1 | smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.9.0-0.bpo.5-amd64] (local build) |
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2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org |
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3 | |
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4 | === START OF INFORMATION SECTION === |
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5 | Device Model: SanDisk SDSA6MM-016G-1006 |
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6 | Firmware Version: U221006 |
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7 | User Capacity: 16,013,942,784 bytes [16.0 GB] |
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8 | Sector Size: 512 bytes logical/physical |
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9 | Rotation Rate: Solid State Device |
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10 | Form Factor: 1.8 inches |
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11 | Device is: Not in smartctl database [for details use: -P showall] |
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12 | ATA Version is: ACS-2 T13/2015-D revision 3 |
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13 | SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) |
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14 | Local Time is: Sat Jan 13 14:40:12 2018 CET |
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15 | SMART support is: Available - device has SMART capability. |
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16 | SMART support is: Enabled |
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17 | AAM feature is: Unavailable |
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18 | APM level is: 254 (maximum performance) |
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19 | Rd look-ahead is: Enabled |
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20 | Write cache is: Enabled |
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21 | ATA Security is: Disabled, frozen [SEC2] |
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22 | Wt Cache Reorder: Unavailable |
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23 | |
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24 | === START OF READ SMART DATA SECTION === |
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25 | SMART overall-health self-assessment test result: PASSED |
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26 | |
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27 | General SMART Values: |
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28 | Offline data collection status: (0x00) Offline data collection activity |
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29 | was never started. |
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30 | Auto Offline Data Collection: Disabled. |
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31 | Self-test execution status: ( 0) The previous self-test routine completed |
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32 | without error or no self-test has ever |
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33 | been run. |
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34 | Total time to complete Offline |
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35 | data collection: ( 120) seconds. |
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36 | Offline data collection |
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37 | capabilities: (0x51) SMART execute Offline immediate. |
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38 | No Auto Offline data collection support. |
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39 | Suspend Offline collection upon new |
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40 | command. |
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41 | No Offline surface scan supported. |
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42 | Self-test supported. |
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43 | No Conveyance Self-test supported. |
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44 | Selective Self-test supported. |
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45 | SMART capabilities: (0x0003) Saves SMART data before entering |
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46 | power-saving mode. |
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47 | Supports SMART auto save timer. |
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48 | Error logging capability: (0x01) Error logging supported. |
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49 | General Purpose Logging supported. |
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50 | Short self-test routine |
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51 | recommended polling time: ( 2) minutes. |
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52 | Extended self-test routine |
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53 | recommended polling time: ( 3) minutes. |
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54 | |
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55 | SMART Attributes Data Structure revision number: 1 |
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56 | Vendor Specific SMART Attributes with Thresholds: |
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57 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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58 | 1 Raw_Read_Error_Rate POSR-K 100 100 002 - 0 |
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59 | 5 Reallocated_Sector_Ct PO--CK 100 100 002 - 0 |
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60 | 9 Power_On_Hours -O--CK 100 100 000 - 386 |
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61 | 12 Power_Cycle_Count -O--CK 100 100 000 - 37 |
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62 | 165 Unknown_Attribute -O---- 100 100 000 - 4395 |
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63 | 170 Unknown_Attribute PO--CK 100 100 005 - 0 |
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64 | 171 Unknown_Attribute -O---- 100 100 000 - 0 |
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65 | 172 Unknown_Attribute -O---- 100 100 000 - 0 |
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66 | 173 Unknown_Attribute -O---- 100 100 000 - 2 |
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67 | 174 Unknown_Attribute -O---- 100 100 000 - 20 |
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68 | 184 End-to-End_Error PO--CK 100 100 097 - 0 |
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69 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0 |
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70 | 188 Command_Timeout -O--CK 100 100 000 - 0 |
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71 | 194 Temperature_Celsius -O---K 065 035 000 - 35 (Min/Max 17/40) |
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72 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0 |
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73 | 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0 |
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74 | 230 Unknown_SSD_Attribute -O---- 100 100 000 - 6 |
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75 | 234 Unknown_Attribute -O---- 100 100 000 - 6 |
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76 | 241 Total_LBAs_Written -O---- 100 100 000 - 49174715 |
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77 | 242 Total_LBAs_Read -O---- 100 100 000 - 67524014 |
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78 | ||||||_ K auto-keep |
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79 | |||||__ C event count |
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80 | ||||___ R error rate |
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81 | |||____ S speed/performance |
