| 1 | smartctl 6.5 2016-05-07 r4318 [i686-w64-mingw32-win7-sp1] (sf-6.5-1)
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SAMSUNG MZ7LN128HAHQ-000H1
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| 6 | Serial Number: S3TENE0JA13587
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| 7 | LU WWN Device Id: 5 002538 d00000000
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| 8 | Firmware Version: MVT03H6Q
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| 9 | User Capacity: 1,024,209,543,168 bytes [1.02 TB]
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| 10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: 2.5 inches
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| 13 | Device is: Not in smartctl database [for details use: -P showall]
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| 14 | ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c
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| 15 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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| 16 | Local Time is: Fri Oct 20 10:44:56 2017
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| 17 | SMART support is: Available - device has SMART capability.
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| 18 | SMART support is: Enabled
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| 19 | AAM feature is: Unavailable
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| 20 | APM feature is: Disabled
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| 21 | Rd look-ahead is: Enabled
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| 22 | Write cache is: Enabled
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| 23 | ATA Security is: Disabled, frozen [SEC2]
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| 24 | Wt Cache Reorder: Enabled
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| 25 |
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| 26 | === START OF READ SMART DATA SECTION ===
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| 27 | SMART overall-health self-assessment test result: PASSED
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| 28 |
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| 29 | General SMART Values:
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| 30 | Offline data collection status: (0x02) Offline data collection activity
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| 31 | was completed without error.
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| 32 | Auto Offline Data Collection: Disabled.
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed
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| 34 | without error or no self-test has ever
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| 35 | been run.
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| 36 | Total time to complete Offline
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| 37 | data collection: ( 5100) seconds.
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| 38 | Offline data collection
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| 39 | capabilities: (0x5b) SMART execute Offline immediate.
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| 40 | Auto Offline data collection on/off support.
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| 41 | Suspend Offline collection upon new
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| 42 | command.
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| 43 | Offline surface scan supported.
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| 44 | Self-test supported.
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| 45 | No Conveyance Self-test supported.
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| 46 | Selective Self-test supported.
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| 47 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 48 | power-saving mode.
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| 49 | Supports SMART auto save timer.
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| 50 | Error logging capability: (0x01) Error logging supported.
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| 51 | General Purpose Logging supported.
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| 52 | Short self-test routine
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| 53 | recommended polling time: ( 2) minutes.
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| 54 | Extended self-test routine
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| 55 | recommended polling time: ( 85) minutes.
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| 56 | SCT capabilities: (0x003d) SCT Status supported.
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| 57 | SCT Error Recovery Control supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 1
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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| 65 | 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0
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| 66 | 9 Power_On_Hours -O--CK 100 100 000 - 0
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| 67 | 12 Power_Cycle_Count -O--CK 100 100 000 - 2
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| 68 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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| 69 | 172 Unknown_Attribute -O--CK 100 100 000 - 0
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| 70 | 173 Unknown_Attribute -O--CK 100 100 005 - 0
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| 71 | 174 Unknown_Attribute -O--CK 100 100 000 - 2
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| 72 | 176 Erase_Fail_Count_Chip -O---K 100 100 000 - 2335
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| 73 | 181 Program_Fail_Cnt_Total -O---K 000 000 000 - 0
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| 74 | 183 Runtime_Bad_Block -O--CK 100 100 000 - 0
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| 75 | 184 End-to-End_Error PO-RCK 100 100 097 - 0
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| 76 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 77 | 188 Command_Timeout -O--CK 100 100 000 - 0
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| 78 | 194 Temperature_Celsius -O---K 031 040 000 - 31 (Min/Max 31/40)
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| 79 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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| 80 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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| 81 | 201 Unknown_SSD_Attribute PO---K 100 100 005 - 100
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| 82 | 241 Total_LBAs_Written -O--CK 100 100 000 - 0
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| 83 | 242 Total_LBAs_Read -O--CK 100 100 000 - 0
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| 84 | 243 Unknown_Attribute -O--CK 100 100 000 - 0
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| 85 | ||||||_ K auto-keep
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| 86 | |||||__ C event count
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| 87 | ||||___ R error rate
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| 88 | |||____ S speed/performance
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| 89 | ||_____ O updated online
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| 90 | |______ P prefailure warning
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| 91 |
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| 92 | General Purpose Log Directory Version 1
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| 93 | SMART Log Directory Version 1 [multi-sector log support]
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| 94 | Address Access R/W Size Description
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| 95 | 0x00 GPL,SL R/O 1 Log Directory
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| 96 | 0x01 SL R/O 1 Summary SMART error log
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| 97 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 98 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 99 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 100 | 0x06 SL R/O 1 SMART self-test log
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| 101 | 0x07 GPL R/O 1 Extended self-test log
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| 102 | 0x09 SL R/W 1 Selective self-test log
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| 103 | 0x0a GPL R/W 1 Device Statistics Notification
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| 104 | 0x0c GPL R/O 1 Pending Defects log
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| 105 | 0x0d GPL,SL R/O 1 LPS Mis-alignment log
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| 106 | 0x10 GPL R/O 1 SATA NCQ Queued Error log
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| 107 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 108 | 0x13 GPL R/O 1 SATA NCQ Send and Receive log
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| 109 | 0x19 GPL R/O 8 LBA Status log
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| 110 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 111 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 112 | 0xa5 SL VS 16 Device vendor specific log
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| 113 | 0xce SL VS 16 Device vendor specific log
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| 114 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 115 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 116 |
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| 117 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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| 118 | No Errors Logged
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| 119 |
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| 120 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 121 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 122 | # 1 Short offline Completed without error 00% 0 -
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| 123 |
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| 124 | SMART Selective self-test log data structure revision number 1
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| 125 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 126 | 1 0 0 Not_testing
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| 127 | 2 0 0 Not_testing
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| 128 | 3 0 0 Not_testing
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| 129 | 4 0 0 Not_testing
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| 130 | 5 0 0 Not_testing
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| 131 | 255 0 65535 Read_scanning was completed without error
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| 132 | Selective self-test flags (0x0):
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| 133 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 134 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 135 |
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| 136 | SCT Status Version: 3
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| 137 | SCT Version (vendor specific): 256 (0x0100)
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| 138 | SCT Support Level: 1
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| 139 | Device State: Active (0)
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| 140 | Current Temperature: ? Celsius
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| 141 | Power Cycle Min/Max Temperature: 37/37 Celsius
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| 142 | Lifetime Min/Max Temperature: 34/37 Celsius
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| 143 | Under/Over Temperature Limit Count: 0/0
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| 144 |
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| 145 | SCT Temperature History Version: 2
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| 146 | Temperature Sampling Period: 1 minute
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| 147 | Temperature Logging Interval: 10 minutes
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| 148 | Min/Max recommended Temperature: 0/70 Celsius
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| 149 | Min/Max Temperature Limit: 0/70 Celsius
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| 150 | Temperature History Size (Index): 128 (3)
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| 151 |
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| 152 | Index Estimated Time Temperature Celsius
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| 153 | 4 2017-10-19 13:30 ? -
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| 154 | ... ..(122 skipped). .. -
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| 155 | 127 2017-10-20 10:00 ? -
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| 156 | 0 2017-10-20 10:10 34 ***************
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| 157 | 1 2017-10-20 10:20 ? -
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| 158 | 2 2017-10-20 10:30 37 ******************
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| 159 | 3 2017-10-20 10:40 ? -
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| 160 |
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| 161 | SCT Error Recovery Control:
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| 162 | Read: Disabled
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| 163 | Write: Disabled
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| 164 |
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| 165 | Device Statistics (GP Log 0x04)
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| 166 | Page Offset Size Value Flags Description
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| 167 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 168 | 0x01 0x008 4 2 -D- Lifetime Power-On Resets
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| 169 | 0x01 0x010 4 0 -D- Power-on Hours
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| 170 | 0x01 0x018 6 0 -D- Logical Sectors Written
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| 171 | 0x01 0x020 6 0 -D- Number of Write Commands
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| 172 | 0x01 0x028 6 12 -D- Logical Sectors Read
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| 173 | 0x01 0x030 6 11 -D- Number of Read Commands
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| 174 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 175 | 0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors
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| 176 | 0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion
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| 177 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 178 | 0x05 0x008 1 -128 -D- Current Temperature
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| 179 | 0x05 0x020 1 37 -D- Highest Temperature
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| 180 | 0x05 0x028 1 34 -D- Lowest Temperature
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| 181 | 0x05 0x058 1 55 -D- Specified Maximum Operating Temperature
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| 182 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 183 | 0x06 0x008 4 4 -D- Number of Hardware Resets
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| 184 | 0x06 0x010 4 0 -D- Number of ASR Events
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| 185 | 0x06 0x018 4 0 -D- Number of Interface CRC Errors
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| 186 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 187 | 0x07 0x008 1 0 ND- Percentage Used Endurance Indicator
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| 188 | |||_ C monitored condition met
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| 189 | ||__ D supports DSN
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| 190 | |___ N normalized value
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| 191 |
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| 192 | SATA Phy Event Counters (GP Log 0x11)
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| 193 | ID Size Value Description
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| 194 | 0x0001 2 0 Command failed due to ICRC error
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| 195 | 0x0002 2 0 R_ERR response for data FIS
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| 196 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 197 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 198 | 0x0005 2 0 R_ERR response for non-data FIS
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| 199 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 200 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 201 | 0x0008 2 0 Device-to-host non-data FIS retries
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| 202 | 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy
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| 203 | 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET
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| 204 | 0x000b 2 0 CRC errors within host-to-device FIS
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| 205 | 0x000d 2 0 Non-CRC errors within host-to-device FIS
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| 206 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 207 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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| 208 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 209 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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| 210 |
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