Custom Query (1433 matches)
Results (160 - 162 of 1433)
Ticket | Resolution | Summary | Owner | Reporter |
---|---|---|---|---|
#1048 | duplicate | add to drivedb: WD WDS500G2B0A | ||
Description |
2nd Generation WD Blue SSD (3D NAND). Same as G1. |
|||
#1065 | duplicate | Crucial CT525MX300SSD1 | ||
Description |
For my Crucial_CT525MX300SSD1 smartctl displays some unknown attributes. The Crucial Windows tool is disable to display a text for the attributes: 1 Raw Read Error Rate 0 Errors/Page 5 Reallocated NAND Block Count 0 NAND Blocks 9 Power On Hours Count 4105 Hours 12 Power Cycle Count 162 Power Cycles 171 Program Fail Count 0 NAND Page Program Failures 172 Erase Fail Count 0 NAND Block Erase Failures 173 Block Wear-Leveling Count 1 Erases 174 Unexpected Power Loss Count 36 Unexpected Power Loss events 180 Unused Reserved Block Count 1944 Blocks 183 SATA Interface Downshift 0 Downshifts 184 Error Correction Count 0 Correction Events 187 Reported Uncorrectable Errors 0 ECC Correction Failures 194 Enclosure Temperature 38 Current Temperature (C) 42 Highest Lifetime Temperature (C) 196 Reallocation Event Count 0 Events 197 Current Pending ECC Count 0 ECC Counts 198 SMART Off-line Scan Uncorrectable Errors 0 Errors 199 Ultra-DMA CRC Error Count 0 Errors 202 Percentage Lifetime Remaining 100 % Lifetime Remaining 206 Write Error Rate 0 Program Fails/MB 210 RAIN Successful Recovery Page Count 0 TUs successfully recovered by RAIN 246 Cumulative Host Sectors Written 117699770 512 Byte Sectors 247 Host Program Page Count 3678152 NAND Page 248 FTL Program Page Count 1287065 NAND Page Please, add support for attributes 171-174, 202-248 with the texts above. My current version is smartctl 6.6 2016-05-31 r4324. |
|||
#1068 | duplicate | Samsung SSD 860 PRO not in Database | ||
Description |
smartctl 6.5 2016-05-07 r4318 [FreeBSD 10.3-STABLE amd64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Samsung SSD 860 PRO 256GB Serial Number: XXX LU WWN Device Id: XXX Firmware Version: RVM01B6Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: Unknown(0x09fc), ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Aug 20 14:04:53 2018 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unknown (0xffff) === START OF READ SMART DATA SECTION === Error SMART Status command failed Please get assistance from http://www.smartmontools.org/ Register values returned from SMART Status command are: CMD=0xb0 FR =0xda NS =0xffff SC =0xff CL =0xff CH =0xff RETURN =0x0000 SMART overall-health self-assessment test result: FAILED! Drive failure expected in less than 24 hours. SAVE ALL DATA. No failed Attributes found. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 2080 12 Power_Cycle_Count -O--CK 099 099 000 - 9 177 Wear_Leveling_Count PO--C- 099 099 000 - 8 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 066 056 000 - 34 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0 235 Unknown_Attribute -O--C- 100 100 000 - 0 241 Total_LBAs_Written -O--CK 099 099 000 - 4287164369 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 SATA NCQ Queued Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce-0xcf SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 2080 - # 2 Extended offline Completed without error 00% 2 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 34 Celsius Power Cycle Min/Max Temperature: 31/40 Celsius Lifetime Min/Max Temperature: 26/45 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (86) Index Estimated Time Temperature Celsius 87 2018-08-19 16:50 35 **************** ... ..( 20 skipped). .. **************** 108 2018-08-19 20:20 35 **************** 109 2018-08-19 20:30 34 *************** 110 2018-08-19 20:40 34 *************** 111 2018-08-19 20:50 34 *************** 112 2018-08-19 21:00 35 **************** 113 2018-08-19 21:10 34 *************** ... ..( 67 skipped). .. *************** 53 2018-08-20 08:30 34 *************** 54 2018-08-20 08:40 33 ************** 55 2018-08-20 08:50 33 ************** 56 2018-08-20 09:00 33 ************** 57 2018-08-20 09:10 34 *************** 58 2018-08-20 09:20 34 *************** 59 2018-08-20 09:30 33 ************** 60 2018-08-20 09:40 33 ************** 61 2018-08-20 09:50 33 ************** 62 2018-08-20 10:00 34 *************** ... ..( 6 skipped). .. *************** 69 2018-08-20 11:10 34 *************** 70 2018-08-20 11:20 35 **************** 71 2018-08-20 11:30 34 *************** ... ..( 12 skipped). .. *************** 84 2018-08-20 13:40 34 *************** 85 2018-08-20 13:50 35 **************** 86 2018-08-20 14:00 34 *************** SCT Error Recovery Control: Read: 65535 (6553.5 seconds) Write: 65535 (6553.5 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 9 --- Lifetime Power-On Resets 0x01 0x010 4 2080 --- Power-on Hours 0x01 0x018 6 4287164369 --- Logical Sectors Written 0x01 0x020 6 17868135 --- Number of Write Commands 0x01 0x028 6 1343121599 --- Logical Sectors Read 0x01 0x030 6 38257123 --- Number of Read Commands 0x01 0x038 6 2940000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 34 --- Current Temperature 0x05 0x020 1 45 --- Highest Temperature 0x05 0x028 1 26 --- Lowest Temperature 0x05 0x058 1 55 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 16 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC This output is generated on freenas 9.10. If I test this SSD on a different machine, everything is ok. Selftest "Completed without error". What else could be wrong? |
Note:
See TracQuery
for help on using queries.