1 | smartctl 6.5 2016-05-07 r4318 [x86_64-w64-mingw32-win7-sp1] (sf-6.5-1) |
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2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org |
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3 | |
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4 | === START OF INFORMATION SECTION === |
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5 | Device Model: SK hynix SC313 HFS256G32TNF-N3A0A |
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6 | Serial Number: EI77Q1098101A8G1D |
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7 | LU WWN Device Id: 5 ace42e 0201b55f7 |
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8 | Firmware Version: 70000P10 |
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9 | User Capacity: 256,060,514,304 bytes [256 GB] |
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10 | Sector Sizes: 512 bytes logical, 4096 bytes physical |
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11 | Rotation Rate: Solid State Device |
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12 | Form Factor: 2.5 inches |
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13 | Device is: Not in smartctl database [for details use: -P showall] |
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14 | ATA Version is: ACS-3 (minor revision not indicated) |
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15 | SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 3.0 Gb/s) |
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16 | Local Time is: Mon Sep 25 14:49:39 2017 PDT |
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17 | SMART support is: Available - device has SMART capability. |
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18 | SMART support is: Enabled |
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19 | |
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20 | === START OF READ SMART DATA SECTION === |
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21 | SMART Status not supported: Incomplete response, ATA output registers missing |
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22 | SMART overall-health self-assessment test result: PASSED |
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23 | Warning: This result is based on an Attribute check. |
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24 | |
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25 | General SMART Values: |
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26 | Offline data collection status: (0x02) Offline data collection activity |
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27 | was completed without error. |
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28 | Auto Offline Data Collection: Disabled. |
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29 | Self-test execution status: ( 0) The previous self-test routine completed |
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30 | without error or no self-test has ever |
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31 | been run. |
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32 | Total time to complete Offline |
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33 | data collection: ( 94) seconds. |
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34 | Offline data collection |
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35 | capabilities: (0x5b) SMART execute Offline immediate. |
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36 | Auto Offline data collection on/off support. |
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37 | Suspend Offline collection upon new |
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38 | command. |
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39 | Offline surface scan supported. |
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40 | Self-test supported. |
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41 | No Conveyance Self-test supported. |
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42 | Selective Self-test supported. |
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43 | SMART capabilities: (0x0003) Saves SMART data before entering |
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44 | power-saving mode. |
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45 | Supports SMART auto save timer. |
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46 | Error logging capability: (0x01) Error logging supported. |
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47 | General Purpose Logging supported. |
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48 | Short self-test routine |
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49 | recommended polling time: ( 2) minutes. |
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50 | Extended self-test routine |
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51 | recommended polling time: ( 40) minutes. |
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52 | SCT capabilities: (0x003d) SCT Status supported. |
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53 | SCT Error Recovery Control supported. |
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54 | SCT Feature Control supported. |
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55 | SCT Data Table supported. |
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56 | |
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57 | SMART Attributes Data Structure revision number: 32 |
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58 | Vendor Specific SMART Attributes with Thresholds: |
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59 | ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE |
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60 | 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 0 |
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61 | 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 |
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62 | 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 16 |
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63 | 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 36 |
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64 | 100 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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65 | 168 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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66 | 169 Unknown_Attribute 0x0032 100 099 000 Old_age Always - 0 |
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67 | 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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68 | 172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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69 | 173 Unknown_Attribute 0x0032 100 100 005 Old_age Always - 0 |
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70 | 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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71 | 175 Program_Fail_Count_Chip 0x0032 100 100 000 Old_age Always - 0 |
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72 | 176 Erase_Fail_Count_Chip 0x0022 100 100 000 Old_age Always - 780 |
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73 | 178 Used_Rsvd_Blk_Cnt_Chip 0x0032 100 100 000 Old_age Always - 0 |
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74 | 179 Used_Rsvd_Blk_Cnt_Tot 0x0032 100 100 000 Old_age Always - 0 |
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75 | 180 Unused_Rsvd_Blk_Cnt_Tot 0x0032 100 100 000 Old_age Always - 0 |
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76 | 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 0 |
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77 | 183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0 |
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78 | 184 End-to-End_Error 0x003b 100 100 097 Pre-fail Always - 0 |
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79 | 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 |
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80 | 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0 |
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81 | 194 Temperature_Celsius 0x0022 028 000 000 Old_age Always - 28 (Min/Max 26/33) |
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82 | 196 Reallocated_Event_Count 0x0032 100 100 036 Old_age Always - 0 |
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83 | 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 |
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84 | 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 |
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85 | 201 Unknown_SSD_Attribute 0x0023 100 100 005 Pre-fail Always - 0 |
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86 | 212 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 54 |
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87 | 241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 0 |
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88 | 242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 0 |
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89 | 243 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 |
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90 | |
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91 | SMART Error Log Version: 0 |
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92 | No Errors Logged |
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93 | |
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94 | SMART Self-test log structure revision number 1 |
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95 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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96 | # 1 Vendor (0x50) Completed without error 00% 15 - |
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97 | # 2 Short offline Completed without error 00% 5 - |
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98 | |
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99 | Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. |
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100 | SMART Selective self-test log data structure revision number 0 |
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101 | Note: revision number not 1 implies that no selective self-test has ever been run |
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102 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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103 | 1 0 0 Not_testing |
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104 | 2 0 0 Not_testing |
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105 | 3 0 0 Not_testing |
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106 | 4 0 0 Not_testing |
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107 | 5 0 0 Not_testing |
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108 | Selective self-test flags (0x0): |
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109 | After scanning selected spans, do NOT read-scan remainder of disk. |
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110 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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111 | |
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