1 | smartctl 6.5 2016-05-07 r4318 [x86_64-linux-3.10.0-514.26.1.el7.x86_64] (local build)
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2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: Micron_5100_MTFDDAK1T9TBY
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6 | Serial Number: 163313A96BDE
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7 | LU WWN Device Id: 5 00a075 113a96bde
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8 | Firmware Version: D0MU031
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9 | User Capacity: 1,920,383,406,592 bytes [1.92 TB]
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10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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11 | Rotation Rate: Solid State Device
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12 | Form Factor: 2.5 inches
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13 | Device is: Not in smartctl database [for details use: -P showall]
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14 | ATA Version is: ACS-3 T13/2161-D revision 5
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15 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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16 | Local Time is: Thu Aug 3 15:32:44 2017 MDT
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17 | SMART support is: Available - device has SMART capability.
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18 | SMART support is: Enabled
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19 | AAM feature is: Unavailable
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20 | APM level is: 254 (maximum performance)
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21 | Rd look-ahead is: Enabled
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22 | Write cache is: Enabled
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23 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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24 | Wt Cache Reorder: Enabled
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25 |
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26 | === START OF READ SMART DATA SECTION ===
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27 | SMART overall-health self-assessment test result: PASSED
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28 |
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29 | General SMART Values:
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30 | Offline data collection status: (0x00) Offline data collection activity
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31 | was never started.
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32 | Auto Offline Data Collection: Disabled.
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33 | Self-test execution status: ( 0) The previous self-test routine completed
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34 | without error or no self-test has ever
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35 | been run.
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36 | Total time to complete Offline
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37 | data collection: ( 3827) seconds.
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38 | Offline data collection
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39 | capabilities: (0x7b) SMART execute Offline immediate.
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40 | Auto Offline data collection on/off support.
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41 | Suspend Offline collection upon new
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42 | command.
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43 | Offline surface scan supported.
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44 | Self-test supported.
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45 | Conveyance Self-test supported.
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46 | Selective Self-test supported.
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47 | SMART capabilities: (0x0003) Saves SMART data before entering
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48 | power-saving mode.
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49 | Supports SMART auto save timer.
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50 | Error logging capability: (0x01) Error logging supported.
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51 | General Purpose Logging supported.
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52 | Short self-test routine
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53 | recommended polling time: ( 2) minutes.
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54 | Extended self-test routine
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55 | recommended polling time: ( 14) minutes.
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56 | Conveyance self-test routine
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57 | recommended polling time: ( 3) minutes.
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58 | SCT capabilities: (0x0035) SCT Status supported.
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59 | SCT Feature Control supported.
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60 | SCT Data Table supported.
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61 |
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62 | SMART Attributes Data Structure revision number: 16
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63 | Vendor Specific SMART Attributes with Thresholds:
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64 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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65 | 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0
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66 | 5 Reallocated_Sector_Ct -O--CK 100 100 001 - 0
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67 | 9 Power_On_Hours -O--CK 100 100 001 - 100
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68 | 12 Power_Cycle_Count -O--CK 100 100 001 - 35
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69 | 170 Unknown_Attribute PO--CK 100 100 010 - 0
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70 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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71 | 172 Unknown_Attribute -O--CK 100 100 001 - 0
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72 | 173 Unknown_Attribute -O--CK 100 100 000 - 1
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73 | 174 Unknown_Attribute -O--CK 100 100 000 - 25
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74 | 183 Runtime_Bad_Block -O--CK 100 100 000 - 0
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75 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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76 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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77 | 188 Command_Timeout -O--CK 100 100 000 - 5
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78 | 194 Temperature_Celsius -O---K 069 067 000 - 31 (Min/Max 20/33)
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79 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
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80 | 196 Reallocated_Event_Count -O--CK 100 100 000 - 0
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81 | 197 Current_Pending_Sector -O--CK 100 100 000 - 0
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82 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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83 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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84 | 202 Unknown_SSD_Attribute ----CK 100 100 001 - 0
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85 | 206 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0
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86 | 246 Unknown_Attribute -O--CK 100 100 000 - 0
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87 | 247 Unknown_Attribute -O--CK 100 100 000 - 0
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88 | 248 Unknown_Attribute -O--CK 100 100 000 - 5672273
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89 | 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 000 000 000 - 13363
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90 | 210 Unknown_Attribute -O--CK 100 100 000 - 0
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91 | ||||||_ K auto-keep
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92 | |||||__ C event count
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93 | ||||___ R error rate
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94 | |||____ S speed/performance
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95 | ||_____ O updated online
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96 | |______ P prefailure warning
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97 |
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98 | General Purpose Log Directory Version 1
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99 | SMART Log Directory Version 1 [multi-sector log support]
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100 | Address Access R/W Size Description
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101 | 0x00 GPL,SL R/O 1 Log Directory
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102 | 0x01 SL R/O 1 Summary SMART error log
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103 | 0x02 SL R/O 51 Comprehensive SMART error log
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104 | 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log
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105 | 0x04 GPL,SL R/O 8 Device Statistics log
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106 | 0x06 SL R/O 1 SMART self-test log
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107 | 0x07 GPL R/O 1 Extended self-test log
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108 | 0x09 SL R/W 1 Selective self-test log
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109 | 0x10 GPL R/O 1 SATA NCQ Queued Error log
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110 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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111 | 0x13 GPL R/O 1 SATA NCQ Send and Receive log
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112 | 0x24 GPL R/O 8000 Current Device Internal Status Data log
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113 | 0x25 GPL R/O 8000 Saved Device Internal Status Data log
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114 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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115 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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116 | 0xa0 GPL VS 35328 Device vendor specific log
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117 | 0xa1 GPL,SL VS 4 Device vendor specific log
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118 | 0xa3 GPL VS 13824 Device vendor specific log
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119 | 0xa4 GPL VS 354 Device vendor specific log
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120 | 0xa4 SL VS 98 Device vendor specific log
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121 | 0xa5 GPL VS 8000 Device vendor specific log
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122 | 0xa5 SL VS 64 Device vendor specific log
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123 | 0xa6 GPL VS 8000 Device vendor specific log
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124 | 0xa6 SL VS 64 Device vendor specific log
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125 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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126 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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127 |
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128 | SMART Extended Comprehensive Error Log Version: 1 (16383 sectors)
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129 | Device Error Count: 1
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130 | CR = Command Register
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131 | FEATR = Features Register
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132 | COUNT = Count (was: Sector Count) Register
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133 | LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
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134 | LH = LBA High (was: Cylinder High) Register ] LBA
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135 | LM = LBA Mid (was: Cylinder Low) Register ] Register
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136 | LL = LBA Low (was: Sector Number) Register ]
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137 | DV = Device (was: Device/Head) Register
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138 | DC = Device Control Register
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139 | ER = Error register
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140 | ST = Status register
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141 | Powered_Up_Time is measured from power on, and printed as
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142 | DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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143 | SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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144 |
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145 | Error 1 [0] occurred at disk power-on lifetime: 2 hours (0 days + 2 hours)
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146 | When the command that caused the error occurred, the device was active or idle.
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147 |
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148 | After command completion occurred, registers were:
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149 | ER -- ST COUNT LBA_48 LH LM LL DV DC
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150 | -- -- -- == -- == == == -- -- -- -- --
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151 | 10 -- 51 00 08 00 00 6f c8 1a 00 40 08 Error: IDNF at LBA = 0x6fc81a00 = 1875384832
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152 |
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153 | Commands leading to the command that caused the error were:
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154 | CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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155 | -- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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156 | 60 00 00 00 08 00 00 6f c8 1a 00 40 08 02:28:00.000 READ FPDMA QUEUED
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157 | ec 00 00 00 01 00 00 00 00 00 00 00 08 02:28:00.000 IDENTIFY DEVICE
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158 | 78 00 01 00 00 00 00 00 8f e2 af e0 08 02:28:00.000 ACCESSIBLE MAX ADDRESS CONFIGURATION
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159 | 60 00 d1 00 08 00 00 00 00 10 00 40 08 02:28:00.000 READ FPDMA QUEUED
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160 | 60 00 d0 00 08 00 00 00 00 00 20 40 08 02:28:00.000 READ FPDMA QUEUED
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161 |
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162 | SMART Extended Self-test Log Version: 1 (1 sectors)
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163 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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164 | # 1 Short offline Completed without error 00% 100 -
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165 |
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166 | SMART Selective self-test log data structure revision number 1
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167 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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168 | 1 0 0 Not_testing
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169 | 2 0 0 Not_testing
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170 | 3 0 0 Completed [00% left] (130091008-130156543)
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171 | 4 0 0 Not_testing
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172 | 5 0 0 Not_testing
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173 | Selective self-test flags (0x0):
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174 | After scanning selected spans, do NOT read-scan remainder of disk.
