Custom Query (1363 matches)
Results (202 - 204 of 1363)
| Ticket | Resolution | Summary | Owner | Reporter |
|---|---|---|---|---|
| #336 | fixed | Different check intervals for different devices | ||
| Description |
I have a device that doesn't support to check the power state. Thus the -n option doesn't work for this one. I wanted to configure a longer check interval only for this device. As I understand this is not possible in the smartd.conf. With your help I managed to configure the check interval for the service and thus for all devices. But I'd like to leave the check interval for the other devices. I'd be grateful if you add this feature to smartmontools. Thank you very much. |
|||
| #337 | fixed | Add support for SanDisk SSD U100 series | ||
| Description |
The device isn't recognized and some impotent attributes are unknown or has wrong name. smartctl -q noserial -x /dev/sda :smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-30-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SanDisk SSD U100 8GB
Firmware Version: 10.56.00
User Capacity: 8,012,390,400 bytes [8,01 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 3
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Jul 1 12:31:52 2014 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x51) SMART execute Offline immediate.
No Auto Offline data collection support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct -O---- 100 100 000 - 0
9 Power_On_Hours -O---- 100 100 000 - 329
12 Power_Cycle_Count -O---- 100 100 000 - 31
171 Unknown_Attribute -O---- 100 100 000 - 0
172 Unknown_Attribute -O---- 100 100 000 - 0
173 Unknown_Attribute -O---- 100 100 000 - 0
174 Unknown_Attribute -O---- 100 100 000 - 21
187 Reported_Uncorrect -O---- 100 100 000 - 0
230 Unknown_SSD_Attribute -O---- 100 100 000 - 0
232 Available_Reservd_Space PO---- 100 100 005 - 0
234 Unknown_Attribute -O---- 100 100 000 - 3
241 Total_LBAs_Written -O---- 100 100 000 - 8955010
242 Total_LBAs_Read -O---- 100 100 000 - 8066998
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 GPL,SL R/O 1 Summary SMART error log
0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 GPL,SL R/O 1 SMART self-test log
0x10 GPL,SL R/O 1 NCQ Command Error log
0x11 GPL,SL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xa1 GPL,SL VS 1 Device vendor specific log
0xa2 GPL,SL VS 2 Device vendor specific log
0xa3 GPL,SL VS 1 Device vendor specific log
Warning! SMART Extended Comprehensive Error Log Structure (16/16) error: invalid SMART checksum.
SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 10% 307 -
# 2 Short offline Aborted by host 80% 307 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Commands not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 31 Current Temperature
5 0x010 1 30 Average Short Term Temperature
5 0x018 1 - Average Long Term Temperature
5 0x020 1 37 Highest Temperature
5 0x028 1 26 Lowest Temperature
5 0x030 1 34 Highest Average Short Term Temperature
5 0x038 1 34 Lowest Average Short Term Temperature
5 0x040 1 - Highest Average Long Term Temperature
5 0x048 1 - Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 95 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 0 Specified Minimum Operating Temperature
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 0~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 2 6 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0001 2 0 Command failed due to ICRC error
Meaning of attributes grabbed from original SanDisk tools for windows<SmartDataDefinition Name="SanDisk P-Series" Priority="1102" Inherits="SuppressAll" DefaultDataFormat="Worst[1],Raw[4]"> <DeviceClassificationRule> <Model Regex="SanDisk SDSSD[PR].*" CaseSensitive="false"/> <Serial Regex=".*" CaseSensitive="false"/> <Firmware Regex=".*" CaseSensitive="false"/> </DeviceClassificationRule> <!-- P series --> <DeviceClassificationRule> <Model Regex="SanDisk SSD U100 .*" CaseSensitive="false"/> <Serial Regex=".*" CaseSensitive="false"/> <Firmware Regex=".*" CaseSensitive="false"/> </DeviceClassificationRule> <Attribute ID="5" Name="ReallocatedSectorCount" Display="true"/> <Attribute ID="9" Name="PowerOnHours" Display="true"/> <Attribute ID="12" Name="PowerCycleCount" Display="true"/> <Attribute ID="171" Name="ProgramFailCount" Display="true"/> <Attribute ID="172" Name="EraseFailCount" Display="true"/> <Attribute ID="173" Name="AverageWriteEraseCount" Display="true"/> <Attribute ID="174" Name="UnexpectedPowerLossCount" Display="true"/> <Attribute ID="187" Name="ReportedUncorrectableErrors" Display="true"/> <Attribute ID="230" DataFormat="Worst[1],Raw[4]" Name="PercentWriteEraseCount" Display="true"/> <Attribute ID="232" DataFormat="" Name="PercentageReserveSpaceAvailable" Display="true"/> <Attribute ID="234" DataFormat="Worst[1],Raw[4]" Name="PercentWriteEraseCountBC" Display="true"/> <Attribute ID="241" DataFormat="Worst[1],Raw[7]" Name="LBASectorsWritten" Display="true"/> <Attribute ID="242" DataFormat="Worst[1],Raw[7]" Name="LBASectorsRead" Display="true"/> </SmartDataDefinition> Created by my drverdb record for test purpose {
"SanDisk SSD U100 Series",
"SanDisk SSD U100 .*",
"", "",
"-v 5,raw48,Reallocated_Sector_Ct "
"-v 9,raw48,Power_On_Hours "
"-v 12,raw48,Power_Cycle_Count "
"-v 171,raw48,Program_Fail_Count "
"-v 172,raw48,Erase_Fail_Count "
"-v 173,raw48,Avg_Write_Erase_Ct "
"-v 174,raw48,Unexpect_Power_Loss_Ct "
"-v 187,raw48,Reported_Uncorrect "
"-v 230,raw48,Perc_Write_Erase_Count "
"-v 232,raw48,Perc_Reserve_Space_Avai "
"-v 234,raw48,Perc_Write_Erase_Ct_BC "
"-v 241,raw48,LBA_Sectors_Written "
"-v 242,raw48,LBA_Sectors_Read "
}
smartctl -q noserial -A /dev/sda after modify drivedb by handsmartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-30-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF READ SMART DATA SECTION === SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0002 100 100 000 Old_age Always - 0 9 Power_On_Hours 0x0002 100 100 000 Old_age Always - 329 12 Power_Cycle_Count 0x0002 100 100 000 Old_age Always - 31 171 Program_Fail_Count 0x0002 100 100 000 Old_age Always - 0 172 Erase_Fail_Count 0x0002 100 100 000 Old_age Always - 0 173 Avg_Write_Erase_Ct 0x0002 100 100 000 Old_age Always - 0 174 Unexpect_Power_Loss_Ct 0x0002 100 100 000 Old_age Always - 21 187 Reported_Uncorrect 0x0002 100 100 000 Old_age Always - 0 230 Perc_Write_Erase_Count 0x0002 100 100 000 Old_age Always - 0 232 Perc_Reserve_Space_Avai 0x0003 100 100 005 Pre-fail Always - 0 234 Perc_Write_Erase_Ct_BC 0x0002 100 100 000 Old_age Always - 3 241 LBA_Sectors_Written 0x0002 100 100 000 Old_age Always - 8956330 242 LBA_Sectors_Read 0x0002 100 100 000 Old_age Always - 8066998 |
|||
| #338 | fixed | JMicron 152d:0539 USB 3.0 Bridge needs -d sat | ||
| Description |
My ZTC USB 3.0 enclosure has USB ID 152d:0539. This ID is listed in drivedb.h but it is not useable with -d usbjmicron (failed: No device connected) It works with -d sat |
|||
Note:
See TracQuery
for help on using queries.
