| 1 | smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.19.0-59-generic] (local build)
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| 2 | Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: M500IT_MTFDDAK240MBD
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| 6 | Serial Number: 170715F0343C
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| 7 | LU WWN Device Id: 5 00a075 115f0343c
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| 8 | Firmware Version: MG02
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| 9 | User Capacity: 240.057.409.536 bytes [240 GB]
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| 10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Device is: Not in smartctl database [for details use: -P showall]
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| 13 | ATA Version is: ACS-3 (unknown minor revision code: 0x011b)
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| 14 | SATA Version is: SATA >3.1, 6.0 Gb/s (current: 3.0 Gb/s)
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| 15 | Local Time is: Mon Dec 18 16:02:21 2017 CET
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| 16 | SMART support is: Available - device has SMART capability.
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| 17 | SMART support is: Enabled
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| 18 | AAM feature is: Unavailable
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| 19 | APM level is: 254 (maximum performance)
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| 20 | Rd look-ahead is: Enabled
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| 21 | Write cache is: Enabled
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| 22 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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| 23 | Wt Cache Reorder: Enabled
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| 24 |
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| 25 | === START OF READ SMART DATA SECTION ===
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| 26 | SMART overall-health self-assessment test result: PASSED
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| 27 |
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| 28 | General SMART Values:
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| 29 | Offline data collection status: (0x80) Offline data collection activity
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| 30 | was never started.
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| 31 | Auto Offline Data Collection: Enabled.
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| 32 | Self-test execution status: ( 0) The previous self-test routine completed
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| 33 | without error or no self-test has ever
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| 34 | been run.
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| 35 | Total time to complete Offline
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| 36 | data collection: ( 428) seconds.
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| 37 | Offline data collection
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| 38 | capabilities: (0x7b) SMART execute Offline immediate.
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| 39 | Auto Offline data collection on/off support.
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| 40 | Suspend Offline collection upon new
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| 41 | command.
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| 42 | Offline surface scan supported.
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| 43 | Self-test supported.
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| 44 | Conveyance Self-test supported.
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| 45 | Selective Self-test supported.
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| 46 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 47 | power-saving mode.
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| 48 | Supports SMART auto save timer.
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| 49 | Error logging capability: (0x01) Error logging supported.
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| 50 | General Purpose Logging supported.
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| 51 | Short self-test routine
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| 52 | recommended polling time: ( 2) minutes.
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| 53 | Extended self-test routine
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| 54 | recommended polling time: ( 3) minutes.
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| 55 | Conveyance self-test routine
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| 56 | recommended polling time: ( 3) minutes.
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| 57 | SCT capabilities: (0x0035) SCT Status supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 16
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 1
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| 65 | 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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| 66 | 9 Power_On_Hours -O--CK 100 100 000 - 0
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| 67 | 12 Power_Cycle_Count -O--CK 100 100 000 - 3
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| 68 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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| 69 | 172 Unknown_Attribute -O--CK 100 100 000 - 0
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| 70 | 173 Unknown_Attribute -O--CK 100 100 000 - 0
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| 71 | 174 Unknown_Attribute -O--CK 100 100 000 - 2
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| 72 | 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 2217
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| 73 | 183 Runtime_Bad_Block -O--CK 100 100 000 - 2
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| 74 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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| 75 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 76 | 194 Temperature_Celsius -O---K 066 066 000 - 34 (Min/Max 25/34)
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| 77 | 196 Reallocated_Event_Count -O--CK 100 100 000 - 0
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| 78 | 197 Current_Pending_Sector -O--CK 100 100 000 - 0
