| 1 | smartctl 6.5 2016-05-07 r4318 [x86_64-w64-mingw32-win7-sp1] (sf-6.5-1)
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SK hynix SC313 HFS256G32TNF-N3A0A
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| 6 | Serial Number: EI77Q1098101A8G1D
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| 7 | LU WWN Device Id: 5 ace42e 0201b55f7
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| 8 | Firmware Version: 70000P10
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| 9 | User Capacity: 256,060,514,304 bytes [256 GB]
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| 10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: 2.5 inches
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| 13 | Device is: Not in smartctl database [for details use: -P showall]
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| 14 | ATA Version is: ACS-3 (minor revision not indicated)
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| 15 | SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 3.0 Gb/s)
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| 16 | Local Time is: Mon Sep 25 14:49:39 2017 PDT
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| 17 | SMART support is: Available - device has SMART capability.
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| 18 | SMART support is: Enabled
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| 19 |
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| 20 | === START OF READ SMART DATA SECTION ===
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| 21 | SMART Status not supported: Incomplete response, ATA output registers missing
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| 22 | SMART overall-health self-assessment test result: PASSED
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| 23 | Warning: This result is based on an Attribute check.
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| 24 |
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| 25 | General SMART Values:
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| 26 | Offline data collection status: (0x02) Offline data collection activity
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| 27 | was completed without error.
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| 28 | Auto Offline Data Collection: Disabled.
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| 29 | Self-test execution status: ( 0) The previous self-test routine completed
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| 30 | without error or no self-test has ever
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| 31 | been run.
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| 32 | Total time to complete Offline
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| 33 | data collection: ( 94) seconds.
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| 34 | Offline data collection
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| 35 | capabilities: (0x5b) SMART execute Offline immediate.
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| 36 | Auto Offline data collection on/off support.
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| 37 | Suspend Offline collection upon new
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| 38 | command.
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| 39 | Offline surface scan supported.
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| 40 | Self-test supported.
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| 41 | No Conveyance Self-test supported.
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| 42 | Selective Self-test supported.
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| 43 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 44 | power-saving mode.
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| 45 | Supports SMART auto save timer.
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| 46 | Error logging capability: (0x01) Error logging supported.
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| 47 | General Purpose Logging supported.
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| 48 | Short self-test routine
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| 49 | recommended polling time: ( 2) minutes.
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| 50 | Extended self-test routine
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| 51 | recommended polling time: ( 40) minutes.
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| 52 | SCT capabilities: (0x003d) SCT Status supported.
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| 53 | SCT Error Recovery Control supported.
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| 54 | SCT Feature Control supported.
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| 55 | SCT Data Table supported.
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| 56 |
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| 57 | SMART Attributes Data Structure revision number: 32
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| 58 | Vendor Specific SMART Attributes with Thresholds:
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| 59 | ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
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| 60 | 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 0
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| 61 | 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
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| 62 | 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 16
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| 63 | 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 36
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| 64 | 100 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 65 | 168 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 66 | 169 Unknown_Attribute 0x0032 100 099 000 Old_age Always - 0
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| 67 | 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 68 | 172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 69 | 173 Unknown_Attribute 0x0032 100 100 005 Old_age Always - 0
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| 70 | 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 71 | 175 Program_Fail_Count_Chip 0x0032 100 100 000 Old_age Always - 0
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| 72 | 176 Erase_Fail_Count_Chip 0x0022 100 100 000 Old_age Always - 780
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| 73 | 178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 000 Old_age Always - 0
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| 74 | 179 Used_Rsvd_Blk_Cnt_Tot 0x0032 100 100 000 Old_age Always - 0
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| 75 | 180 Unused_Rsvd_Blk_Cnt_Tot 0x0032 100 100 000 Old_age Always - 0
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| 76 | 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 0
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| 77 | 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
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| 78 | 184 End-to-End_Error 0x003b 100 100 097 Pre-fail Always - 0
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| 79 | 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
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| 80 | 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
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| 81 | 194 Temperature_Celsius 0x0022 028 000 000 Old_age Always - 28 (Min/Max 26/33)
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| 82 | 196 Reallocated_Event_Count 0x0032 100 100 036 Old_age Always - 0
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| 83 | 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
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| 84 | 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0
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| 85 | 201 Unknown_SSD_Attribute 0x0023 100 100 005 Pre-fail Always - 0
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| 86 | 212 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 54
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| 87 | 241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 0
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| 88 | 242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 0
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| 89 | 243 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
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| 90 |
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| 91 | SMART Error Log Version: 0
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| 92 | No Errors Logged
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| 93 |
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| 94 | SMART Self-test log structure revision number 1
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| 95 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 96 | # 1 Vendor (0x50) Completed without error 00% 15 -
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| 97 | # 2 Short offline Completed without error 00% 5 -
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| 98 |
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| 99 | Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.
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| 100 | SMART Selective self-test log data structure revision number 0
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| 101 | Note: revision number not 1 implies that no selective self-test has ever been run
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| 102 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 103 | 1 0 0 Not_testing
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| 104 | 2 0 0 Not_testing
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| 105 | 3 0 0 Not_testing
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| 106 | 4 0 0 Not_testing
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| 107 | 5 0 0 Not_testing
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| 108 | Selective self-test flags (0x0):
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| 109 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 110 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 111 |
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