1 | smartctl 6.4 (build date Jun 5 2015) [x86_64-apple-darwin10.8.0] (local build) |
---|
2 | Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org |
---|
3 | |
---|
4 | === START OF INFORMATION SECTION === |
---|
5 | Device Model: TS256GSSD370S |
---|
6 | Firmware Version: N1114H |
---|
7 | User Capacity: 256 060 514 304 bytes [256 GB] |
---|
8 | Sector Size: 512 bytes logical/physical |
---|
9 | Rotation Rate: Solid State Device |
---|
10 | Device is: Not in smartctl database [for details use: -P showall] |
---|
11 | ATA Version is: ACS-2 (minor revision not indicated) |
---|
12 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) |
---|
13 | Local Time is: Sun Jul 19 19:44:28 2015 EEST |
---|
14 | SMART support is: Available - device has SMART capability. |
---|
15 | SMART support is: Enabled |
---|
16 | AAM feature is: Disabled |
---|
17 | APM feature is: Unavailable |
---|
18 | Rd look-ahead is: Enabled |
---|
19 | Write cache is: Enabled |
---|
20 | ATA Security is: Disabled, NOT FROZEN [SEC1] |
---|
21 | Wt Cache Reorder: Unavailable |
---|
22 | |
---|
23 | === START OF READ SMART DATA SECTION === |
---|
24 | SMART overall-health self-assessment test result: PASSED |
---|
25 | |
---|
26 | General SMART Values: |
---|
27 | Offline data collection status: (0x00) Offline data collection activity |
---|
28 | was never started. |
---|
29 | Auto Offline Data Collection: Disabled. |
---|
30 | Self-test execution status: ( 0) The previous self-test routine completed |
---|
31 | without error or no self-test has ever |
---|
32 | been run. |
---|
33 | Total time to complete Offline |
---|
34 | data collection: ( 0) seconds. |
---|
35 | Offline data collection |
---|
36 | capabilities: (0x71) SMART execute Offline immediate. |
---|
37 | No Auto Offline data collection support. |
---|
38 | Suspend Offline collection upon new |
---|
39 | command. |
---|
40 | No Offline surface scan supported. |
---|
41 | Self-test supported. |
---|
42 | Conveyance Self-test supported. |
---|
43 | Selective Self-test supported. |
---|
44 | SMART capabilities: (0x0002) Does not save SMART data before |
---|
45 | entering power-saving mode. |
---|
46 | Supports SMART auto save timer. |
---|
47 | Error logging capability: (0x01) Error logging supported. |
---|
48 | General Purpose Logging supported. |
---|
49 | Short self-test routine |
---|
50 | recommended polling time: ( 2) minutes. |
---|
51 | Extended self-test routine |
---|
52 | recommended polling time: ( 10) minutes. |
---|
53 | Conveyance self-test routine |
---|
54 | recommended polling time: ( 2) minutes. |
---|
55 | |
---|
56 | SMART Attributes Data Structure revision number: 1 |
---|
57 | Vendor Specific SMART Attributes with Thresholds: |
---|
58 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
---|
59 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 |
---|
60 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 |
---|
61 | 9 Power_On_Hours ------ 100 100 000 - 2 |
---|
62 | 12 Power_Cycle_Count ------ 100 100 000 - 11 |
---|
63 | 160 Unknown_Attribute ------ 100 100 000 - 0 |
---|
64 | 161 Unknown_Attribute ------ 100 100 000 - 45 |
---|
65 | 163 Unknown_Attribute ------ 100 100 000 - 24 |
---|
66 | 164 Unknown_Attribute ------ 100 100 000 - 703 |
---|
67 | 165 Unknown_Attribute ------ 100 100 000 - 5 |
---|
68 | 166 Unknown_Attribute ------ 100 100 000 - 0 |
---|
69 | 167 Unknown_Attribute ------ 100 100 000 - 0 |
---|
70 | 168 Unknown_Attribute ------ 100 100 000 - 3000 |
---|
71 | 169 Unknown_Attribute ------ 100 100 000 - 100 |
---|
72 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0 |
---|
73 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0 |
---|
74 | 177 Wear_Leveling_Count ------ 100 100 050 - 0 |
---|
75 | 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0 |
---|
76 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 |
---|
77 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 |
---|
78 | 192 Power-Off_Retract_Count ------ 100 100 000 - 5 |
---|
79 | 194 Temperature_Celsius ------ 100 100 000 - 30 |
---|
80 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 116 |
---|
81 | 196 Reallocated_Event_Count ------ 100 100 016 - 0 |
---|
82 | 197 Current_Pending_Sector ------ 100 100 000 - 0 |
---|
83 | 198 Offline_Uncorrectable ------ 100 100 000 - 0 |
---|
84 | 199 UDMA_CRC_Error_Count ------ 100 100 050 - 2 |
---|
85 | 232 Available_Reservd_Space ------ 100 100 000 - 100 |
---|
86 | 241 Total_LBAs_Written ------ 100 100 000 - 4766 |
---|
87 | 242 Total_LBAs_Read ------ 100 100 000 - 1813 |
---|
88 | 245 Unknown_Attribute ------ 100 100 000 - 5624 |
---|
89 | ||||||_ K auto-keep |
---|
90 | |||||__ C event count |
---|
91 | ||||___ R error rate |
---|
92 | |||____ S speed/performance |
---|
93 | ||_____ O updated online |
---|
94 | |______ P prefailure warning |
---|
95 | |
---|
96 | ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented |
---|
97 | Read GP Log Directory failed |
---|
98 | |
---|
99 | SMART Log Directory Version 1 [multi-sector log support] |
---|
100 | Address Access R/W Size Description |
---|
101 | 0x00 SL R/O 1 Log Directory |
---|
102 | 0x01 SL R/O 1 Summary SMART error log |
---|
103 | 0x02 SL R/O 1 Comprehensive SMART error log |
---|
104 | 0x03 SL R/O 1 Ext. Comprehensive SMART error log |
---|
105 | 0x04 SL R/O 8 Device Statistics log |
---|
106 | 0x06 SL R/O 1 SMART self-test log |
---|
107 | 0x07 SL R/O 1 Extended self-test log |
---|
108 | 0x09 SL R/W 1 Selective self-test log |
---|
109 | 0x10 SL R/O 1 SATA NCQ Queued Error log |
---|
110 | 0x30 SL R/O 9 IDENTIFY DEVICE data log |
---|
111 | 0x80-0x9f SL R/W 16 Host vendor specific log |
---|
112 | |
---|
113 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported |
---|
114 | |
---|
115 | SMART Error Log Version: 1 |
---|
116 | No Errors Logged |
---|
117 | |
---|
118 | SMART Extended Self-test Log (GP Log 0x07) not supported |
---|
119 | |
---|
120 | SMART Self-test log structure revision number 1 |
---|
121 | No self-tests have been logged. [To run self-tests, use: smartctl -t] |
---|
122 | |
---|
123 | SMART Selective self-test log data structure revision number 1 |
---|
124 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
---|
125 | 1 0 0 Not_testing |
---|
126 | 2 0 0 Not_testing |
---|
127 | 3 0 0 Not_testing |
---|
128 | 4 0 0 Not_testing |
---|
129 | 5 0 0 Not_testing |
---|
130 | Selective self-test flags (0x0): |
---|
131 | After scanning selected spans, do NOT read-scan remainder of disk. |
---|
132 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
---|
133 | |
---|
134 | SCT Commands not supported |
---|
135 | |
---|
136 | Device Statistics (SMART Log 0x04) |
---|
137 | Page Offset Size Value Flags Description |
---|
138 | ATA_SMART_READ_LOG failed: Undefined error: 0 |
---|
139 | Read Device Statistics pages 0x00-0x07 failed |
---|
140 | |
---|
141 | SATA Phy Event Counters (GP Log 0x11) not supported |
---|
142 | |
---|