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82 | ||_____ O updated online |
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83 | |______ P prefailure warning |
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84 | |
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85 | General Purpose Log Directory Version 1 |
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86 | SMART Log Directory Version 1 [multi-sector log support] |
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87 | Address Access R/W Size Description |
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88 | 0x00 GPL,SL R/O 1 Log Directory |
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89 | 0x01 GPL,SL R/O 1 Summary SMART error log |
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90 | 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log |
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91 | 0x04 GPL,SL R/O 8 Device Statistics log |
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92 | 0x06 GPL,SL R/O 1 SMART self-test log |
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93 | 0x09 GPL,SL R/W 1 Selective self-test log |
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94 | 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log |
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95 | 0x11 GPL,SL R/O 1 SATA Phy Event Counters log |
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96 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log |
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97 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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98 | 0xa1 GPL,SL VS 1 Device vendor specific log |
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99 | 0xa2 GPL,SL VS 2 Device vendor specific log |
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100 | 0xa3 GPL,SL VS 1 Device vendor specific log |
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101 | 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log |
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102 | |
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103 | Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. |
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104 | SMART Extended Comprehensive Error Log Version: 1 (16 sectors) |
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105 | No Errors Logged |
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106 | |
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107 | SMART Extended Self-test Log (GP Log 0x07) not supported |
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108 | |
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109 | SMART Self-test log structure revision number 1 |
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110 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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111 | # 1 Short offline Completed without error 00% 386 - |
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112 | # 2 Short offline Completed without error 00% 1 - |
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113 | |
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114 | SMART Selective self-test log data structure revision number 1 |
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115 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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116 | 1 0 0 Not_testing |
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117 | 2 0 0 Not_testing |
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118 | 3 0 0 Not_testing |
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119 | 4 0 0 Not_testing |
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120 | 5 0 0 Not_testing |
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121 | Selective self-test flags (0x0): |
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122 | After scanning selected spans, do NOT read-scan remainder of disk. |
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123 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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124 | |
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125 | SCT Commands not supported |
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126 | |
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127 | Device Statistics (GP Log 0x04) |
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128 | Page Offset Size Value Flags Description |
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129 | 0x05 ===== = = === == Temperature Statistics (rev 1) == |
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130 | 0x05 0x008 1 35 --- Current Temperature |
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131 | 0x05 0x010 1 - --- Average Short Term Temperature |
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132 | 0x05 0x018 1 - --- Average Long Term Temperature |
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133 | 0x05 0x020 1 39 --- Highest Temperature |
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134 | 0x05 0x028 1 31 --- Lowest Temperature |
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135 | 0x05 0x030 1 35 --- Highest Average Short Term Temperature |
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136 | 0x05 0x038 1 35 --- Lowest Average Short Term Temperature |
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137 | 0x05 0x040 1 - --- Highest Average Long Term Temperature |
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138 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature |
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139 | 0x05 0x050 4 0 --- Time in Over-Temperature |
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140 | 0x05 0x058 1 95 --- Specified Maximum Operating Temperature |
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141 | 0x05 0x060 4 0 --- Time in Under-Temperature |
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142 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature |
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143 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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144 | 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator |
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145 | |||_ C monitored condition met |
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146 | ||__ D supports DSN |
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147 | |___ N normalized value |
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148 | |
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149 | SATA Phy Event Counters (GP Log 0x11) |
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150 | ID Size Value Description |
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151 | 0x0003 2 0 R_ERR response for device-to-host data FIS |
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152 | 0x0004 2 0 R_ERR response for host-to-device data FIS |
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153 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS |
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154 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS |
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155 | 0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy |
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156 | 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET |
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157 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC |
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158 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC |
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159 | 0x0001 2 0 Command failed due to ICRC error |
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160 | |
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