Custom Query (1541 matches)

Hello,

I have 4 Samsung drives running in RAID 5 on Centos 5.5, smartctl version 5.38.

I get this error every few days for 2 of 4 drives (HD502HJ): "Device: /dev/sdd, 209480318976 Currently unreadable (pending) sectors" (always 209480318976) followed by this: "Device: /dev/sdb, Failed SMART usage Attribute: 197 Current_Pending_Sector." Everything else seems to be OK: # smartctl -a /dev/sdd smartctl version 5.38 [x86_64-redhat-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is ​http://smartmontools.sourceforge.net/

START OF INFORMATION SECTION

Device Model: SAMSUNG HD502HJ Serial Number: S20BJ9BZXXXXXX Firmware Version: 1AJ10001 User Capacity: 500,107,862,016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: Not recognized. Minor revision code: 0x28 Local Time is: Sat Dec 11 19:51:32 2010 CET

==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability. SMART support is: Enabled

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: PASSED

General SMART Values: Offline data collection status: (0x80) Offline data collection activity

was never started. Auto Offline Data Collection: Enabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever been run.

Total time to complete Offline data collection: (4800) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode. Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003f) SCT Status supported.

SCT Feature Control supported. SCT Data Table supported.

SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 6 2 Throughput_Performance 0x0026 054 053 000 Old_age Always - 4519 3 Spin_Up_Time 0x0023 086 083 025 Pre-fail Always - 4462 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2036

10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 252 252 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

191 G-Sense_Error_Rate 0x0022 252 252 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 194 Temperature_Celsius 0x0002 064 055 000 Old_age Always - 33 (Lifetime Min/Max 22/45) 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 76 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 14 223 Load_Retry_Count 0x0032 252 252 000 Old_age Always - 0 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 5

SMART Error Log Version: 1 ATA Error Count: 76 (device log contains only the most recent five errors)

CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 76 occurred at disk power-on lifetime: 1903 hours (79 days + 7 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG b0 d5 01 01 4f c2 00 0a 00:12:14.194 SMART READ LOG 35 00 08 1a 2d 11 e0 0a 00:12:14.194 WRITE DMA EXT c8 00 08 6a e0 5d ee 0a 00:12:14.194 READ DMA ca 00 08 92 2b 43 e0 0a 00:12:14.194 WRITE DMA

Error 75 occurred at disk power-on lifetime: 1899 hours (79 days + 3 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG b0 d5 01 06 4f c2 00 0a 00:12:01.593 SMART READ LOG ea 00 00 99 44 1c e0 0a 00:12:01.593 FLUSH CACHE EXIT 35 00 08 92 44 1c e0 0a 00:12:01.593 WRITE DMA EXT ea 00 00 00 4f c2 e0 0a 00:12:01.593 FLUSH CACHE EXIT

Error 74 occurred at disk power-on lifetime: 1894 hours (78 days + 22 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA b0 d0 01 00 4f c2 00 0a 00:11:41.793 SMART READ DATA b0 da 00 00 4f c2 00 0a 00:11:41.793 SMART RETURN STATUS ea 00 00 99 44 1c e0 0a 00:11:41.790 FLUSH CACHE EXIT 35 00 08 92 44 1c e0 0a 00:11:41.790 WRITE DMA EXT

Error 73 occurred at disk power-on lifetime: 1886 hours (78 days + 14 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d5 01 01 4f c2 00 0a 00:11:12.993 SMART READ LOG b0 d5 01 06 4f c2 00 0a 00:11:12.993 SMART READ LOG b0 d0 01 00 4f c2 00 0a 00:11:12.993 SMART READ DATA b0 da 00 00 4f c2 00 0a 00:11:12.993 SMART RETURN STATUS ea 00 00 99 44 1c e0 0a 00:11:12.993 FLUSH CACHE EXIT

Error 72 occurred at disk power-on lifetime: 1866 hours (77 days + 18 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 00 4f c2 00 Error: ABRT

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA b0 d0 01 00 4f c2 00 0a 00:10:00.993 SMART READ DATA 25 00 90 19 08 ef e0 0a 00:10:00.993 READ DMA EXT 25 00 90 81 07 ef e0 0a 00:10:00.993 READ DMA EXT 35 00 08 72 b9 41 e0 0a 00:10:00.993 WRITE DMA EXT

SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 2021 - # 2 Short offline Completed without error 00% 2019 - # 3 Short offline Completed without error 00% 1995 - # 4 Short offline Completed without error 00% 1971 - # 5 Short offline Completed without error 00% 1947 - # 6 Short offline Completed without error 00% 1922 - # 7 Short offline Completed without error 00% 1899 - # 8 Short offline Completed without error 00% 1875 - # 9 Extended offline Completed without error 00% 1854 - #10 Short offline Completed without error 00% 1851 - #11 Short offline Completed without error 00% 1827 - #12 Short offline Completed without error 00% 1803 - #13 Short offline Completed without error 00% 1779 - #14 Short offline Completed without error 00% 1755 - #15 Short offline Completed without error 00% 1731 - #16 Short offline Completed without error 00% 1707 - #17 Extended offline Completed without error 00% 1686 - #18 Short offline Completed without error 00% 1684 - #19 Short offline Completed without error 00% 1660 - #20 Short offline Completed without error 00% 1636 - #21 Short offline Completed without error 00% 1612 -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

This is the patch agains current SVN. What was done:

1) Added USB type autodection using CAM layer and USB bus FreeBSD interface. Tested on FreeBSD 7. 2) Converted old style interface to the new, tested with ATA and SCSI devices, should work for other types also

smartctl 5.39 2009-09-01 r2881 [FreeBSD 7.2-RELEASE-p3 amd64] (local build) Copyright (C) 2002-9 by Bruce Allen, ​http://smartmontools.sourceforge.net

Smartctl open device: /dev/ciss0 [cciss_disk_00] failed:

smartctl 5.39 2009-09-01 r2881 [FreeBSD 7.2-RELEASE-p3 amd64] (local build) Copyright (C) 2002-9 by Bruce Allen, ​http://smartmontools.sourceforge.net

Smartctl open device: /dev/ciss0 [cciss_disk_04] failed:

# smartctl -a -d cciss,0 /dev/ciss0 smartctl version 5.38 [amd64-portbld-freebsd7.2] Copyright (C) 2002-8 Bruce Allen Home page is ​http://smartmontools.sourceforge.net/

Device: HITACHI HUS153030VLS300 Version: A210 Serial number: J8V21N1A Device type: disk Transport protocol: SAS Local Time is: Wed Sep 2 13:12:27 2009 EEST Device supports SMART and is Enabled Temperature Warning Enabled SMART Health Status: OK

Current Drive Temperature: 34 C Drive Trip Temperature: 85 C Manufactured in week 40 of year 2007 Recommended maximum start stop count: 50000 times Current start stop count: 20 times Elements in grown defect list: 0 Vendor (Seagate) cache information

Blocks sent to initiator = 123073579712512

Error counter log:

Errors Corrected by Total Correction

Gigabytes Total

ECC rereads/ errors algorithm

processed uncorrected

fast | delayed rewrites corrected invocations [109

bytes] errors read: 0 172 0 172 1302 602.700 0 write: 0 8447 0 8447 8577 64.274 0 verify: 0 7350 0 7350 7807 0.000 0

Non-medium error count: 0 No self-tests have been logged Long (extended) Self Test duration: 13019 seconds [217.0 minutes]

# smartctl -a -d cciss,4 /dev/ciss0 smartctl version 5.38 [amd64-portbld-freebsd7.2] Copyright (C) 2002-8 Bruce Allen Home page is ​http://smartmontools.sourceforge.net/

Standard Inquiry (36 bytes) failed [Device not configured] Retrying with a 64 byte Standard Inquiry Standard Inquiry (64 bytes) failed [Device not configured] A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options.