Ticket #85: withoptions

File withoptions, 4.4 KB (added by tobthea, 14 years ago)

smartctl -a -v 9,halfminutes -F samsung2 output

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1smartctl 5.40 2010-03-16 r3077 [x86_64-unknown-linux-gnu] (local build)
2Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net
3
4=== START OF INFORMATION SECTION ===
5Device Model: SAMSUNG SV1604N
6Serial Number: xxxxxxxxxxxxxx
7Firmware Version: TR100-23
8User Capacity: 160.041.885.696 bytes
9Device is: Not in smartctl database [for details use: -P showall]
10ATA Version is: 7
11ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
12Local Time is: Tue Jul 13 10:51:37 2010 CEST
13SMART support is: Available - device has SMART capability.
14SMART support is: Enabled
15
16=== START OF READ SMART DATA SECTION ===
17SMART overall-health self-assessment test result: PASSED
18
19General SMART Values:
20Offline data collection status: (0x84) Offline data collection activity
21 was suspended by an interrupting command from host.
22 Auto Offline Data Collection: Enabled.
23Self-test execution status: ( 0) The previous self-test routine completed
24 without error or no self-test has ever
25 been run.
26Total time to complete Offline
27data collection: (4320) seconds.
28Offline data collection
29capabilities: (0x1b) SMART execute Offline immediate.
30 Auto Offline data collection on/off support.
31 Suspend Offline collection upon new
32 command.
33 Offline surface scan supported.
34 Self-test supported.
35 No Conveyance Self-test supported.
36 No Selective Self-test supported.
37SMART capabilities: (0x0003) Saves SMART data before entering
38 power-saving mode.
39 Supports SMART auto save timer.
40Error logging capability: (0x01) Error logging supported.
41 No General Purpose Logging support.
42Short self-test routine
43recommended polling time: ( 1) minutes.
44Extended self-test routine
45recommended polling time: ( 72) minutes.
46
47SMART Attributes Data Structure revision number: 16
48Vendor Specific SMART Attributes with Thresholds:
49ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
50 1 Raw_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
51 3 Spin_Up_Time 0x0007 079 059 000 Pre-fail Always - 4096
52 4 Start_Stop_Count 0x0032 095 095 000 Old_age Always - 6009
53 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
54 7 Seek_Error_Rate 0x000b 253 253 051 Pre-fail Always - 0
55 8 Seek_Time_Performance 0x0024 087 087 000 Old_age Offline - 11219
56 9 Power_On_Half_Minutes 0x0032 099 099 000 Old_age Always - 6252h+40m
57 10 Spin_Retry_Count 0x0013 253 253 049 Pre-fail Always - 0
58 12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 4263
59194 Temperature_Celsius 0x0022 109 085 000 Old_age Always - 43
60195 Hardware_ECC_Recovered 0x000a 100 100 000 Old_age Always - 156955019
61196 Reallocated_Event_Count 0x0012 253 253 000 Old_age Always - 0
62197 Current_Pending_Sector 0x0033 253 253 010 Pre-fail Always - 0
63198 Offline_Uncorrectable 0x0031 253 253 010 Pre-fail Offline - 0
64199 UDMA_CRC_Error_Count 0x000a 100 100 000 Old_age Always - 0
65200 Multi_Zone_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
66201 Soft_Read_Error_Rate 0x000b 100 100 051 Pre-fail Always - 0
67
68SMART Error Log Version: 1
69ATA Error Count: 9624 (device log contains only the most recent five errors)
70 CR = Command Register [HEX]
71 FR = Features Register [HEX]
72 SC = Sector Count Register [HEX]
73 SN = Sector Number Register [HEX]
74 CL = Cylinder Low Register [HEX]
75 CH = Cylinder High Register [HEX]
76 DH = Device/Head Register [HEX]
77 DC = Device Command Register [HEX]
78 ER = Error register [HEX]
79 ST = Status register [HEX]
80Powered_Up_Time is measured from power on, and printed as
81DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
82SS=sec, and sss=millisec. It "wraps" after 49.710 days.
83
84... serveral errors here ...
85
86SMART Self-test log structure revision number 1
87Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
88# 1 Short offline Completed without error 00% 5847 -
89
90Device does not support Selective Self Tests/Logging