1 | smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.0-39-generic] (local build) |
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2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org |
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3 | |
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4 | === START OF INFORMATION SECTION === |
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5 | Device Model: KINGSTON SEDC1000HA480G |
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6 | Serial Number: 50026B725C033B16 |
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7 | LU WWN Device Id: 0 550380 440010057 |
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8 | Firmware Version: 0C4005T4 |
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9 | User Capacity: 480,103,981,056 bytes [480 GB] |
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10 | Sector Sizes: 512 bytes logical, 4096 bytes physical |
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11 | Rotation Rate: Solid State Device |
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12 | Form Factor: M.2 |
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13 | Device is: Not in smartctl database [for details use: -P showall] |
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14 | ATA Version is: ATA8-ACS T13/1699-D revision 6 |
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15 | Transport Type: PCIe (0x000) |
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16 | Local Time is: Wed Mar 1 11:10:49 2017 PST |
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17 | SMART support is: Available - device has SMART capability. |
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18 | SMART support is: Enabled |
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19 | AAM feature is: Unavailable |
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20 | APM feature is: Unavailable |
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21 | Rd look-ahead is: Enabled |
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22 | Write cache is: Enabled |
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23 | ATA Security is: Disabled, NOT FROZEN [SEC1] |
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24 | Write SCT (Get) Feature Control Command failed: scsi error badly formed scsi parameters |
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25 | Wt Cache Reorder: Unknown (SCT Feature Control command failed) |
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26 | |
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27 | === START OF READ SMART DATA SECTION === |
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28 | SMART overall-health self-assessment test result: PASSED |
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29 | |
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30 | General SMART Values: |
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31 | Offline data collection status: (0x00) Offline data collection activity |
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32 | was never started. |
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33 | Auto Offline Data Collection: Disabled. |
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34 | Self-test execution status: ( 0) The previous self-test routine completed |
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35 | without error or no self-test has ever |
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36 | been run. |
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37 | Total time to complete Offline |
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38 | data collection: ( 0) seconds. |
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39 | Offline data collection |
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40 | capabilities: (0x50) No SMART execute Offline immediate. |
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41 | No Auto Offline data collection support. |
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42 | Suspend Offline collection upon new |
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43 | command. |
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44 | No Offline surface scan supported. |
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45 | Self-test supported. |
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46 | No Conveyance Self-test supported. |
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47 | Selective Self-test supported. |
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48 | SMART capabilities: (0x0003) Saves SMART data before entering |
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49 | power-saving mode. |
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50 | Supports SMART auto save timer. |
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51 | Error logging capability: (0x00) Error logging supported. |
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52 | General Purpose Logging supported. |
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53 | Short self-test routine |
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54 | recommended polling time: ( 1) minutes. |
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55 | Extended self-test routine |
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56 | recommended polling time: ( 5) minutes. |
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57 | SCT capabilities: (0x0039) SCT Status supported. |
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58 | SCT Error Recovery Control supported. |
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59 | SCT Feature Control supported. |
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60 | SCT Data Table supported. |
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61 | |
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62 | SMART Attributes Data Structure revision number: 40 |
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63 | Vendor Specific SMART Attributes with Thresholds: |
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64 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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65 | 1 Raw_Read_Error_Rate POSR-K 100 100 005 - 61 |
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66 | 5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0 |
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67 | 9 Power_On_Hours -O--CK 000 100 000 - 21 |
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68 | 12 Power_Cycle_Count -O--CK 100 100 000 - 2 |
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69 | 100 Unknown_Attribute -O--CK 100 100 000 - 3608448 |
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70 | 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 |
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71 | 170 Unknown_Attribute -O--CK 000 100 000 - 0 |
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72 | 171 Unknown_Attribute -O--CK 100 100 010 - 0 |
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73 | 172 Unknown_Attribute -O--CK 100 100 010 - 0 |
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74 | 174 Unknown_Attribute -O--CK 100 100 000 - 0 |
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75 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 |
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76 | 176 Erase_Fail_Count_Chip -O--CK 000 000 000 - 0 |
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77 | 177 Wear_Leveling_Count -O--CK 100 100 000 - 27 |
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78 | 178 Used_Rsvd_Blk_Cnt_Chip PO---- 100 100 000 - 42 |
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79 | 180 Unused_Rsvd_Blk_Cnt_Tot ------ 100 100 000 - 17998 |
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80 | 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 000 100 000 - 0 |
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81 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0 |
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82 | 194 Temperature_Celsius -O---K 052 100 000 - 52 (Min/Max 24/55) |
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83 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 61 |
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84 | 196 Reallocated_Event_Count PO--CK 100 100 000 - 0 |
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85 | 197 Current_Pending_Sector ----CK 100 100 000 - 0 |
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86 | 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 |
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87 | 199 UDMA_CRC_Error_Count ----CK 100 100 000 - 0 |
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88 | 201 Unknown_SSD_Attribute PO--CK 100 100 000 - 21 |
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89 | 204 Soft_ECC_Correction ------ 100 100 000 - 61 |
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90 | 231 Temperature_Celsius PO--CK 100 100 000 - 0 |
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91 | 234 Unknown_Attribute PO--CK 100 100 000 - 12445 |
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92 | 241 Total_LBAs_Written -O-RCK 100 100 000 - 9423 |
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93 | 242 Total_LBAs_Read -O-RCK 100 100 000 - 7924 |
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94 | 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 61 |
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95 | ||||||_ K auto-keep |
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96 | |||||__ C event count |
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97 | ||||___ R error rate |
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98 | |||____ S speed/performance |
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99 | ||_____ O updated online |
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100 | |______ P prefailure warning |
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101 | |
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102 | General Purpose Log Directory Version 1 |
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103 | SMART Log Directory Version 1 [multi-sector log support] |
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104 | Address Access R/W Size Description |
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105 | 0x00 GPL,SL R/O 1 Log Directory |
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106 | 0x01 SL R/O 1 Summary SMART error log |
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107 | 0x02 SL R/O 1 Comprehensive SMART error log |
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108 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log |
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109 | 0x04 GPL,SL R/O 8 Device Statistics log |
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110 | 0x06 SL R/O 1 SMART self-test log |
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111 | 0x07 GPL,SL R/O 1 Extended self-test log |
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112 | 0x09 SL R/W 1 Selective self-test log |
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113 | 0x10 GPL R/O 1 SATA NCQ Queued Error log |
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114 | 0x30 GPL R/O 9 IDENTIFY DEVICE data log |
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115 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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116 | 0xa1 SL VS 9 Device vendor specific log |
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117 | 0xaa SL VS 25 Device vendor specific log |
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118 | 0xab SL VS 1 Device vendor specific log |
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119 | 0xe0 GPL,SL R/W 1 SCT Command/Status |
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120 | 0xe1 GPL,SL R/W 1 SCT Data Transfer |
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121 | |
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122 | SMART Extended Comprehensive Error Log Version: 0 (1 sectors) |
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123 | No Errors Logged |
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124 | |
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125 | SMART Extended Self-test Log Version: 0 (1 sectors) |
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126 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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127 | # 1 Reserved (0x10) Completed without error 00% 0 - |
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128 | |
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129 | SMART Selective self-test log data structure revision number 0 |
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130 | Note: revision number not 1 implies that no selective self-test has ever been run |
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131 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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132 | 1 0 0 Not_testing |
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133 | 2 0 0 Not_testing |
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134 | 3 0 0 Not_testing |
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135 | 4 0 0 Not_testing |
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136 | 5 0 0 Not_testing |
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137 | Selective self-test flags (0x0): |
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138 | After scanning selected spans, do NOT read-scan remainder of disk. |
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139 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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140 | |
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141 | SCT Status Version: 3 |
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142 | SCT Version (vendor specific): 1 (0x0001) |
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143 | SCT Support Level: 0 |
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144 | Device State: Active (0) |
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145 | Current Temperature: 59 Celsius |
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146 | Power Cycle Min/Max Temperature: 24/55 Celsius |
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147 | Lifetime Min/Max Temperature: 24/55 Celsius |
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148 | Under/Over Temperature Limit Count: 0/0 |
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149 | SMART Status: 0xc24f (PASSED) |
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150 | |
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151 | Write SCT Data Table failed: scsi error badly formed scsi parameters |
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152 | Read SCT Temperature History failed |
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153 | |
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154 | Write SCT (Get) Error Recovery Control Command failed: scsi error badly formed scsi parameters |
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155 | SCT (Get) Error Recovery Control command failed |
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156 | |
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157 | Device Statistics (GP Log 0x04) |
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158 | Page Offset Size Value Flags Description |
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159 | 0x01 ===== = = === == General Statistics (rev 1) == |
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160 | 0x01 0x008 4 2 --- Lifetime Power-On Resets |
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161 | 0x01 0x010 4 21 --- Power-on Hours |
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162 | 0x01 0x018 6 19763460175 --- Logical Sectors Written |
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163 | 0x01 0x020 6 359913494 --- Number of Write Commands |
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164 | 0x01 0x028 6 16618894224 --- Logical Sectors Read |
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165 | 0x01 0x030 6 446825933 --- Number of Read Commands |
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166 | 0x01 0x038 6 3600000 --- Date and Time TimeStamp |
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167 | 0x02 ===== = = === == Free-Fall Statistics (empty) == |
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168 | 0x03 ===== = = === == Rotating Media Statistics (empty) == |
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169 | 0x04 ===== = = === == General Errors Statistics (rev 1) == |
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170 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors |
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171 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion |
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172 | 0x05 ===== = = === == Temperature Statistics (rev 1) == |
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173 | 0x05 0x008 1 52 --- Current Temperature |
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174 | 0x05 0x010 1 - --- Average Short Term Temperature |
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175 | 0x05 0x018 1 0 --- Average Long Term Temperature |
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176 | 0x05 0x020 1 55 --- Highest Temperature |
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177 | 0x05 0x028 1 24 --- Lowest Temperature |
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178 | 0x05 0x030 1 - --- Highest Average Short Term Temperature |
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179 | 0x05 0x038 1 - --- Lowest Average Short Term Temperature |
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180 | 0x05 0x040 1 0 --- Highest Average Long Term Temperature |
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181 | 0x05 0x048 1 0 --- Lowest Average Long Term Temperature |
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182 | 0x05 0x050 4 0 --- Time in Over-Temperature |
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183 | 0x05 0x058 1 70 --- Specified Maximum Operating Temperature |
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184 | 0x05 0x060 4 0 --- Time in Under-Temperature |
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185 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature |
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186 | 0x06 ===== = = === == Transport Statistics (rev 1) == |
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187 | 0x06 0x008 4 6 --- Number of Hardware Resets |
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188 | 0x06 0x018 4 0 --- Number of Interface CRC Errors |
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189 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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190 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |
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191 | |||_ C monitored condition met |
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192 | ||__ D supports DSN |
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193 | |___ N normalized value |
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194 | |
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195 | SATA Phy Event Counters (GP Log 0x11) not supported |
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196 | |
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