| 1 | smartctl 7.1 2019-12-30 r5022 [x86_64-w64-mingw32-w10-1909] (sf-7.1-1)
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| 2 | Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SAMSUNG MZYLN256HCHP-000L2
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| 6 | Firmware Version: EMT63L0Q
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| 7 | User Capacity: 256 060 514 304 bytes [256 GB]
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| 8 | Sector Size: 512 bytes logical/physical
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| 9 | Rotation Rate: Solid State Device
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| 10 | Device is: Not in smartctl database [for details use: -P showall]
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| 11 | ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
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| 12 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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| 13 | Local Time is: Sun Oct 25 18:40:30 2020 FLEST
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| 14 | SMART support is: Available - device has SMART capability.
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| 15 | SMART support is: Enabled
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| 16 | AAM feature is: Unavailable
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| 17 | APM feature is: Unavailable
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| 18 | Rd look-ahead is: Enabled
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| 19 | Write cache is: Enabled
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| 20 | DSN feature is: Unavailable
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| 21 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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| 22 | Wt Cache Reorder: Unknown
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| 23 |
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| 24 | === START OF READ SMART DATA SECTION ===
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| 25 | SMART Status not supported: Incomplete response, ATA output registers missing
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| 26 | SMART overall-health self-assessment test result: PASSED
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| 27 | Warning: This result is based on an Attribute check.
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| 28 |
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| 29 | General SMART Values:
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| 30 | Offline data collection status: (0x80) Offline data collection activity
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| 31 | was never started.
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| 32 | Auto Offline Data Collection: Enabled.
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed
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| 34 | without error or no self-test has ever
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| 35 | been run.
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| 36 | Total time to complete Offline
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| 37 | data collection: ( 0) seconds.
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| 38 | Offline data collection
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| 39 | capabilities: (0x53) SMART execute Offline immediate.
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| 40 | Auto Offline data collection on/off support.
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| 41 | Suspend Offline collection upon new
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| 42 | command.
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| 43 | No Offline surface scan supported.
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| 44 | Self-test supported.
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| 45 | No Conveyance Self-test supported.
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| 46 | Selective Self-test supported.
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| 47 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 48 | power-saving mode.
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| 49 | Supports SMART auto save timer.
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| 50 | Error logging capability: (0x01) Error logging supported.
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| 51 | General Purpose Logging supported.
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| 52 | Short self-test routine
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| 53 | recommended polling time: ( 2) minutes.
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| 54 | Extended self-test routine
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| 55 | recommended polling time: ( 133) minutes.
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| 56 | SCT capabilities: (0x003d) SCT Status supported.
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| 57 | SCT Error Recovery Control supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 1
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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| 65 | 9 Power_On_Hours -O--CK 099 099 000 - 3965
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| 66 | 12 Power_Cycle_Count -O--CK 097 097 000 - 2042
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| 67 | 170 Unknown_Attribute -O--CK 100 100 010 - 0
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| 68 | 171 Unknown_Attribute -O--CK 100 100 010 - 0
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| 69 | 172 Unknown_Attribute -O--CK 100 100 010 - 0
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| 70 | 173 Unknown_Attribute PO--CK 095 095 005 - 100
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| 71 | 174 Unknown_Attribute -O--CK 099 099 000 - 44
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| 72 | 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0
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| 73 | 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 769
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| 74 | 184 End-to-End_Error PO--CK 100 100 097 - 0
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| 75 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 76 | 194 Temperature_Celsius -O--CK 073 054 000 - 27
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| 77 | 199 UDMA_CRC_Error_Count -OSRCK 099 099 000 - 1
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| 78 | 233 Media_Wearout_Indicator PO--C- 095 095 000 - 15938354
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| 79 | 241 Total_LBAs_Written -O--CK 099 099 000 - 13213
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| 80 | 242 Total_LBAs_Read -O--CK 099 099 000 - 18368
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| 81 | 249 Unknown_Attribute -O--CK 099 099 000 - 25600
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| 82 | ||||||_ K auto-keep
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| 83 | |||||__ C event count
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| 84 | ||||___ R error rate
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| 85 | |||____ S speed/performance
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| 86 | ||_____ O updated online
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| 87 | |______ P prefailure warning
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| 88 |
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| 89 | General Purpose Log Directory Version 1
