1 | smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.4.55-std494-amd64] (local build)
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2 | Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: TOSHIBA THNSN8960PCSE
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6 | Serial Number: 86VS10KNTB1V
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7 | LU WWN Device Id: 5 00080d 91070fa7b
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8 | Firmware Version: 8EET6101
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9 | User Capacity: 960,197,124,096 bytes [960 GB]
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10 | Sector Size: 512 bytes logical/physical
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11 | Rotation Rate: Solid State Device
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12 | Form Factor: 2.5 inches
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13 | Device is: Not in smartctl database [for details use: -P showall]
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14 | ATA Version is: ACS-3 (minor revision not indicated)
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15 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
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16 | Local Time is: Tue Aug 1 16:25:27 2017 UTC
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17 | SMART support is: Available - device has SMART capability.
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18 | SMART support is: Enabled
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19 | AAM feature is: Unavailable
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20 | APM level is: 254 (maximum performance)
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21 | Rd look-ahead is: Enabled
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22 | Write cache is: Enabled
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23 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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24 | Wt Cache Reorder: Enabled
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25 |
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26 | === START OF READ SMART DATA SECTION ===
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27 | SMART overall-health self-assessment test result: PASSED
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28 |
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29 | General SMART Values:
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30 | Offline data collection status: (0x00) Offline data collection activity
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31 | was never started.
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32 | Auto Offline Data Collection: Disabled.
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33 | Self-test execution status: ( 0) The previous self-test routine completed
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34 | without error or no self-test has ever
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35 | been run.
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36 | Total time to complete Offline
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37 | data collection: ( 120) seconds.
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38 | Offline data collection
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39 | capabilities: (0x5b) SMART execute Offline immediate.
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40 | Auto Offline data collection on/off support.
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41 | Suspend Offline collection upon new
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42 | command.
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43 | Offline surface scan supported.
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44 | Self-test supported.
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45 | No Conveyance Self-test supported.
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46 | Selective Self-test supported.
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47 | SMART capabilities: (0x0003) Saves SMART data before entering
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48 | power-saving mode.
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49 | Supports SMART auto save timer.
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50 | Error logging capability: (0x01) Error logging supported.
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51 | General Purpose Logging supported.
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52 | Short self-test routine
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53 | recommended polling time: ( 2) minutes.
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54 | Extended self-test routine
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55 | recommended polling time: ( 34) minutes.
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56 | SCT capabilities: (0x003d) SCT Status supported.
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57 | SCT Error Recovery Control supported.
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58 | SCT Feature Control supported.
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59 | SCT Data Table supported.
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60 |
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61 | SMART Attributes Data Structure revision number: 16
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62 | Vendor Specific SMART Attributes with Thresholds:
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63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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64 | 1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
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65 | 2 Throughput_Performance P-S--- 100 100 050 - 0
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66 | 3 Spin_Up_Time POS--- 100 100 050 - 0
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67 | 5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
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68 | 7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
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69 | 8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
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70 | 9 Power_On_Hours -O--C- 100 100 000 - 0
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71 | 10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
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72 | 12 Power_Cycle_Count -O--C- 100 100 000 - 3
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73 | 167 Unknown_Attribute -O---K 100 100 000 - 0
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74 | 168 Unknown_Attribute -O--C- 100 100 000 - 0
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75 | 169 Unknown_Attribute PO--C- 100 100 010 - 100
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76 | 170 Unknown_Attribute PO--C- 100 100 010 - 0
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77 | 173 Unknown_Attribute -O--C- 200 200 000 - 0
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78 | 174 Unknown_Attribute -O--C- 200 200 000 - 0
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79 | 175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
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80 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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81 | 192 Power-Off_Retract_Count -O--C- 100 100 000 - 0
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82 | 194 Temperature_Celsius -O---K 071 069 000 - 29 (Min/Max 24/31)
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83 | 197 Current_Pending_Sector -O--C- 100 100 000 - 0
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84 | 232 Available_Reservd_Space -O---K 100 100 000 - 0
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85 | 240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
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86 | 241 Total_LBAs_Written -O--C- 100 100 000 - 0
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87 | 242 Total_LBAs_Read -O--C- 100 100 000 - 0
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88 | 243 Unknown_Attribute -O--C- 100 100 000 - 0
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89 | 249 Unknown_Attribute -O---K 100 100 000 - 0
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90 | ||||||_ K auto-keep
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91 | |||||__ C event count
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92 | ||||___ R error rate
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93 | |||____ S speed/performance
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94 | ||_____ O updated online
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95 | |______ P prefailure warning
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96 |
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97 | General Purpose Log Directory Version 1
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98 | SMART Log Directory Version 1 [multi-sector log support]
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99 | Address Access R/W Size Description
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100 | 0x00 GPL,SL R/O 1 Log Directory
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101 | 0x01 SL R/O 1 Summary SMART error log
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102 | 0x02 SL R/O 51 Comprehensive SMART error log
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103 | 0x03 GPL R/O 64 Ext. Comprehensive SMART error log
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104 | 0x04 GPL,SL R/O 8 Device Statistics log
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105 | 0x06 SL R/O 1 SMART self-test log
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106 | 0x07 GPL R/O 1 Extended self-test log
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107 | 0x09 SL R/W 1 Selective self-test log
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108 | 0x10 GPL R/O 1 SATA NCQ Queued Error log
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109 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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110 | 0x24 GPL R/O 1536 Current Device Internal Status Data log
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111 | 0x25 GPL R/O 49216 Saved Device Internal Status Data log
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112 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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113 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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114 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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115 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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116 |
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117 | SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
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118 | No Errors Logged
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119 |
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120 | SMART Extended Self-test Log Version: 1 (1 sectors)
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121 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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122 | # 1 Short offline Completed without error 00% 0 -
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123 |
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124 | SMART Selective self-test log data structure revision number 1
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125 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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126 | 1 0 0 Not_testing
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127 | 2 0 0 Not_testing
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128 | 3 0 0 Not_testing
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129 | 4 0 0 Not_testing
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130 | 5 0 0 Not_testing
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131 | Selective self-test flags (0x0):
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132 | After scanning selected spans, do NOT read-scan remainder of disk.
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133 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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134 |
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135 | SCT Status Version: 3
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136 | SCT Version (vendor specific): 3 (0x0003)
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137 | SCT Support Level: 0
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138 | Device State: Active (0)
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139 | Current Temperature: 29 Celsius
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140 | Power Cycle Min/Max Temperature: 23/31 Celsius
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141 | Lifetime Min/Max Temperature: 24/31 Celsius
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142 | Under/Over Temperature Limit Count: 0/0
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143 | Vendor specific:
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144 | 00 00 04 00 01 01 00 05 05 00 00 00 00 00 00 00
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145 | 00 01 00 00 ad 02 00 00 04 04 00 00 00 00 00 0b
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146 |
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147 | SCT Temperature History Version: 2
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148 | Temperature Sampling Period: 1 minute
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149 | Temperature Logging Interval: 1 minute
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150 | Min/Max recommended Temperature: 5/55 Celsius
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151 | Min/Max Temperature Limit: 0/80 Celsius
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152 | Temperature History Size (Index): 128 (12)
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153 |
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154 | Index Estimated Time Temperature Celsius
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155 | 13 2017-08-01 14:18 ? -
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156 | ... ..(113 skipped). .. -
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157 | 127 2017-08-01 16:12 ? -
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158 | 0 2017-08-01 16:13 27 ********
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159 | 1 2017-08-01 16:14 ? -
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160 | 2 2017-08-01 16:15 ? -
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161 | 3 2017-08-01 16:16 25 ******
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162 | 4 2017-08-01 16:17 26 *******
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163 | 5 2017-08-01 16:18 26 *******
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164 | 6 2017-08-01 16:19 27 ********
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165 | ... ..( 2 skipped). .. ********
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166 | 9 2017-08-01 16:22 27 ********
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167 | 10 2017-08-01 16:23 30 ***********
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168 | 11 2017-08-01 16:24 31 ************
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169 | 12 2017-08-01 16:25 29 **********
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170 |
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171 | SCT Error Recovery Control:
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172 | Read: 600 (60.0 seconds)
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173 | Write: 600 (60.0 seconds)
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174 |
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175 | Device Statistics (GP Log 0x04)
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176 | Page Offset Size Value Flags Description
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177 | 0x01 ===== = = === == General Statistics (rev 2) ==
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178 | 0x01 0x008 4 3 --- Lifetime Power-On Resets
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179 | 0x01 0x018 6 0 --- Logical Sectors Written
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180 | 0x01 0x020 6 0 --- Number of Write Commands
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181 | 0x01 0x028 6 2128 --- Logical Sectors Read
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182 | 0x01 0x030 6 44 --- Number of Read Commands
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183 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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184 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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185 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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186 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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187 | 0x05 0x008 1 29 --- Current Temperature
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188 | 0x05 0x010 1 - --- Average Short Term Temperature
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189 | 0x05 0x018 1 - --- Average Long Term Temperature
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190 | 0x05 0x020 1 - --- Highest Temperature
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191 | 0x05 0x028 1 - --- Lowest Temperature
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192 | 0x05 0x030 1 - --- Highest Average Short Term Temperature
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193 | 0x05 0x038 1 - --- Lowest Average Short Term Temperature
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194 | 0x05 0x040 1 - --- Highest Average Long Term Temperature
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195 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature
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196 | 0x05 0x050 4 0 --- Time in Over-Temperature
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197 | 0x05 0x058 1 55 --- Specified Maximum Operating Temperature
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198 | 0x05 0x060 4 0 --- Time in Under-Temperature
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199 | 0x05 0x068 1 5 --- Specified Minimum Operating Temperature
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200 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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201 | 0x06 0x008 4 1 --- Number of Hardware Resets
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202 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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203 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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204 | 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
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205 | |||_ C monitored condition met
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206 | ||__ D supports DSN
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207 | |___ N normalized value
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208 |
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209 | SATA Phy Event Counters (GP Log 0x11)
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210 | ID Size Value Description
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211 | 0x0001 2 0 Command failed due to ICRC error
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212 | 0x0002 4 0 R_ERR response for data FIS
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213 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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214 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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215 | 0x0005 4 0 R_ERR response for non-data FIS
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216 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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217 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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218 | 0x0008 2 0 Device-to-host non-data FIS retries
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219 | 0x0009 4 0 Transition from drive PhyRdy to drive PhyNRdy
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220 | 0x000a 4 1 Device-to-host register FISes sent due to a COMRESET
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221 | 0x000b 4 0 CRC errors within host-to-device FIS
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222 | 0x000d 4 0 Non-CRC errors within host-to-device FIS
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223 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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224 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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225 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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226 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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227 |
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