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175 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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176 |
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177 | SCT Status Version: 3
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178 | SCT Version (vendor specific): 1 (0x0001)
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179 | SCT Support Level: 0
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180 | Device State: Active (0)
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181 | Current Temperature: 31 Celsius
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182 | Power Cycle Min/Max Temperature: 22/31 Celsius
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183 | Lifetime Min/Max Temperature: 20/33 Celsius
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184 | Under/Over Temperature Limit Count: 0/0
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185 |
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186 | SCT Temperature History Version: 2
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187 | Temperature Sampling Period: 1 minute
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188 | Temperature Logging Interval: 1 minute
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189 | Min/Max recommended Temperature: 0/70 Celsius
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190 | Min/Max Temperature Limit: -5/75 Celsius
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191 | Temperature History Size (Index): 478 (349)
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192 |
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193 | Index Estimated Time Temperature Celsius
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194 | 350 2017-08-03 07:35 32 *************
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195 | ... ..(120 skipped). .. *************
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196 | 471 2017-08-03 09:36 32 *************
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197 | 472 2017-08-03 09:37 ? -
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198 | 473 2017-08-03 09:38 27 ********
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199 | 474 2017-08-03 09:39 28 *********
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200 | 475 2017-08-03 09:40 29 **********
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201 | 476 2017-08-03 09:41 30 ***********
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202 | 477 2017-08-03 09:42 31 ************
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203 | 0 2017-08-03 09:43 32 *************
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204 | ... ..(348 skipped). .. *************
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205 | 349 2017-08-03 15:32 32 *************
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206 |
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207 | SCT Error Recovery Control command not supported
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208 |
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209 | Device Statistics (GP Log 0x04)
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210 | Page Offset Size Value Flags Description
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211 | 0x01 ===== = = === == General Statistics (rev 1) ==
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212 | 0x01 0x008 4 35 --- Lifetime Power-On Resets
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213 | 0x01 0x010 4 100 --- Power-on Hours
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214 | 0x01 0x018 6 0 --- Logical Sectors Written
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215 | 0x01 0x020 6 0 --- Number of Write Commands
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216 | 0x01 0x028 6 13998 --- Logical Sectors Read
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217 | 0x01 0x030 6 1374 --- Number of Read Commands
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218 | 0x01 0x038 6 362760000 --- Date and Time TimeStamp
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219 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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220 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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221 | 0x04 0x010 4 5 --- Resets Between Cmd Acceptance and Completion
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222 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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223 | 0x05 0x008 1 31 --- Current Temperature
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224 | 0x05 0x010 1 31 --- Average Short Term Temperature
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225 | 0x05 0x018 1 - --- Average Long Term Temperature
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226 | 0x05 0x020 1 33 --- Highest Temperature
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227 | 0x05 0x028 1 20 --- Lowest Temperature
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228 | 0x05 0x030 1 32 --- Highest Average Short Term Temperature
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229 | 0x05 0x038 1 31 --- Lowest Average Short Term Temperature
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230 | 0x05 0x040 1 - --- Highest Average Long Term Temperature
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231 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature
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232 | 0x05 0x050 4 0 --- Time in Over-Temperature
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233 | 0x05 0x058 1 70 --- Specified Maximum Operating Temperature
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234 | 0x05 0x060 4 0 --- Time in Under-Temperature
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235 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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236 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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237 | 0x06 0x008 4 18 --- Number of Hardware Resets
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238 | 0x06 0x010 4 0 --- Number of ASR Events
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239 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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240 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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241 | 0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
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242 | |||_ C monitored condition met
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243 | ||__ D supports DSN
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244 | |___ N normalized value
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245 |
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246 | SATA Phy Event Counters (GP Log 0x11)
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247 | ID Size Value Description
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248 | 0x0001 4 0 Command failed due to ICRC error
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249 | 0x0003 4 0 R_ERR response for device-to-host data FIS
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250 | 0x0004 4 0 R_ERR response for host-to-device data FIS
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251 | 0x0006 4 0 R_ERR response for device-to-host non-data FIS
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252 | 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET
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253 | 0x000b 4 0 CRC errors within host-to-device FIS
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254 | 0x000d 4 0 Non-CRC errors within host-to-device FIS
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255 |
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