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| 79 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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| 80 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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| 81 | 202 Unknown_SSD_Attribute P---CK 100 100 001 - 0
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| 82 | 206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0
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| 83 | 210 Unknown_Attribute -O--CK 100 100 000 - 0
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| 84 | 232 Available_Reservd_Space -O---K 100 100 000 - 468862128
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| 85 | 246 Unknown_Attribute -O--CK 100 100 000 - 0
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| 86 | 247 Unknown_Attribute -O--CK 100 100 000 - 0
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| 87 | 248 Unknown_Attribute -O--CK 100 100 000 - 2372
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| 88 | ||||||_ K auto-keep
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| 89 | |||||__ C event count
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| 90 | ||||___ R error rate
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| 91 | |||____ S speed/performance
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| 92 | ||_____ O updated online
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| 93 | |______ P prefailure warning
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| 94 |
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| 95 | General Purpose Log Directory Version 1
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| 96 | SMART Log Directory Version 1 [multi-sector log support]
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| 97 | Address Access R/W Size Description
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| 98 | 0x00 GPL,SL R/O 1 Log Directory
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| 99 | 0x01 SL R/O 1 Summary SMART error log
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| 100 | 0x02 SL R/O 51 Comprehensive SMART error log
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| 101 | 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
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| 102 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 103 | 0x06 SL R/O 1 SMART self-test log
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| 104 | 0x07 GPL R/O 1 Extended self-test log
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| 105 | 0x09 SL R/W 1 Selective self-test log
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| 106 | 0x10 GPL R/O 1 NCQ Command Error log
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| 107 | 0x11 GPL R/O 1 SATA Phy Event Counters
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| 108 | 0x13 GPL R/O 1 SATA NCQ Send and Receive log
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| 109 | 0x24 GPL R/O 358 Current Device Internal Status Data log
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| 110 | 0x25 GPL R/O 48 Saved Device Internal Status Data log
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| 111 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 112 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 113 | 0xa0 GPL VS 2000 Device vendor specific log
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| 114 | 0xa0 SL VS 208 Device vendor specific log
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| 115 | 0xa1-0xbf GPL,SL VS 1 Device vendor specific log
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| 116 | 0xc0 GPL,SL VS 80 Device vendor specific log
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| 117 | 0xc1-0xdf GPL,SL VS 1 Device vendor specific log
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| 118 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 119 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 120 |
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| 121 | SMART Extended Comprehensive Error Log size 16383 not supported
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| 122 |
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| 123 | SMART Error Log Version: 1
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| 124 | No Errors Logged
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| 125 |
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| 126 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 127 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 128 | # 1 Short offline Completed without error 00% 0 -
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| 129 |
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| 130 | SMART Selective self-test log data structure revision number 1
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| 131 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 132 | 1 0 0 Not_testing
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| 133 | 2 0 0 Not_testing
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| 134 | 3 0 0 Completed [00% left] (57881389-57946924)
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| 135 | 4 0 0 Not_testing
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| 136 | 5 0 0 Not_testing
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| 137 | Selective self-test flags (0x0):
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| 138 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 139 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 140 |
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| 141 | SCT Status Version: 3
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| 142 | SCT Version (vendor specific): 1 (0x0001)
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| 143 | SCT Support Level: 0
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| 144 | Device State: Active (0)
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| 145 | Current Temperature: 34 Celsius
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| 146 | Power Cycle Min/Max Temperature: 28/34 Celsius
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| 147 | Lifetime Min/Max Temperature: 25/34 Celsius
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| 148 | Under/Over Temperature Limit Count: 0/0
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| 149 | SCT Temperature History Version: 2
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| 150 | Temperature Sampling Period: 1 minute
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| 151 | Temperature Logging Interval: 1 minute
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| 152 | Min/Max recommended Temperature: -30/85 Celsius
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| 153 | Min/Max Temperature Limit: -30/125 Celsius
