Custom Query (1359 matches)

Product number: WD40EFPX

Link: ​https://www.westerndigital.com/de-de/products/internal-drives/wd-red-plus-sata-3-5-hdd#WD40EFPX

Hello,

I'm unsure if this is a request for an enhancement or a case like "works as designed". So I apologize in advance if I'm wrong.

I'm using two RaidSonic ICY BOX IB-1922MF-C32 USB to NVMe bridges which have an ASMedia ASM2364 chipset inside. smartmontool is able to print out some information (please see attached outputs). But what moved me to open this ticket are the last lines of the output:

Warning: NVMe Get Log truncated to 0x200 bytes, 0x200 bytes zero filled Error Information (NVMe Log 0x01, 16 of 256 entries)

No matter what tests I run, I don't get any attributes displayed.

Thank you in advance for your support! If you need additional information, outputs, ... please let me know!

Hi wonderful smartmontools folks,

Samsung seem to have changed the exposed SMART attributes in a recent hardware or firmware update for the 870 EVO.

1. Attributes Current_Pending_Sector 197 and Offline_Uncorrectable 198 are not exposed, and smartd notes this in the system log. I'm not sure if this requires a database update.

2. An unknown attribute 252 is exposed. I can't find any official documentation from Samsung, but based on ​this forum thread and ​this drivedb entry, I believe it is "Newly Added Bad Flash Block: The Newly Added Bad Flash Block attribute indicates the total number of bad flash blocks the drive detected since it was first initialized in manufacturing."

Per the FAQ instructions, I've attached the output of smartctl -x /dev/sda after a short offline test.

Please let me know if I can provide any further help.

Cheers,

Julie