Attached is a smartctl -x dump from a new 14tb Western Digital 3.5" drive.

Due to ddrescue: Write error: No space left on device, I spotted a difference in the smartctl reported user capacity, and the actual user capacity.

Reported user capacity: 3000592982016 Actual user capacity: 3000592979968 Difference: 2048 bytes

# smartctl -q noserial -x /dev/sdd
smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.17.10-1-ARCH] (local build)
Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Toshiba 2.5" HDD MQ03UBB...
Device Model:     TOSHIBA MQ03UBB300
Firmware Version: JP050U
User Capacity:    3,000,592,982,016 bytes [3.00 TB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        In smartctl database [for details use: -P show]

Hello,

I have 4 Samsung drives running in RAID 5 on Centos 5.5, smartctl version 5.38.

I get this error every few days for 2 of 4 drives (HD502HJ): "Device: /dev/sdd, 209480318976 Currently unreadable (pending) sectors" (always 209480318976) followed by this: "Device: /dev/sdb, Failed SMART usage Attribute: 197 Current_Pending_Sector." Everything else seems to be OK: # smartctl -a /dev/sdd smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is ​http://smartmontools.sourceforge.net/

START OF INFORMATION SECTION

Device Model: SAMSUNG HD502HJ Serial Number: S20BJ9BZXXXXXX Firmware Version: 1AJ10001 User Capacity: 500,107,862,016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: Not recognized. Minor revision code: 0x28 Local Time is: Sat Dec 11 19:51:32 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability. SMART support is: Enabled

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: PASSED

General SMART Values: Offline data collection status: (0x80) Offline data collection activity

was never started. Auto Offline Data Collection: Enabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever been run.

Total time to complete Offline data collection: (4800) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode. Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003f) SCT Status supported.

SCT Feature Control supported. SCT Data Table supported.

SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 6 2 Throughput_Performance 0x0026 054 053 000 Old_age Always - 4519 3 Spin_Up_Time 0x0023 086 083 025 Pre-fail Always - 4462 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2036

10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 055 000 Old_age Always - 33 (Lifetime Min/Max? 22/45) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 76 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 14 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

SMART Error Log Version: 1 ATA Error Count: 76 (device log contains only the most recent five errors)

CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head? Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 76 occurred at disk power-on lifetime: 1903 hours (79 days + 7 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG 35 00 08 1a 2d 11 e0 0a 00:12:14.194 WRITE DMA EXT c8 00 08 6a e0 5d ee 0a 00:12:14.194 READ DMA ca 00 08 92 2b 43 e0 0a 00:12:14.194 WRITE DMA

Error 75 occurred at disk power-on lifetime: 1899 hours (79 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG ea 00 00 99 44 1c e0 0a 00:12:01.593 FLUSH CACHE EXIT 35 00 08 92 44 1c e0 0a 00:12:01.593 WRITE DMA EXT ea 00 00 00 4f c2 e0 0a 00:12:01.593 FLUSH CACHE EXIT

Error 74 occurred at disk power-on lifetime: 1894 hours (78 days + 22 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA b0 da 00 00 4f c2 00 0a 00:11:41.793 SMART RETURN STATUS ea 00 00 99 44 1c e0 0a 00:11:41.790 FLUSH CACHE EXIT 35 00 08 92 44 1c e0 0a 00:11:41.790 WRITE DMA EXT

Error 73 occurred at disk power-on lifetime: 1886 hours (78 days + 14 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 01 4f c2 00 0a 00:11:12.993 SMART READ LOG b0 d5 01 06 4f c2 00 0a 00:11:12.993 SMART READ LOG b0 d0 01 00 4f c2 00 0a 00:11:12.993 SMART READ DATA b0 da 00 00 4f c2 00 0a 00:11:12.993 SMART RETURN STATUS ea 00 00 99 44 1c e0 0a 00:11:12.993 FLUSH CACHE EXIT

Error 72 occurred at disk power-on lifetime: 1866 hours (77 days + 18 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA 25 00 90 19 08 ef e0 0a 00:10:00.993 READ DMA EXT 25 00 90 81 07 ef e0 0a 00:10:00.993 READ DMA EXT 35 00 08 72 b9 41 e0 0a 00:10:00.993 WRITE DMA EXT

SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime?(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 2021 - # 2 Short offline Completed without error 00% 2019 - # 3 Short offline Completed without error 00% 1995 - # 4 Short offline Completed without error 00% 1971 - # 5 Short offline Completed without error 00% 1947 - # 6 Short offline Completed without error 00% 1922 - # 7 Short offline Completed without error 00% 1899 - # 8 Short offline Completed without error 00% 1875 - # 9 Extended offline Completed without error 00% 1854 - #10 Short offline Completed without error 00% 1851 - #11 Short offline Completed without error 00% 1827 - #12 Short offline Completed without error 00% 1803 - #13 Short offline Completed without error 00% 1779 - #14 Short offline Completed without error 00% 1755 - #15 Short offline Completed without error 00% 1731 - #16 Short offline Completed without error 00% 1707 - #17 Extended offline Completed without error 00% 1686 - #18 Short offline Completed without error 00% 1684 - #19 Short offline Completed without error 00% 1660 - #20 Short offline Completed without error 00% 1636 - #21 Short offline Completed without error 00% 1612 -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.