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| 154 | Temperature History Size (Index): 478 (49)
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| 155 |
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| 156 | Index Estimated Time Temperature Celsius
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| 157 | 50 2017-12-18 08:05 ? -
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| 158 | ... ..(431 skipped). .. -
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| 159 | 4 2017-12-18 15:17 ? -
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| 160 | 5 2017-12-18 15:18 0 -
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| 161 | ... ..( 12 skipped). .. -
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| 162 | 18 2017-12-18 15:31 0 -
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| 163 | 19 2017-12-18 15:32 ? -
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| 164 | 20 2017-12-18 15:33 28 *********
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| 165 | 21 2017-12-18 15:34 29 **********
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| 166 | 22 2017-12-18 15:35 30 ***********
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| 167 | 23 2017-12-18 15:36 30 ***********
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| 168 | 24 2017-12-18 15:37 31 ************
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| 169 | 25 2017-12-18 15:38 31 ************
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| 170 | 26 2017-12-18 15:39 31 ************
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| 171 | 27 2017-12-18 15:40 32 *************
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| 172 | ... ..( 3 skipped). .. *************
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| 173 | 31 2017-12-18 15:44 32 *************
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| 174 | 32 2017-12-18 15:45 33 **************
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| 175 | ... ..( 12 skipped). .. **************
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| 176 | 45 2017-12-18 15:58 33 **************
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| 177 | 46 2017-12-18 15:59 34 ***************
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| 178 | ... ..( 2 skipped). .. ***************
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| 179 | 49 2017-12-18 16:02 34 ***************
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| 180 |
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| 181 | SCT Error Recovery Control command not supported
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| 182 |
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| 183 | Device Statistics (GP Log 0x04)
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| 184 | Page Offset Size Value Description
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| 185 | 1 ===== = = == General Statistics (rev 1) ==
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| 186 | 1 0x008 4 3 Lifetime Power-On Resets
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| 187 | 1 0x010 4 0 Power-on Hours
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| 188 | 1 0x018 6 0 Logical Sectors Written
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| 189 | 1 0x020 6 0 Number of Write Commands
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| 190 | 1 0x028 6 2256 Logical Sectors Read
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| 191 | 1 0x030 6 282 Number of Read Commands
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| 192 | 4 ===== = = == General Errors Statistics (rev 1) ==
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| 193 | 4 0x008 4 0 Number of Reported Uncorrectable Errors
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| 194 | 4 0x010 4 2 Resets Between Cmd Acceptance and Completion
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| 195 | 5 ===== = = == Temperature Statistics (rev 1) ==
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| 196 | 5 0x008 1 34 Current Temperature
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| 197 | 5 0x010 1 - Average Short Term Temperature
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| 198 | 5 0x018 1 - Average Long Term Temperature
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| 199 | 5 0x020 1 34 Highest Temperature
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| 200 | 5 0x028 1 25 Lowest Temperature
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| 201 | 5 0x030 1 - Highest Average Short Term Temperature
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| 202 | 5 0x038 1 - Lowest Average Short Term Temperature
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| 203 | 5 0x040 1 - Highest Average Long Term Temperature
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| 204 | 5 0x048 1 - Lowest Average Long Term Temperature
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| 205 | 5 0x050 4 0 Time in Over-Temperature
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| 206 | 5 0x058 1 85 Specified Maximum Operating Temperature
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| 207 | 5 0x060 4 0 Time in Under-Temperature
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| 208 | 5 0x068 1+ -40~ Specified Minimum Operating Temperature
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| 209 | 6 ===== = = == Transport Statistics (rev 1) ==
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| 210 | 6 0x008 4 4 Number of Hardware Resets
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| 211 | 6 0x010 4 0 Number of ASR Events
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| 212 | 6 0x018 4 0 Number of Interface CRC Errors
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| 213 | 7 ===== = = == Solid State Device Statistics (rev 1) ==
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| 214 | 7 0x008 1 0~ Percentage Used Endurance Indicator
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| 215 | |_ ~ normalized value
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| 216 |
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| 217 | SATA Phy Event Counters (GP Log 0x11)
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| 218 | ID Size Value Description
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| 219 | 0x0001 4 0 Command failed due to ICRC error
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| 220 | 0x000a 4 1 Device-to-host register FISes sent due to a COMRESET
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| 221 |
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| 222 |
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