| 1 | smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.8.0-0.bpo.2-amd64] (local build)
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: TS480GSSD220S
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| 6 | Serial Number: D067982089
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| 7 | Firmware Version: P0520AA
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| 8 | User Capacity: 480 103 981 056 bytes [480 GB]
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| 9 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 10 | Rotation Rate: Solid State Device
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| 11 | Device is: Not in smartctl database [for details use: -P showall]
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| 12 | ATA Version is: ACS-2 (minor revision not indicated)
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| 13 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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| 14 | Local Time is: Tue Mar 21 18:46:43 2017 EET
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 | AAM feature is: Unavailable
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| 18 | APM feature is: Unavailable
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| 19 | Rd look-ahead is: Enabled
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| 20 | Write cache is: Enabled
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| 21 | ATA Security is: Disabled, frozen [SEC2]
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| 22 | Read SCT Status failed: scsi error badly formed scsi parameters
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| 23 | Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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| 24 |
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| 25 | === START OF READ SMART DATA SECTION ===
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| 26 | SMART overall-health self-assessment test result: PASSED
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| 27 |
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| 28 | General SMART Values:
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| 29 | Offline data collection status: (0x02) Offline data collection activity
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| 30 | was completed without error.
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| 31 | Auto Offline Data Collection: Disabled.
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| 32 | Self-test execution status: ( 0) The previous self-test routine completed
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| 33 | without error or no self-test has ever
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| 34 | been run.
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| 35 | Total time to complete Offline
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| 36 | data collection: ( 171) seconds.
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| 37 | Offline data collection
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| 38 | capabilities: (0x71) SMART execute Offline immediate.
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| 39 | No Auto Offline data collection support.
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| 40 | Suspend Offline collection upon new
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| 41 | command.
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| 42 | No Offline surface scan supported.
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| 43 | Self-test supported.
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| 44 | Conveyance Self-test supported.
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| 45 | Selective Self-test supported.
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| 46 | SMART capabilities: (0x0002) Does not save SMART data before
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| 47 | entering power-saving mode.
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| 48 | Supports SMART auto save timer.
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| 49 | Error logging capability: (0x01) Error logging supported.
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| 50 | General Purpose Logging supported.
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| 51 | Short self-test routine
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| 52 | recommended polling time: ( 1) minutes.
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| 53 | Extended self-test routine
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| 54 | recommended polling time: ( 2) minutes.
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| 55 | Conveyance self-test routine
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| 56 | recommended polling time: ( 1) minutes.
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| 57 | SCT capabilities: (0x0035) SCT Status supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 1
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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| 65 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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| 66 | 9 Power_On_Hours ------ 100 100 000 - 1
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| 67 | 12 Power_Cycle_Count ------ 100 100 000 - 17
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| 68 | 160 Unknown_Attribute ------ 100 100 000 - 0
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| 69 | 161 Unknown_Attribute ------ 100 100 000 - 45
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| 70 | 163 Unknown_Attribute ------ 100 100 000 - 543
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| 71 | 164 Unknown_Attribute ------ 100 100 000 - 587
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| 72 | 165 Unknown_Attribute ------ 100 100 000 - 4
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| 73 | 166 Unknown_Attribute ------ 100 100 000 - 0
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| 74 | 167 Unknown_Attribute ------ 100 100 000 - 0
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| 75 | 168 Unknown_Attribute ------ 100 100 000 - 1000
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| 76 | 169 Unknown_Attribute ------ 100 100 001 - 100
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| 77 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0
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| 78 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
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| 79 | 177 Wear_Leveling_Count ------ 100 100 050 - 0
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| 80 | 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0
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| 81 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
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| 82 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0
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| 83 | 192 Power-Off_Retract_Count ------ 100 100 000 - 5
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| 84 | 194 Temperature_Celsius ------ 100 100 070 - 31 (38 38 39 40 0)
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| 85 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 0
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| 86 | 196 Reallocated_Event_Count ------ 100 100 016 - 0
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| 87 | 198 Offline_Uncorrectable ------ 100 100 000 - 0
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| 88 | 199 UDMA_CRC_Error_Count ------ 100 100 000 - 0
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| 89 | 232 Available_Reservd_Space ------ 100 100 000 - 100
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| 90 | 241 Total_LBAs_Written ------ 100 100 000 - 6128
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| 91 | 242 Total_LBAs_Read ------ 100 100 000 - 876
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| 92 | 245 Unknown_Attribute ------ 100 100 000 - 6933
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| 93 | ||||||_ K auto-keep
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| 94 | |||||__ C event count
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| 95 | ||||___ R error rate
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| 96 | |||____ S speed/performance
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| 97 | ||_____ O updated online
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| 98 | |______ P prefailure warning
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| 99 |
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| 100 | General Purpose Log Directory Version 1
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| 101 | SMART Log Directory Version 1 [multi-sector log support]
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| 102 | Address Access R/W Size Description
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| 103 | 0x00 GPL,SL R/O 1 Log Directory
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| 104 | 0x01 SL R/O 1 Summary SMART error log
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| 105 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 106 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 107 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 108 | 0x06 SL R/O 1 SMART self-test log
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| 109 | 0x07 GPL R/O 1 Extended self-test log
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| 110 | 0x09 SL R/W 1 Selective self-test log
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| 111 | 0x10 GPL R/O 1 SATA NCQ Queued Error log
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| 112 | 0x24 GPL R/O 88 Current Device Internal Status Data log
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| 113 | 0x25 GPL R/O 32 Saved Device Internal Status Data log
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| 114 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 115 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 116 |
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| 117 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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| 118 | No Errors Logged
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| 119 |
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| 120 | SMART Extended Self-test Log Version: 0 (1 sectors)
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| 121 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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| 122 |
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| 123 | SMART Selective self-test log data structure revision number 1
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| 124 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 125 | 1 0 0 Not_testing
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| 126 | 2 0 0 Not_testing
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| 127 | 3 0 0 Not_testing
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| 128 | 4 0 0 Not_testing
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| 129 | 5 0 0 Not_testing
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| 130 | 7 0 65535 Read_scanning was completed without error
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| 131 | Selective self-test flags (0x0):
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| 132 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 133 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 134 |
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| 135 | Read SCT Status failed: scsi error badly formed scsi parameters
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| 136 |
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| 137 | SCT Error Recovery Control command not supported
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| 138 |
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| 139 | Device Statistics (GP Log 0x04)
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| 140 | Page Offset Size Value Flags Description
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| 141 | 0x01 ===== = = === == General Statistics (rev 2) ==
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| 142 | 0x01 0x008 4 17 --- Lifetime Power-On Resets
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| 143 | 0x01 0x010 4 1 --- Power-on Hours
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| 144 | 0x01 0x018 6 401634458 --- Logical Sectors Written
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| 145 | 0x01 0x020 6 709275 --- Number of Write Commands
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| 146 | 0x01 0x028 6 57473193 --- Logical Sectors Read
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| 147 | 0x01 0x030 6 357539 --- Number of Read Commands
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| 148 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 149 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 150 | 0x04 0x010 4 5 --- Resets Between Cmd Acceptance and Completion
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| 151 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 152 | 0x06 0x008 4 17 --- Number of Hardware Resets
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| 153 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 154 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 155 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 156 | |||_ C monitored condition met
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| 157 | ||__ D supports DSN
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| 158 | |___ N normalized value
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| 159 |
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| 160 | SATA Phy Event Counters (GP Log 0x11) not supported
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| 161 |
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