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| 90 | SMART Log Directory Version 1 [multi-sector log support]
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| 91 | Address Access R/W Size Description
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| 92 | 0x00 GPL,SL R/O 1 Log Directory
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| 93 | 0x01 SL R/O 1 Summary SMART error log
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| 94 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 95 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 96 | 0x06 SL R/O 1 SMART self-test log
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| 97 | 0x07 GPL R/O 1 Extended self-test log
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| 98 | 0x09 SL R/W 1 Selective self-test log
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| 99 | 0x10 GPL R/O 1 NCQ Command Error log
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| 100 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 101 | 0x13 GPL R/O 1 SATA NCQ Send and Receive log
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| 102 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 103 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 104 | 0xdf GPL,SL VS 1 Device vendor specific log
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| 105 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 106 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 107 |
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| 108 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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| 109 | No Errors Logged
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| 110 |
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| 111 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 112 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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| 113 |
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| 114 | Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
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| 115 | SMART Selective self-test log data structure revision number 1
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| 116 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 117 | 1 0 0 Not_testing
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| 118 | 2 0 0 Not_testing
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| 119 | 3 0 0 Not_testing
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| 120 | 4 0 0 Not_testing
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| 121 | 5 0 0 Not_testing
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| 122 | 255 0 65535 Read_scanning was never started
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| 123 | Selective self-test flags (0x0):
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| 124 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 125 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 126 |
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| 127 | SCT Status Version: 3
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| 128 | SCT Version (vendor specific): 256 (0x0100)
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| 129 | Device State: SCT command executing in background (5)
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| 130 | Current Temperature: 27 Celsius
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| 131 | Power Cycle Min/Max Temperature: 26/40 Celsius
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| 132 | Lifetime Min/Max Temperature: 0/70 Celsius
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| 133 | Under/Over Temperature Limit Count: 4294967295/4294901760
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| 134 | SMART Status: 0xffff (Reserved)
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| 135 |
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| 136 | SCT Temperature History Version: 3 (Unknown, should be 2)
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| 137 | Temperature Sampling Period: 1 minute
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| 138 | Temperature Logging Interval: 10 minutes
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| 139 | Min/Max recommended Temperature: 0/70 Celsius
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| 140 | Min/Max Temperature Limit: 0/70 Celsius
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| 141 | Temperature History Size (Index): 128 (2)
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| 142 |
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| 143 | Index Estimated Time Temperature Celsius
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| 144 | 3 2020-10-24 22:30 ? -
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| 145 | ... ..(123 skipped). .. -
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| 146 | 127 2020-10-25 18:10 ? -
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| 147 | 0 2020-10-25 18:20 40 *********************
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| 148 | 1 2020-10-25 18:30 26 *******
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| 149 | 2 2020-10-25 18:40 27 ********
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| 150 |
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| 151 | SMART WRITE LOG does not return COUNT and LBA_LOW register
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| 152 | SCT (Get) Error Recovery Control command failed
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| 153 |
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| 154 | Device Statistics (GP/SMART Log 0x04) not supported
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| 155 |
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| 156 | Pending Defects log (GP Log 0x0c) not supported
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| 157 |
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| 158 | SATA Phy Event Counters (GP Log 0x11)
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| 159 | ID Size Value Description
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| 160 | 0x0001 2 0 Command failed due to ICRC error
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| 161 | 0x0002 2 0 R_ERR response for data FIS
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| 162 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 163 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 164 | 0x0005 2 0 R_ERR response for non-data FIS
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| 165 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 166 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 167 | 0x0008 2 0 Device-to-host non-data FIS retries
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| 168 | 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy
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| 169 | 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET
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| 170 | 0x000b 2 0 CRC errors within host-to-device FIS
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| 171 | 0x000d 2 0 Non-CRC errors within host-to-device FIS
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| 172 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 173 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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| 174 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 175 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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| 176 |
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