Custom Query (1560 matches)
Results (403 - 405 of 1560)
| Ticket | Resolution | Summary | Owner | Reporter |
|---|---|---|---|---|
| #1423 | duplicate | Micron_5300_MTFDDAK480TDS | ||
| Description |
Micron_5300_MTFDDAK480TDS |
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| #1425 | duplicate | Device not in database: Seagate BarraCuda 120 SSD ZA1000CM10003 | ||
| Description |
My SSD disk is not in the database. |
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| #1434 | invalid | NMVe SMART/Health Critical Warning Bit 3 (0x4) not necessary an error | ||
| Description |
Hello, we are using a NVME "SAMSUNG MZVLB512HAJQ-00000" The Smartmontool is reporting the following error: === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: FAILED! - NVM subsystem reliability has been degraded SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x04 The Attribut "Critical Warning" has different bits, signaling different status. According to the documentation the flag for bit 4 is: "If set to ‘1’, then the volatile memory backup device has failed. This field is only valid if the controller has a volatile memory backup solution" The referred documentation is at https://nvmexpress.org/wp-content/uploads/NVM-Express-1_4-2019.06.10-Ratified.pdf (page 122). Currently the bit 4 is reported as an error but this depends on the model (whether it has a capacitor for power loss protection). Either this should be detected or maybe a parameter could be used to signal whether this is an error or not. |
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