1 | smartctl 6.6 (build date Mar 28 2017) [x86_64-linux-3.13.0-39-generic] (local build)
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2 | Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: INTEL SSDSC2BA200G4R
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6 | Add. Product Id: DELL(tm)
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7 | Firmware Version: G201DL2B
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8 | User Capacity: 200,049,647,616 bytes [200 GB]
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9 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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10 | Rotation Rate: Solid State Device
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11 | Form Factor: 2.5 inches
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12 | Device is: Not in smartctl database [for details use: -P showall]
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13 | ATA Version is: ACS-3 T13/2161-D revision 5
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14 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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15 | Local Time is: Wed Mar 29 08:22:42 2017 CEST
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16 | SMART support is: Available - device has SMART capability.
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17 | SMART support is: Enabled
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18 | AAM feature is: Unavailable
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19 | APM feature is: Unavailable
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20 | Rd look-ahead is: Enabled
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21 | Write cache is: Enabled
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22 | DSN feature is: Unavailable
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23 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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24 | Write SCT (Get) Feature Control Command failed: ATA return descriptor not supported by controller firmware
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25 | Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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26 |
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27 | === START OF READ SMART DATA SECTION ===
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28 | SMART Status not supported: ATA return descriptor not supported by controller firmware
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29 | SMART overall-health self-assessment test result: PASSED
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30 | Warning: This result is based on an Attribute check.
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31 |
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32 | General SMART Values:
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33 | Offline data collection status: (0x02) Offline data collection activity
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34 | was completed without error.
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35 | Auto Offline Data Collection: Disabled.
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36 | Self-test execution status: ( 0) The previous self-test routine completed
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37 | without error or no self-test has ever
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38 | been run.
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39 | Total time to complete Offline
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40 | data collection: ( 2) seconds.
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41 | Offline data collection
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42 | capabilities: (0x79) SMART execute Offline immediate.
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43 | No Auto Offline data collection support.
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44 | Suspend Offline collection upon new
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45 | command.
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46 | Offline surface scan supported.
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47 | Self-test supported.
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48 | Conveyance Self-test supported.
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49 | Selective Self-test supported.
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50 | SMART capabilities: (0x0003) Saves SMART data before entering
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51 | power-saving mode.
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52 | Supports SMART auto save timer.
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53 | Error logging capability: (0x01) Error logging supported.
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54 | General Purpose Logging supported.
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55 | Short self-test routine
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56 | recommended polling time: ( 1) minutes.
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57 | Extended self-test routine
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58 | recommended polling time: ( 60) minutes.
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59 | Conveyance self-test routine
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60 | recommended polling time: ( 60) minutes.
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61 | SCT capabilities: (0x003d) SCT Status supported.
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62 | SCT Error Recovery Control supported.
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63 | SCT Feature Control supported.
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64 | SCT Data Table supported.
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65 |
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66 | SMART Attributes Data Structure revision number: 273
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67 | Vendor Specific SMART Attributes with Thresholds:
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68 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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69 | 1 Raw_Read_Error_Rate -OSR-- 130 130 039 - 37013334
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70 | 5 Reallocated_Sector_Ct PO--CK 100 100 001 - 0
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71 | 9 Power_On_Hours -O--CK 100 100 000 - 6164
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72 | 12 Power_Cycle_Count -O--CK 100 100 000 - 5300
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73 | 13 Read_Soft_Error_Rate -OSRC- 130 100 000 - 8626947926
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74 | 179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 0
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75 | 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 17180
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76 | 181 Program_Fail_Cnt_Total -O-RCK 100 100 000 - 0
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77 | 182 Erase_Fail_Count_Total -O-RCK 100 100 000 - 0
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78 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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79 | 194 Temperature_Celsius -O---K 100 100 000 - 25
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80 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0
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81 | 198 Offline_Uncorrectable ----C- 100 100 000 - 0
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82 | 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
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83 | 201 Unknown_SSD_Attribute PO--CK 100 100 010 - 193273795554
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84 | 202 Unknown_SSD_Attribute POS--K 100 100 000 - 0
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85 | 226 Unknown_SSD_Attribute -O--CK 100 100 000 - 65535
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86 | 227 Unknown_SSD_Attribute -O--CK 100 100 000 - 65535
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87 | 228 Power-off_Retract_Count -O--CK 100 100 000 - 65535
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88 | 233 Media_Wearout_Indicator -O--CK 100 100 000 - 1708023
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89 | 245 Unknown_Attribute -O--CK 100 100 000 - 0
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90 | ||||||_ K auto-keep
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91 | |||||__ C event count
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92 | ||||___ R error rate
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93 | |||____ S speed/performance
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94 | ||_____ O updated online
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95 | |______ P prefailure warning
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96 |
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97 | General Purpose Log Directory Version 1
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98 | SMART Log Directory Version 1 [multi-sector log support]
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99 | Address Access R/W Size Description
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100 | 0x00 GPL,SL R/O 1 Log Directory
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101 | 0x01 GPL,SL R/O 1 Summary SMART error log
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102 | 0x02 GPL,SL R/O 8 Comprehensive SMART error log
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103 | 0x03 GPL,SL R/O 20 Ext. Comprehensive SMART error log
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104 | 0x04 GPL,SL R/O 8 Device Statistics log
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105 | 0x06 GPL,SL R/O 1 SMART self-test log
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106 | 0x07 GPL,SL R/O 2 Extended self-test log
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107 | 0x08 GPL,SL R/O 2 Power Conditions log
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108 | 0x09 GPL,SL R/W 1 Selective self-test log
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109 | 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log
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110 | 0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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111 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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112 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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113 | 0xb0 GPL,SL VS 1 Device vendor specific log
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114 | 0xb1 GPL,SL VS 33 Device vendor specific log
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115 | 0xb8 GPL,SL VS 1 Device vendor specific log
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116 | 0xb9 GPL VS 1544 Device vendor specific log
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117 | 0xb9 SL VS 8 Device vendor specific log
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118 | 0xba GPL VS 1280 Device vendor specific log
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119 | 0xdf GPL,SL VS 1 Device vendor specific log
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120 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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121 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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122 |
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123 | SMART Extended Comprehensive Error Log Version: 1 (20 sectors)
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124 | No Errors Logged
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125 |
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126 | SMART Extended Self-test Log Version: 1 (2 sectors)
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127 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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128 | # 1 Short offline Completed without error 00% 6164 -
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129 | # 2 Short offline Completed without error 00% 6139 -
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130 | # 3 Short offline Completed without error 00% 6123 -
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131 |
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132 | SMART Selective self-test log data structure revision number 1
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133 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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134 | 1 58581440543067649 7205815500444532762 Not_testing
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135 | 2 360287970189639780 7028244230665 Not_testing
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136 | 3 7205814430997676032 360287970189644388 Not_testing
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137 | 4 58581182140390925 7205816247768842266 Not_testing
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138 | 5 360287970189639780 18890040939655860 Not_testing
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139 | Selective self-test flags (0x0):
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140 | After scanning selected spans, do NOT read-scan remainder of disk.
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141 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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142 |
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143 | SCT Status Version: 3
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144 | SCT Version (vendor specific): 1 (0x0001)
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145 | SCT Support Level: 0
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146 | Device State: Active (0)
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147 | Current Temperature: 25 Celsius
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148 | Power Cycle Min/Max Temperature: 19/31 Celsius
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149 | Lifetime Min/Max Temperature: 19/31 Celsius
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150 | Under/Over Temperature Limit Count: 0/0
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151 | Vendor specific:
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152 | 00 00 64 00 00 00 00 00 00 00 00 00 00 00 00 00
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153 | 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00
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154 |
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155 | Write SCT Data Table failed: SMART WRITE LOG SECTOR may cause problems, try with -T permissive to force
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156 | Read SCT Temperature History failed
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157 |
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158 | Write SCT (Get) Error Recovery Control Command failed: ATA return descriptor not supported by controller firmware
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159 | SCT (Get) Error Recovery Control command failed
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160 |
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161 | Device Statistics (GP Log 0x04)
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162 | Page Offset Size Value Flags Description
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163 | 0x01 ===== = = === == General Statistics (rev 2) ==
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164 | 0x01 0x008 4 5300 --- Lifetime Power-On Resets
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165 | 0x01 0x018 6 111937049168 --- Logical Sectors Written
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166 | 0x01 0x020 6 1005510373 --- Number of Write Commands
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167 | 0x01 0x028 6 485158753 --- Logical Sectors Read
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168 | 0x01 0x030 6 161204 --- Number of Read Commands
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169 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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170 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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171 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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172 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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173 | 0x05 0x008 1 25 --- Current Temperature
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174 | 0x05 0x010 1 24 --- Average Short Term Temperature
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175 | 0x05 0x018 1 23 --- Average Long Term Temperature
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176 | 0x05 0x020 1 31 --- Highest Temperature
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177 | 0x05 0x028 1 20 --- Lowest Temperature
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178 | 0x05 0x030 1 25 --- Highest Average Short Term Temperature
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179 | 0x05 0x038 1 20 --- Lowest Average Short Term Temperature
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180 | 0x05 0x040 1 23 --- Highest Average Long Term Temperature
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181 | 0x05 0x048 1 20 --- Lowest Average Long Term Temperature
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182 | 0x05 0x050 4 0 --- Time in Over-Temperature
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183 | 0x05 0x058 1 70 --- Specified Maximum Operating Temperature
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184 | 0x05 0x060 4 0 --- Time in Under-Temperature
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185 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature
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186 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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187 | 0x06 0x008 4 0 --- Number of Hardware Resets
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188 | 0x06 0x010 4 0 --- Number of ASR Events
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189 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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190 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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191 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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192 | |||_ C monitored condition met
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193 | ||__ D supports DSN
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194 | |___ N normalized value
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195 |
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196 | SATA Phy Event Counters (GP Log 0x11)
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197 | ID Size Value Description
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198 | 0x0001 4 0 Command failed due to ICRC error
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199 | 0x0003 4 0 R_ERR response for device-to-host data FIS
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200 | 0x0004 4 0 R_ERR response for host-to-device data FIS
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201 | 0x0006 4 0 R_ERR response for device-to-host non-data FIS
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202 | 0x000a 4 1 Device-to-host register FISes sent due to a COMRESET
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203 | 0x000b 4 0 CRC errors within host-to-device FIS
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204 | 0x000d 4 0 Non-CRC errors within host-to-device FIS
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205 |
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