Custom Query (1359 matches)

Hello, I just tried out smartctl on my external USB drive enclosure. The device is actually very, very far away from me so unfortunately I cannot say what the brand name or model is but in any case it works (at least smartctl -a).

sudo smartctl -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

/dev/sdc: Unknown USB bridge [0x13fd:0x1640 (0x864)] Smartctl: please specify device type with the -d option.

Use smartctl -h to get a usage summary

and then:

sudo smartctl -d sat,12 -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

START OF INFORMATION SECTION

Model Family: Hitachi Ultrastar A7K1000 Device Model: Hitachi HUA721010KLA330 Serial Number: GTA000PAG632ZA LU WWN Device Id: 5 000cca 216c2c5d9 Firmware Version: GKAOA70M User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Tue Sep 24 20:28:49 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled

Error SMART Values Read failed: Input/output error Smartctl: SMART Read Values failed.

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: UNKNOWN! SMART Status, Attributes and Thresholds cannot be read.

SMART Error Log Version: 1 ATA Error Count: 36 (device log contains only the most recent five errors)

CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 36 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:32.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT

Error 35 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT

Error 34 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT

Error 33 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT

Error 32 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT 25 00 15 6a 29 50 40 00 36d+16:53:52.000 READ DMA EXT

SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

ATA commands like SMART RETURN STATUS (smartctl -H) and SCT ERC GET (smartctl -l scterc) return results in ATA output registers. The SAT ATA PASS-THROUGH commands forward these via sense data.

SAT-1 and older SAT-2 revisions define that the ATA PASS-THROUGH commands always return descriptor format sense data (with ATA Return descriptor) and never return fixed format sense data.

This violates the SPC-4 requirement that the sense data format is controlled by the D_SENSE bit in the Control mode page. Older SCSI layers expecting fixed format may truncate the ATA Return descriptor.

Newer versions of SAT define a fixed (D_SENSE=0) sense data format for the ATA PASS-THROUGH commands. It returns the lower (28-bit command) parts of the ATA output registers and "nonzero" flags for the upper output registers. The SATL may provide the optional ATA PASS-THROUGH Results log page to read the full result.

See ​T10/08-344r2.

scsiata.cpp should be enhanced to detect the new fixed format sense data.

Sorry I am supposed to post this to the mailing list according to the wiki, but I really do not want to subscribe the list.

The device seems to have power-on hours in unit of 10-hours or so (I have used this for days without stop and it only shows 24), and it is said Total_LBAs_Written/Read is in 64MB, but no one knows for sure...

smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

START OF INFORMATION SECTION

Device Model: PLEXTOR PX-128M5S Firmware Version: 1.04 User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 4a SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Sep 25 21:23:47 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: PASSED

General SMART Values: Offline data collection status: (0x00) Offline data collection activity

was never started. Auto Offline Data Collection: Disabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever been run.

Total time to complete Offline data collection: ( 10) seconds. Offline data collection capabilities: (0x15) SMART execute Offline immediate.

No Auto Offline data collection support. Abort Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported.

SMART capabilities: (0x0002) Does not save SMART data before

entering power-saving mode. Supports SMART auto save timer.

Error logging capability: (0x00) Error logging supported.

General Purpose Logging supported.

Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SCT capabilities: (0x003d) SCT Status supported.

SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported.

SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE

1 Raw_Read_Error_Rate PO---- 100 100 070 - 0 5 Reallocated_Sector_Ct PO---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 24

12 Power_Cycle_Count -O---- 100 100 000 - 6

177 Wear_Leveling_Count PO---- 100 100 000 - 1801 178 Used_Rsvd_Blk_Cnt_Chip PO---- 100 100 000 - 0 181 Program_Fail_Cnt_Total PO---- 100 100 000 - 0 182 Erase_Fail_Count_Total PO---- 100 100 000 - 0 187 Reported_Uncorrect -O---- 100 100 000 - 0 192 Power-Off_Retract_Count PO---- 100 100 000 - 4 196 Reallocated_Event_Count PO---- 100 100 000 - 0 198 Offline_Uncorrectable PO---- 100 100 000 - 0 199 UDMA_CRC_Error_Count PO---- 100 100 000 - 0 232 Available_Reservd_Space PO---- 100 100 010 - 0 241 Total_LBAs_Written PO---- 100 100 000 - 5237 242 Total_LBAs_Read PO---- 100 100 000 - 2045

_ K auto-keep

| C event count

_ R error rate

| S speed/performance

_ O updated online

| P prefailure warning

General Purpose Log Directory Version 0 SMART Log Directory Version 0 Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters 0x80-0x9f GPL,SL R/W 1 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer

SMART Extended Comprehensive Error Log (GP Log 0x03) not supported

SMART Error Log Version: 0 No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 0 - # 2 Short offline Completed without error 00% 0 -

Selective Self-tests/Logging not supported

SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) SCT Support Level: 1 Device State: Active (0) Current Temperature: ? Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 0 minutes Temperature Logging Interval: 0 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (0)

Index Estimated Time Temperature Celsius

1 2013-09-25 19:16 ? -

... ..(126 skipped). .. -

0 2013-09-25 21:23 ? -

SCT Error Recovery Control:

Read: 2 (0.2 seconds)

Write: 2 (0.2 seconds)

Device Statistics (GP Log 0x04) not supported

SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 35 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC