| 1 | smartctl 6.4 2015-06-04 r4109 [x86_64-linux-4.1.2-2-ARCH] (local build)
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| 2 | Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Model Family: Crucial/Micron BX100 Client SSDs
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| 6 | Device Model: CT250BX100SSD1
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| 7 | Firmware Version: MU02
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| 8 | User Capacity: 250,059,350,016 bytes [250 GB]
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| 9 | Sector Size: 512 bytes logical/physical
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| 10 | Rotation Rate: Solid State Device
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| 11 | Device is: In smartctl database [for details use: -P show]
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| 12 | ATA Version is: ACS-2 (minor revision not indicated)
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| 13 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 1.5 Gb/s)
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| 14 | Local Time is: Tue Jul 28 21:35:56 2015 WEST
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 | AAM feature is: Unavailable
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| 18 | APM feature is: Unavailable
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| 19 | Rd look-ahead is: Enabled
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| 20 | Write cache is: Enabled
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| 21 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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| 22 | Write SCT (Get) Feature Control Command failed: scsi error badly formed scsi parameters
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| 23 | Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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| 24 |
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| 25 | === START OF READ SMART DATA SECTION ===
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| 26 | SMART overall-health self-assessment test result: PASSED
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| 27 |
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| 28 | General SMART Values:
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| 29 | Offline data collection status: (0x00) Offline data collection activity
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| 30 | was never started.
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| 31 | Auto Offline Data Collection: Disabled.
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| 32 | Self-test execution status: ( 0) The previous self-test routine completed
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| 33 | without error or no self-test has ever
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| 34 | been run.
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| 35 | Total time to complete Offline
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| 36 | data collection: ( 0) seconds.
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| 37 | Offline data collection
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| 38 | capabilities: (0x71) SMART execute Offline immediate.
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| 39 | No Auto Offline data collection support.
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| 40 | Suspend Offline collection upon new
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| 41 | command.
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| 42 | No Offline surface scan supported.
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| 43 | Self-test supported.
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| 44 | Conveyance Self-test supported.
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| 45 | Selective Self-test supported.
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| 46 | SMART capabilities: (0x0002) Does not save SMART data before
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| 47 | entering power-saving mode.
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| 48 | Supports SMART auto save timer.
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| 49 | Error logging capability: (0x01) Error logging supported.
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| 50 | General Purpose Logging supported.
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| 51 | Short self-test routine
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| 52 | recommended polling time: ( 2) minutes.
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| 53 | Extended self-test routine
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| 54 | recommended polling time: ( 10) minutes.
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| 55 | Conveyance self-test routine
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| 56 | recommended polling time: ( 2) minutes.
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| 57 | SCT capabilities: (0x0035) SCT Status supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 1
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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| 65 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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| 66 | 9 Power_On_Hours ------ 100 100 000 - 2
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| 67 | 12 Power_Cycle_Count ------ 100 100 000 - 12
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| 68 | 160 Uncorrectable_Sector_Ct ------ 100 100 000 - 0
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| 69 | 161 Valid_Spare_Block_Cnt ------ 100 100 000 - 55
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| 70 | 163 Initial_Bad_Block_Count ------ 100 100 000 - 36
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| 71 | 164 Total_Erase_Count ------ 100 100 000 - 819
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| 72 | 165 Maximum_Erase_Count ------ 100 100 000 - 1
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| 73 | 166 Minimum_Erase_Count ------ 100 100 000 - 0
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| 74 | 167 Average_Erase_Count ------ 100 100 000 - 0
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| 75 | 168 Max_Erase_Count_of_Spec ------ 100 100 000 - 2000
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| 76 | 169 Remaining_Lifetime_Perc ------ 100 100 000 - 100
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| 77 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0
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| 78 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
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| 79 | 177 Wear_Leveling_Count ------ 100 100 000 - 0
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| 80 | 178 Runtime_Invalid_Blk_Cnt ------ 100 100 000 - 0
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| 81 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
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| 82 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0
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| 83 | 192 Power-Off_Retract_Count ------ 100 100 000 - 0
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| 84 | 194 Temperature_Celsius ------ 100 100 000 - 28
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| 85 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 201
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| 86 | 196 Reallocated_Event_Count ------ 100 100 000 - 0
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| 87 | 197 Current_Pending_Sector ------ 100 100 000 - 0
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| 88 | 198 Offline_Uncorrectable ------ 100 100 000 - 0
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| 89 | 199 UDMA_CRC_Error_Count ------ 100 100 000 - 0
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| 90 | 232 Available_Reservd_Space ------ 100 100 000 - 100
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| 91 | 241 Total_LBAs_Written ------ 100 100 000 - 6462
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| 92 | 242 Total_LBAs_Read ------ 100 100 000 - 1355
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| 93 | 245 Total_Flash_Write_Count ------ 100 100 000 - 6552
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| 94 | ||||||_ K auto-keep
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| 95 | |||||__ C event count
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| 96 | ||||___ R error rate
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| 97 | |||____ S speed/performance
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| 98 | ||_____ O updated online
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| 99 | |______ P prefailure warning
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| 100 |
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| 101 | General Purpose Log Directory Version 1
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| 102 | SMART Log Directory Version 1 [multi-sector log support]
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| 103 | Address Access R/W Size Description
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| 104 | 0x00 GPL,SL R/O 1 Log Directory
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| 105 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 106 | 0x06 SL R/O 1 SMART self-test log
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| 107 | 0x07 GPL,SL R/O 1 Extended self-test log
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| 108 | 0x09 SL R/W 1 Selective self-test log
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| 109 | 0x10 GPL,SL R/O 1 SATA NCQ Queued Error log
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| 110 | 0x11 GPL,SL R/O 1 SATA Phy Event Counters log
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| 111 | 0x24 GPL R/O 64 Current Device Internal Status Data log
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| 112 | 0x25 GPL R/O 64 Saved Device Internal Status Data log
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| 113 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 114 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 115 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 116 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 117 |
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| 118 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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| 119 |
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| 120 | SMART Error Log not supported
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| 121 |
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| 122 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 123 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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| 124 |
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| 125 | SMART Selective self-test log data structure revision number 1
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| 126 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 127 | 1 0 0 Not_testing
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| 128 | 2 0 0 Not_testing
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| 129 | 3 0 0 Not_testing
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| 130 | 4 0 0 Not_testing
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| 131 | 5 0 0 Not_testing
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| 132 | Selective self-test flags (0x0):
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| 133 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 134 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 135 |
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| 136 | SCT Status Version: 3
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| 137 | SCT Version (vendor specific): 0 (0x0000)
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| 138 | SCT Support Level: 0
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| 139 | Device State: Active (0)
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| 140 | Current Temperature: 0 Celsius
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| 141 | Power Cycle Min/Max Temperature: 25/28 Celsius
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| 142 | Lifetime Min/Max Temperature: 0/35 Celsius
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| 143 | Under/Over Temperature Limit Count: 0/0
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| 144 |
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| 145 | SCT Temperature History Version: 2
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| 146 | Temperature Sampling Period: 1 minute
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| 147 | Temperature Logging Interval: 0 minutes
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| 148 | Min/Max recommended Temperature: 0/100 Celsius
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| 149 | Min/Max Temperature Limit: 0/100 Celsius
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| 150 | Temperature History Size (Index): 128 (6)
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| 151 |
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| 152 | Index Estimated Time Temperature Celsius
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| 153 | 7 2015-07-28 19:28 34 ***************
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| 154 | ... ..( 67 skipped). .. ***************
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| 155 | 75 2015-07-28 20:36 34 ***************
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| 156 | 76 2015-07-28 20:37 35 ****************
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| 157 | 77 2015-07-28 20:38 34 ***************
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| 158 | ... ..( 2 skipped). .. ***************
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| 159 | 80 2015-07-28 20:41 34 ***************
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| 160 | 81 2015-07-28 20:42 35 ****************
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| 161 | 82 2015-07-28 20:43 26 *******
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| 162 | 83 2015-07-28 20:44 26 *******
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| 163 | 84 2015-07-28 20:45 29 **********
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| 164 | ... ..( 2 skipped). .. **********
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| 165 | 87 2015-07-28 20:48 29 **********
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| 166 | 88 2015-07-28 20:49 30 ***********
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| 167 | 89 2015-07-28 20:50 25 ******
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| 168 | 90 2015-07-28 20:51 25 ******
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| 169 | 91 2015-07-28 20:52 27 ********
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| 170 | ... ..( 2 skipped). .. ********
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| 171 | 94 2015-07-28 20:55 27 ********
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| 172 | 95 2015-07-28 20:56 28 *********
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| 173 | ... ..( 37 skipped). .. *********
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| 174 | 5 2015-07-28 21:34 28 *********
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| 175 | 6 2015-07-28 21:35 34 ***************
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| 176 |
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| 177 | SCT Error Recovery Control command not supported
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| 178 |
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| 179 | Device Statistics (GP Log 0x04)
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| 180 | Page Offset Size Value Flags Description
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| 181 | 0x01 ===== = = === == General Statistics (rev 2) ==
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| 182 | 0x01 0x008 4 12 --- Lifetime Power-On Resets
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| 183 | 0x01 0x010 4 2 --- Power-on Hours
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| 184 | 0x01 0x018 6 423532218 --- Logical Sectors Written
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| 185 | 0x01 0x020 6 1056261 --- Number of Write Commands
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| 186 | 0x01 0x028 6 88828979 --- Logical Sectors Read
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| 187 | 0x01 0x030 6 826439 --- Number of Read Commands
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| 188 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 189 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 190 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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| 191 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 192 | 0x06 0x008 4 1408 --- Number of Hardware Resets
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| 193 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 194 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 195 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 196 | |||_ C monitored condition met
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| 197 | ||__ D supports DSN
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| 198 | |___ N normalized value
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| 199 |
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| 200 | SATA Phy Event Counters (GP Log 0x11)
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| 201 | ID Size Value Description
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| 202 | 0x0001 2 0 Command failed due to ICRC error
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| 203 | 0x0002 2 0 R_ERR response for data FIS
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| 204 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 205 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 206 | 0x0005 2 0 R_ERR response for non-data FIS
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| 207 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 208 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 209 | 0x0008 2 0 Device-to-host non-data FIS retries
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| 210 | 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
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| 211 | 0x000a 2 4 Device-to-host register FISes sent due to a COMRESET
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| 212 | 0x000b 2 0 CRC errors within host-to-device FIS
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| 213 | 0x000d 2 0 Non-CRC errors within host-to-device FIS
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| 214 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 215 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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| 216 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 217 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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| 218 |
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