Custom Query (1383 matches)
Results (91 - 93 of 1383)
Ticket | Resolution | Summary | Owner | Reporter |
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#62 | fixed | 4K info from IDENTIFY DEVICE | ||
Description |
I checked the ATA/ATAPI specification and it seems it may be possible to find real HW sector size from word 106 of IDENTIFY DEVICE command. Would it be possible to check this and propagate this information to user-space via smartctl? It will allow semi-automatic creation of properly aligned partitions on devices like WD6400AARS. |
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#133 | wontfix | add support for Micron Technology USB SSD please | ||
Description |
The supported SMART commands are described here: The SMART Command Feature Set http://www.micron.com/get-document/?documentId=5611 root@ubuntu:~# lsusb -v -d 0634:0655 Bus 001 Device 004: ID 0634:0655 Micron Technology, Inc. Device Descriptor:
Device Qualifier (for other device speed):
Device Status: 0x0000
root@ubuntu:~# /tmp/smartctl /dev/sda smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net /dev/sda: Unknown USB bridge [0x0634:0x0655 (0x1100)] Smartctl: please specify device type with the -d option. Use smartctl -h to get a usage summary root@ubuntu:~# /tmp/smartctl -d scsi -a /dev/sda smartctl 5.40 2010-10-16 r3189 [i686-pc-linux-gnu] (local build) Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net Device: MICRON eUSB DISK Version: 1100
A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options. |
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#632 | fixed | Not in smartctl database SAMSUNG-MZ7LN512HCHP | ||
Description |
My disk is not in smartctl database. Disk Vendor: SAMSUNG Disk Model: MZ7LN512HCHP Details: http://www.samsung.com/semiconductor/products/flash-storage/client-ssd/MZ7LN512HCHP # cat smartctl-SAMSUNG-MZ7LN512HCHP.txt smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.10.0-327.3.1.el7.x86_64] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZ7LN512HCHP-000L1 Serial Number: S1ZKNXAG835007 LU WWN Device Id: 5 002538 d00000000 Firmware Version: EMT04L0Q User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Jan 13 20:50:46 2016 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 265) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 139 12 Power_Cycle_Count -O--CK 099 099 000 - 40 170 Unknown_Attribute -O--CK 100 100 010 - 0 171 Unknown_Attribute -O--CK 100 100 010 - 0 172 Unknown_Attribute -O--CK 100 100 010 - 0 173 Unknown_Attribute PO--CK 099 099 005 - 2 174 Unknown_Attribute -O--CK 099 099 000 - 9 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1567 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O--CK 057 048 000 - 43 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0 233 Media_Wearout_Indicator PO--C- 099 099 000 - 16760437 241 Total_LBAs_Written -O--CK 099 099 000 - 638 242 Total_LBAs_Read -O--CK 099 099 000 - 402 249 Unknown_Attribute -O--CK 099 099 000 - 1024 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 138 - # 2 Short offline Completed without error 00% 136 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) SCT Support Level: 1 Device State: Active (0) Current Temperature: 44 Celsius Power Cycle Min/Max Temperature: 35/51 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 4294967295/4294901760 SCT Temperature History Version: 3 (Unknown, should be 2) Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (42) Index Estimated Time Temperature Celsius 43 2016-01-12 23:40 38 ******************* 44 2016-01-12 23:50 38 ******************* 45 2016-01-13 00:00 38 ******************* 46 2016-01-13 00:10 37 ****************** 47 2016-01-13 00:20 37 ****************** 48 2016-01-13 00:30 36 ***************** ... ..( 57 skipped). .. ***************** 106 2016-01-13 10:10 36 ***************** 107 2016-01-13 10:20 37 ****************** ... ..( 2 skipped). .. ****************** 110 2016-01-13 10:50 37 ****************** 111 2016-01-13 11:00 38 ******************* ... ..( 10 skipped). .. ******************* 122 2016-01-13 12:50 38 ******************* 123 2016-01-13 13:00 40 ********************* 124 2016-01-13 13:10 39 ******************** 125 2016-01-13 13:20 38 ******************* 126 2016-01-13 13:30 37 ****************** 127 2016-01-13 13:40 37 ****************** 0 2016-01-13 13:50 38 ******************* ... ..( 4 skipped). .. ******************* 5 2016-01-13 14:40 38 ******************* 6 2016-01-13 14:50 37 ****************** 7 2016-01-13 15:00 38 ******************* ... ..( 11 skipped). .. ******************* 19 2016-01-13 17:00 38 ******************* 20 2016-01-13 17:10 39 ******************** ... ..( 5 skipped). .. ******************** 26 2016-01-13 18:10 39 ******************** 27 2016-01-13 18:20 38 ******************* ... ..( 3 skipped). .. ******************* 31 2016-01-13 19:00 38 ******************* 32 2016-01-13 19:10 39 ******************** 33 2016-01-13 19:20 38 ******************* ... ..( 5 skipped). .. ******************* 39 2016-01-13 20:20 38 ******************* 40 2016-01-13 20:30 39 ******************** 41 2016-01-13 20:40 51 ******************************** 42 2016-01-13 20:50 44 ************************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 4 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC |