| 1 | smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.8.0-39-generic] (local build) |
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org |
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| 3 | |
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| 4 | === START OF INFORMATION SECTION === |
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| 5 | Device Model: KINGSTON SEDC1000HA480G |
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| 6 | Serial Number: 50026B725C033B16 |
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| 7 | LU WWN Device Id: 0 550380 440010057 |
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| 8 | Firmware Version: 0C4005T4 |
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| 9 | User Capacity: 480,103,981,056 bytes [480 GB] |
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| 10 | Sector Sizes: 512 bytes logical, 4096 bytes physical |
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| 11 | Rotation Rate: Solid State Device |
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| 12 | Form Factor: M.2 |
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| 13 | Device is: Not in smartctl database [for details use: -P showall] |
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| 14 | ATA Version is: ATA8-ACS T13/1699-D revision 6 |
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| 15 | Transport Type: PCIe (0x000) |
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| 16 | Local Time is: Wed Mar 1 11:10:49 2017 PST |
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| 17 | SMART support is: Available - device has SMART capability. |
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| 18 | SMART support is: Enabled |
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| 19 | AAM feature is: Unavailable |
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| 20 | APM feature is: Unavailable |
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| 21 | Rd look-ahead is: Enabled |
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| 22 | Write cache is: Enabled |
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| 23 | ATA Security is: Disabled, NOT FROZEN [SEC1] |
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| 24 | Write SCT (Get) Feature Control Command failed: scsi error badly formed scsi parameters |
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| 25 | Wt Cache Reorder: Unknown (SCT Feature Control command failed) |
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| 26 | |
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| 27 | === START OF READ SMART DATA SECTION === |
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| 28 | SMART overall-health self-assessment test result: PASSED |
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| 29 | |
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| 30 | General SMART Values: |
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| 31 | Offline data collection status: (0x00) Offline data collection activity |
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| 32 | was never started. |
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| 33 | Auto Offline Data Collection: Disabled. |
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| 34 | Self-test execution status: ( 0) The previous self-test routine completed |
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| 35 | without error or no self-test has ever |
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| 36 | been run. |
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| 37 | Total time to complete Offline |
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| 38 | data collection: ( 0) seconds. |
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| 39 | Offline data collection |
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| 40 | capabilities: (0x50) No SMART execute Offline immediate. |
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| 41 | No Auto Offline data collection support. |
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| 42 | Suspend Offline collection upon new |
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| 43 | command. |
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| 44 | No Offline surface scan supported. |
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| 45 | Self-test supported. |
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| 46 | No Conveyance Self-test supported. |
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| 47 | Selective Self-test supported. |
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| 48 | SMART capabilities: (0x0003) Saves SMART data before entering |
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| 49 | power-saving mode. |
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| 50 | Supports SMART auto save timer. |
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| 51 | Error logging capability: (0x00) Error logging supported. |
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| 52 | General Purpose Logging supported. |
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| 53 | Short self-test routine |
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| 54 | recommended polling time: ( 1) minutes. |
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| 55 | Extended self-test routine |
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| 56 | recommended polling time: ( 5) minutes. |
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| 57 | SCT capabilities: (0x0039) SCT Status supported. |
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| 58 | SCT Error Recovery Control supported. |
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| 59 | SCT Feature Control supported. |
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| 60 | SCT Data Table supported. |
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| 61 | |
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| 62 | SMART Attributes Data Structure revision number: 40 |
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| 63 | Vendor Specific SMART Attributes with Thresholds: |
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| 64 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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| 65 | 1 Raw_Read_Error_Rate POSR-K 100 100 005 - 61 |
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| 66 | 5 Reallocated_Sector_Ct -O--CK 100 100 010 - 0 |
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| 67 | 9 Power_On_Hours -O--CK 000 100 000 - 21 |
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| 68 | 12 Power_Cycle_Count -O--CK 100 100 000 - 2 |
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| 69 | 100 Unknown_Attribute -O--CK 100 100 000 - 3608448 |
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| 70 | 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 |
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| 71 | 170 Unknown_Attribute -O--CK 000 100 000 - 0 |
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| 72 | 171 Unknown_Attribute -O--CK 100 100 010 - 0 |
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| 73 | 172 Unknown_Attribute -O--CK 100 100 010 - 0 |
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| 74 | 174 Unknown_Attribute -O--CK 100 100 000 - 0 |
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| 75 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 |
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| 76 | 176 Erase_Fail_Count_Chip -O--CK 000 000 000 - 0 |
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| 77 | 177 Wear_Leveling_Count -O--CK 100 100 000 - 27 |
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| 78 | 178 Used_Rsvd_Blk_Cnt_Chip PO---- 100 100 000 - 42 |
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| 79 | 180 Unused_Rsvd_Blk_Cnt_Tot ------ 100 100 000 - 17998 |
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| 80 | 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 000 100 000 - 0 |
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| 81 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0 |
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| 82 | 194 Temperature_Celsius -O---K 052 100 000 - 52 (Min/Max 24/55) |
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| 83 | 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 61 |
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| 84 | 196 Reallocated_Event_Count PO--CK 100 100 000 - 0 |
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| 85 | 197 Current_Pending_Sector ----CK 100 100 000 - 0 |
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| 86 | 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 |
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| 87 | 199 UDMA_CRC_Error_Count ----CK 100 100 000 - 0 |
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| 88 | 201 Unknown_SSD_Attribute PO--CK 100 100 000 - 21 |
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| 89 | 204 Soft_ECC_Correction ------ 100 100 000 - 61 |
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| 90 | 231 Temperature_Celsius PO--CK 100 100 000 - 0 |
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| 91 | 234 Unknown_Attribute PO--CK 100 100 000 - 12445 |
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| 92 | 241 Total_LBAs_Written -O-RCK 100 100 000 - 9423 |
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| 93 | 242 Total_LBAs_Read -O-RCK 100 100 000 - 7924 |
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| 94 | 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 61 |
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| 95 | ||||||_ K auto-keep |
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| 96 | |||||__ C event count |
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| 97 | ||||___ R error rate |
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| 98 | |||____ S speed/performance |
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| 99 | ||_____ O updated online |
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| 100 | |______ P prefailure warning |
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| 101 | |
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| 102 | General Purpose Log Directory Version 1 |
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| 103 | SMART Log Directory Version 1 [multi-sector log support] |
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| 104 | Address Access R/W Size Description |
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| 105 | 0x00 GPL,SL R/O 1 Log Directory |
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| 106 | 0x01 SL R/O 1 Summary SMART error log |
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| 107 | 0x02 SL R/O 1 Comprehensive SMART error log |
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| 108 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log |
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| 109 | 0x04 GPL,SL R/O 8 Device Statistics log |
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| 110 | 0x06 SL R/O 1 SMART self-test log |
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| 111 | 0x07 GPL,SL R/O 1 Extended self-test log |
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| 112 | 0x09 SL R/W 1 Selective self-test log |
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| 113 | 0x10 GPL R/O 1 SATA NCQ Queued Error log |
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| 114 | 0x30 GPL R/O 9 IDENTIFY DEVICE data log |
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| 115 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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| 116 | 0xa1 SL VS 9 Device vendor specific log |
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| 117 | 0xaa SL VS 25 Device vendor specific log |
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| 118 | 0xab SL VS 1 Device vendor specific log |
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| 119 | 0xe0 GPL,SL R/W 1 SCT Command/Status |
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| 120 | 0xe1 GPL,SL R/W 1 SCT Data Transfer |
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| 121 | |
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| 122 | SMART Extended Comprehensive Error Log Version: 0 (1 sectors) |
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| 123 | No Errors Logged |
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| 124 | |
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| 125 | SMART Extended Self-test Log Version: 0 (1 sectors) |
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| 126 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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| 127 | # 1 Reserved (0x10) Completed without error 00% 0 - |
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| 128 | |
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| 129 | SMART Selective self-test log data structure revision number 0 |
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| 130 | Note: revision number not 1 implies that no selective self-test has ever been run |
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| 131 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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| 132 | 1 0 0 Not_testing |
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| 133 | 2 0 0 Not_testing |
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| 134 | 3 0 0 Not_testing |
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| 135 | 4 0 0 Not_testing |
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| 136 | 5 0 0 Not_testing |
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| 137 | Selective self-test flags (0x0): |
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| 138 | After scanning selected spans, do NOT read-scan remainder of disk. |
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| 139 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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| 140 | |
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| 141 | SCT Status Version: 3 |
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| 142 | SCT Version (vendor specific): 1 (0x0001) |
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| 143 | SCT Support Level: 0 |
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| 144 | Device State: Active (0) |
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| 145 | Current Temperature: 59 Celsius |
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| 146 | Power Cycle Min/Max Temperature: 24/55 Celsius |
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| 147 | Lifetime Min/Max Temperature: 24/55 Celsius |
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| 148 | Under/Over Temperature Limit Count: 0/0 |
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| 149 | SMART Status: 0xc24f (PASSED) |
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| 150 | |
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| 151 | Write SCT Data Table failed: scsi error badly formed scsi parameters |
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| 152 | Read SCT Temperature History failed |
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| 153 | |
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| 154 | Write SCT (Get) Error Recovery Control Command failed: scsi error badly formed scsi parameters |
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| 155 | SCT (Get) Error Recovery Control command failed |
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| 156 | |
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| 157 | Device Statistics (GP Log 0x04) |
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| 158 | Page Offset Size Value Flags Description |
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| 159 | 0x01 ===== = = === == General Statistics (rev 1) == |
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| 160 | 0x01 0x008 4 2 --- Lifetime Power-On Resets |
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| 161 | 0x01 0x010 4 21 --- Power-on Hours |
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| 162 | 0x01 0x018 6 19763460175 --- Logical Sectors Written |
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| 163 | 0x01 0x020 6 359913494 --- Number of Write Commands |
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| 164 | 0x01 0x028 6 16618894224 --- Logical Sectors Read |
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| 165 | 0x01 0x030 6 446825933 --- Number of Read Commands |
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| 166 | 0x01 0x038 6 3600000 --- Date and Time TimeStamp |
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| 167 | 0x02 ===== = = === == Free-Fall Statistics (empty) == |
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| 168 | 0x03 ===== = = === == Rotating Media Statistics (empty) == |
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| 169 | 0x04 ===== = = === == General Errors Statistics (rev 1) == |
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| 170 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors |
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| 171 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion |
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| 172 | 0x05 ===== = = === == Temperature Statistics (rev 1) == |
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| 173 | 0x05 0x008 1 52 --- Current Temperature |
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| 174 | 0x05 0x010 1 - --- Average Short Term Temperature |
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| 175 | 0x05 0x018 1 0 --- Average Long Term Temperature |
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| 176 | 0x05 0x020 1 55 --- Highest Temperature |
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| 177 | 0x05 0x028 1 24 --- Lowest Temperature |
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| 178 | 0x05 0x030 1 - --- Highest Average Short Term Temperature |
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| 179 | 0x05 0x038 1 - --- Lowest Average Short Term Temperature |
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| 180 | 0x05 0x040 1 0 --- Highest Average Long Term Temperature |
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| 181 | 0x05 0x048 1 0 --- Lowest Average Long Term Temperature |
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| 182 | 0x05 0x050 4 0 --- Time in Over-Temperature |
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| 183 | 0x05 0x058 1 70 --- Specified Maximum Operating Temperature |
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| 184 | 0x05 0x060 4 0 --- Time in Under-Temperature |
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| 185 | 0x05 0x068 1 0 --- Specified Minimum Operating Temperature |
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| 186 | 0x06 ===== = = === == Transport Statistics (rev 1) == |
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| 187 | 0x06 0x008 4 6 --- Number of Hardware Resets |
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| 188 | 0x06 0x018 4 0 --- Number of Interface CRC Errors |
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| 189 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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| 190 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |
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| 191 | |||_ C monitored condition met |
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| 192 | ||__ D supports DSN |
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| 193 | |___ N normalized value |
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| 194 | |
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| 195 | SATA Phy Event Counters (GP Log 0x11) not supported |
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| 196 | |
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