Custom Query (1563 matches)

File scsiata.cpp contains comments claiming that it supports fixed format response to SCSI request sense command (response code 0x70 and 0x71). Indeed, the implementation of sat_device::ata_pass_through() parses such responses correctly and returns true. However, it does not fill the descriptor buffer (adrp). Function smartcommandhandler() in atacmds.cpp calls sat_device::ata_pass_through() and fails if descriptor values are absent, specifically lba_high and lba_mid. It is not clear to me how this should be fixed:

1. Use a different logic when fixed format is returned (instead of checking lba_high and lba_mid),
2. Or, issue SCSI request sense command with the DESC bit set, which would force the descriptor format. As that may cause problems with older devices, perhaps a parameter should be introduced, settable in drivedb.h.

User-visible symptoms of this bug are:

1. smartd refuses to monitor the affected drive, producing an error such as: "Device: /dev/sdd [SAT], not capable of SMART Health Status check"
2. smartctl shows SMART info correctly, but with a complaint: "SMART STATUS RETURN: incomplete response, ATA output registers missing"

This problem was noticed with external USB drive: WD MyPassport 2TB (WDBY8L0020BBL), USB: 1058:0748

Greetings!

when used 5.38 to smartctl with Ah options,

it reported fail problem on “Log Sense failed, IE page [scsi response fails sanity test]”.looks like it is due to pBuf is not equal to pagenum

but it is not occurred in 6.1 version. so what is difference between 6.1 and 5.38.

for detail error messages and related source code is below

line300:pagenum:0x2f line302:pBuf[0]:0xaf line302:pBuf[1]:0x00 line302:pBuf[2]:0x00 line302:pBuf[3]:0x0c

Source code. /* sanity check on response */

if ((SUPPORTED_LPAGES != pagenum) && (pBuf[0] != pagenum))

Log sense response:

Hello, I just tried out smartctl on my external USB drive enclosure. The device is actually very, very far away from me so unfortunately I cannot say what the brand name or model is but in any case it works (at least smartctl -a).

sudo smartctl -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

/dev/sdc: Unknown USB bridge [0x13fd:0x1640 (0x864)] Smartctl: please specify device type with the -d option.

Use smartctl -h to get a usage summary

and then:

sudo smartctl -d sat,12 -a /dev/sdc smartctl 5.43 2012-06-30 r3573 [x86_64-linux-3.8.0-30-generic] (local build) Copyright (C) 2002-12 by Bruce Allen, ​http://smartmontools.sourceforge.net

START OF INFORMATION SECTION

Model Family: Hitachi Ultrastar A7K1000 Device Model: Hitachi HUA721010KLA330 Serial Number: GTA000PAG632ZA LU WWN Device Id: 5 000cca 216c2c5d9 Firmware Version: GKAOA70M User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Tue Sep 24 20:28:49 2013 CDT SMART support is: Available - device has SMART capability. SMART support is: Enabled

Error SMART Values Read failed: Input/output error Smartctl: SMART Read Values failed.

START OF READ SMART DATA SECTION

SMART overall-health self-assessment test result: UNKNOWN! SMART Status, Attributes and Thresholds cannot be read.

SMART Error Log Version: 1 ATA Error Count: 36 (device log contains only the most recent five errors)

CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX]

Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 36 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:32.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT

Error 35 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:55:10.500 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT

Error 34 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:50.900 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT

Error 33 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:30.800 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT

Error 32 occurred at disk power-on lifetime: 50757 hours (2114 days + 21 hours)

When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 eb 9f 3c f8 4d Error: IDNF 235 sectors at LBA = 0x0df83c9f = 234372255

Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 eb 9f 3c f8 40 00 36d+16:54:15.100 READ DMA EXT 25 00 eb 9f 3c f8 40 00 36d+16:53:52.100 READ DMA EXT 25 00 15 7a 33 a4 40 00 36d+16:53:52.100 READ DMA EXT 25 00 eb 8f 32 a4 40 00 36d+16:53:52.000 READ DMA EXT 25 00 15 6a 29 50 40 00 36d+16:53:52.000 READ DMA EXT

SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.