| 1 | smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.9.0-0.bpo.5-amd64] (local build)
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SanDisk SDSA6MM-016G-1006
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| 6 | Firmware Version: U221006
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| 7 | User Capacity: 16,013,942,784 bytes [16.0 GB]
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| 8 | Sector Size: 512 bytes logical/physical
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| 9 | Rotation Rate: Solid State Device
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| 10 | Form Factor: 1.8 inches
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| 11 | Device is: Not in smartctl database [for details use: -P showall]
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| 12 | ATA Version is: ACS-2 T13/2015-D revision 3
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| 13 | SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
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| 14 | Local Time is: Sat Jan 13 14:40:12 2018 CET
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 | AAM feature is: Unavailable
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| 18 | APM level is: 254 (maximum performance)
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| 19 | Rd look-ahead is: Enabled
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| 20 | Write cache is: Enabled
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| 21 | ATA Security is: Disabled, frozen [SEC2]
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| 22 | Wt Cache Reorder: Unavailable
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| 23 |
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| 24 | === START OF READ SMART DATA SECTION ===
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| 25 | SMART overall-health self-assessment test result: PASSED
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| 26 |
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| 27 | General SMART Values:
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| 28 | Offline data collection status: (0x00) Offline data collection activity
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| 29 | was never started.
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| 30 | Auto Offline Data Collection: Disabled.
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| 31 | Self-test execution status: ( 0) The previous self-test routine completed
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| 32 | without error or no self-test has ever
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| 33 | been run.
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| 34 | Total time to complete Offline
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| 35 | data collection: ( 120) seconds.
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| 36 | Offline data collection
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| 37 | capabilities: (0x51) SMART execute Offline immediate.
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| 38 | No Auto Offline data collection support.
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| 39 | Suspend Offline collection upon new
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| 40 | command.
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| 41 | No Offline surface scan supported.
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| 42 | Self-test supported.
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| 43 | No Conveyance Self-test supported.
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| 44 | Selective Self-test supported.
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| 45 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 46 | power-saving mode.
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| 47 | Supports SMART auto save timer.
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| 48 | Error logging capability: (0x01) Error logging supported.
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| 49 | General Purpose Logging supported.
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| 50 | Short self-test routine
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| 51 | recommended polling time: ( 2) minutes.
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| 52 | Extended self-test routine
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| 53 | recommended polling time: ( 3) minutes.
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| 54 |
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| 55 | SMART Attributes Data Structure revision number: 1
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| 56 | Vendor Specific SMART Attributes with Thresholds:
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| 57 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 58 | 1 Raw_Read_Error_Rate POSR-K 100 100 002 - 0
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| 59 | 5 Reallocated_Sector_Ct PO--CK 100 100 002 - 0
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| 60 | 9 Power_On_Hours -O--CK 100 100 000 - 386
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| 61 | 12 Power_Cycle_Count -O--CK 100 100 000 - 37
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| 62 | 165 Unknown_Attribute -O---- 100 100 000 - 4395
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| 63 | 170 Unknown_Attribute PO--CK 100 100 005 - 0
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| 64 | 171 Unknown_Attribute -O---- 100 100 000 - 0
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| 65 | 172 Unknown_Attribute -O---- 100 100 000 - 0
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| 66 | 173 Unknown_Attribute -O---- 100 100 000 - 2
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| 67 | 174 Unknown_Attribute -O---- 100 100 000 - 20
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| 68 | 184 End-to-End_Error PO--CK 100 100 097 - 0
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| 69 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 70 | 188 Command_Timeout -O--CK 100 100 000 - 0
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| 71 | 194 Temperature_Celsius -O---K 065 035 000 - 35 (Min/Max 17/40)
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| 72 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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| 73 | 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
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| 74 | 230 Unknown_SSD_Attribute -O---- 100 100 000 - 6
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| 75 | 234 Unknown_Attribute -O---- 100 100 000 - 6
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| 76 | 241 Total_LBAs_Written -O---- 100 100 000 - 49174715
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| 77 | 242 Total_LBAs_Read -O---- 100 100 000 - 67524014
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| 78 | ||||||_ K auto-keep
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| 79 | |||||__ C event count
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| 80 | ||||___ R error rate
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| 81 | |||____ S speed/performance
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| 82 | ||_____ O updated online
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| 83 | |______ P prefailure warning
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| 84 |
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| 85 | General Purpose Log Directory Version 1
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| 86 | SMART Log Directory Version 1 [multi-sector log support]
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| 87 | Address Access R/W Size Description
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| 88 | 0x00 GPL,SL R/O 1 Log Directory
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| 89 | 0x01 GPL,SL R/O 1 Summary SMART error log
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| 90 | 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
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| 91 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 92 | 0x06 GPL,SL R/O 1 SMART self-test log
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| 93 | 0x09 GPL,SL R/W 1 Selective self-test log
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| 94 | 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log
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| 95 | 0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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| 96 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 97 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 98 | 0xa1 GPL,SL VS 1 Device vendor specific log
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| 99 | 0xa2 GPL,SL VS 2 Device vendor specific log
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| 100 | 0xa3 GPL,SL VS 1 Device vendor specific log
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| 101 | 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log
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| 102 |
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| 103 | Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
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| 104 | SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
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| 105 | No Errors Logged
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| 106 |
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| 107 | SMART Extended Self-test Log (GP Log 0x07) not supported
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| 108 |
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| 109 | SMART Self-test log structure revision number 1
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| 110 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 111 | # 1 Short offline Completed without error 00% 386 -
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| 112 | # 2 Short offline Completed without error 00% 1 -
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| 113 |
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| 114 | SMART Selective self-test log data structure revision number 1
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| 115 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 116 | 1 0 0 Not_testing
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| 117 | 2 0 0 Not_testing
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| 118 | 3 0 0 Not_testing
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| 119 | 4 0 0 Not_testing
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| 120 | 5 0 0 Not_testing
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| 121 | Selective self-test flags (0x0):
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| 122 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 123 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 124 |
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| 125 | SCT Commands not supported
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| 126 |
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| 127 | Device Statistics (GP Log 0x04)
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| 128 | Page Offset Size Value Flags Description
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| 129 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 130 | 0x05 0x008 1 35 --- Current Temperature
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| 131 | 0x05 0x010 1 - --- Average Short Term Temperature
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| 132 | 0x05 0x018 1 - --- Average Long Term Temperature
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| 133 | 0x05 0x020 1 39 --- Highest Temperature
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| 134 | 0x05 0x028 1 31 --- Lowest Temperature
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| 135 | 0x05 0x030 1 35 --- Highest Average Short Term Temperature
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| 136 | 0x05 0x038 1 35 --- Lowest Average Short Term Temperature
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| 137 | 0x05 0x040 1 - --- Highest Average Long Term Temperature
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| 138 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature
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| 139 | 0x05 0x050 4 0 --- Time in Over-Temperature
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| 140 | 0x05 0x058 1 95 --- Specified Maximum Operating Temperature
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| 141 | 0x05 0x060 4 0 --- Time in Under-Temperature
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| 142 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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| 143 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 144 | 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
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| 145 | |||_ C monitored condition met
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| 146 | ||__ D supports DSN
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| 147 | |___ N normalized value
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| 148 |
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| 149 | SATA Phy Event Counters (GP Log 0x11)
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| 150 | ID Size Value Description
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| 151 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 152 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 153 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 154 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 155 | 0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy
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| 156 | 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
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| 157 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 158 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 159 | 0x0001 2 0 Command failed due to ICRC error
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| 160 |
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