Custom Query (1563 matches)

This is the output(below) I get from an SSD that has been in a temperature chamber.

Output ain't pretty anymore, used to be something like 23 (min/max 10/77)

I created a patch on github for that: ​https://github.com/fnadeau/smartmontools

I understand that you might not be interested in this patch for various reasons(drivedb.h not backward compatible, too many undocumented drive, etc.) Anyhow, I thought you might be interested.

smartctl 6.1 2013-03-16 r3800 [x86_64-linux-3.10.9-200.fc19.x86_64] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     SandForce Driven SSDs
Device Model:     KINGSTON SVP200S3480G
Serial Number:    50026B7226020429
LU WWN Device Id: 5 0026b7 226020429
Firmware Version: 501ABBF0
User Capacity:    480 103 981 056 bytes [480 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS, ACS-2 T13/2015-D revision 3
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Fri Aug 23 13:13:12 2013 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

.......

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   120   120   050    Pre-fail  Always       -       0/0
.......
194 Temperature_Celsius     0x0022   242   083   000    Old_age   Always       -       242 (0 239 0 83 0)
.......
242 Lifetime_Reads_GiB      0x0032   000   000   000    Old_age   Always       -       2

Hello, I just tried out smartctl on my external USB drive enclosure. The device is actually very, very far away from me so unfortunately I cannot say what the brand name or model is but in any case it works (at least smartctl -a).

sudo smartctl -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

/dev/sdc: Unknown USB bridge [0x13fd:0x1640 (0x864)] Smartctl: please specify device type with the -d option.

Use smartctl -h to get a usage summary

and then:

sudo smartctl -d sat,12 -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

START OF INFORMATION SECTION

Model Family: Hitachi Ultrastar A7K1000 Device Model: Hitachi HUA721010KLA330 Serial Number: GTA000PAG632ZA LU WWN Device Id: 5 000cca 216c2c5d9 Firmware Version: GKAOA70M User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Tue Sep 24 20:28:49 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled

Error SMART Values Read failed: Input/output error Smartctl: SMART Read Values failed.

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: UNKNOWN! SMART Status, Attributes and Thresholds cannot be read.

SMART Error Log Version: 1 ATA Error Count: 36 (device log contains only the most recent five errors)

CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 36 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:32.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT

Error 35 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT

Error 34 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT

Error 33 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT

Error 32 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT 25 00 15 6a 29 50 40 00 36d+16:53:52.000 READ DMA EXT

SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

ATA commands like SMART RETURN STATUS (smartctl -H) and SCT ERC GET (smartctl -l scterc) return results in ATA output registers. The SAT ATA PASS-THROUGH commands forward these via sense data.

SAT-1 and older SAT-2 revisions define that the ATA PASS-THROUGH commands always return descriptor format sense data (with ATA Return descriptor) and never return fixed format sense data.

This violates the SPC-4 requirement that the sense data format is controlled by the D_SENSE bit in the Control mode page. Older SCSI layers expecting fixed format may truncate the ATA Return descriptor.

Newer versions of SAT define a fixed (D_SENSE=0) sense data format for the ATA PASS-THROUGH commands. It returns the lower (28-bit command) parts of the ATA output registers and "nonzero" flags for the upper output registers. The SATL may provide the optional ATA PASS-THROUGH Results log page to read the full result.

See ​T10/08-344r2.

scsiata.cpp should be enhanced to detect the new fixed format sense data.