de === START OF INFORMATION SECTION === Model Family: Micron 5100 Pro / 5200 drives Device Model: Micron_5100_MTFDDAK3T8TCB Serial Number: 173219FBD8ED LU WWN Device Id: 5 00a075 119fbd8ed Firmware Version: D0MU410 User Capacity: 3,840,755,982,336 bytes [3.84 TB] Sector Sizes: 512 bytes logical, 8192 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 21 22:00:58 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (13395) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 24) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x0035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 1 5 Reallocated_Block_Count 0x0032 100 100 001 Old_age Always - 2 9 Power_On_Hours 0x0032 100 100 001 Old_age Always - 3951 12 Power_Cycle_Count 0x0032 100 100 001 Old_age Always - 2 170 Reserved_Block_Pct 0x0033 100 100 010 Pre-fail Always - 2 171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 0 172 Erase_Fail_Count 0x0032 100 100 001 Old_age Always - 0 173 Avg_Block-Erase_Count 0x0032 100 100 000 Old_age Always - 29 174 Unexpect_Power_Loss_Ct 0x0032 100 100 000 Old_age Always - 1 183 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0 184 Error_Correction_Count 0x0032 100 100 000 Old_age Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 188 Command_Timeouts 0x0032 100 100 000 Old_age Always - 2 194 Temperature_Celsius 0x0022 074 068 000 Old_age Always - 26 (Min/Max 22/32) 195 Cumulativ_Corrected_ECC 0x0032 100 100 000 Old_age Always - 1 196 Reallocation_Event_Ct 0x0032 100 100 000 Old_age Always - 2 197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 202 Percent_Lifetime_Remain 0x0030 100 100 001 Old_age Offline - 0 206 Write_Error_Rate 0x000e 100 100 000 Old_age Always - 0 246 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 198703185589 247 Host_Program_Page_Count 0x0032 100 100 000 Old_age Always - 6807835265 248 Bckgnd_Program_Page_Cnt 0x0032 100 100 000 Old_age Always - 5570185333 180 Reserved_Block_Count 0x0033 000 000 000 Pre-fail Always - 108339 210 Write_Error_Rate 0x0032 100 100 000 Old_age Always - 4 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Vendor (0xff) Completed without error 00% 88 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. root@stage2-data11-block01:/home/adatri# /var/tmp/smartctl -i /dev/sdd smartctl 6.7 2018-08-20 r4761 [x86_64-linux-3.19.0-80-generic] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org Internal error: unable to compile regular expression "Crucial_CT(128|256|512)MX100SSD1|Crucial_CT(200|250|256|500|512|1000|1024)MX200SSD[1346]|Crucial_CT(275|525|1050|2050)MX300SSD[14]|Crucial_CT(120|240|480|960)M500SSD[134]|Crucial_CT(128|256|512|1024)M550SSD[134]|Micron_M500_MTFDDA[KTV](120|240|480|960)MAV|(Micron_)?M510[_-]MTFDDA[KTV](128|256)MAZ|(Micron_)?M550[_-]MTFDDA[KTV](064|128|256|512|1T0)MAY|Micron_M600_(EE|MT)FDDA[KTV](128|256|512|1T0)MBF[25Z]?|Micron_M500DC_(EE|MT)FDDA[AK](120|240|480|800)MBB|Micron_1100_MTFDDA[KV](256|512|1T0|2T0)TBN|MICRON_M510DC_(EE|MT)FDDAK(120|240|480|800|960)MBP|": Empty '|' subexpression Please inform smartmontools developers at smartmontools-support@listi.jpberlin.de === START OF INFORMATION SECTION === Model Family: Micron 5100 Pro / 5200 drives Device Model: Micron_5200_MTFDDAK3T8TDD Serial Number: 18231D36A0D9 LU WWN Device Id: 5 00a075 11d36a0d9 Firmware Version: D1MU505 User Capacity: 3,840,755,982,336 bytes [3.84 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-3 T13/2161-D revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Aug 21 22:05:36 2018 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled