| 1 | smartctl 6.4 (build date Jun 5 2015) [x86_64-apple-darwin10.8.0] (local build) |
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| 2 | Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org |
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| 3 | |
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| 4 | === START OF INFORMATION SECTION === |
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| 5 | Device Model: TS256GSSD370S |
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| 6 | Firmware Version: N1114H |
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| 7 | User Capacity: 256 060 514 304 bytes [256 GB] |
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| 8 | Sector Size: 512 bytes logical/physical |
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| 9 | Rotation Rate: Solid State Device |
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| 10 | Device is: Not in smartctl database [for details use: -P showall] |
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| 11 | ATA Version is: ACS-2 (minor revision not indicated) |
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| 12 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) |
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| 13 | Local Time is: Sun Jul 19 19:44:28 2015 EEST |
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| 14 | SMART support is: Available - device has SMART capability. |
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| 15 | SMART support is: Enabled |
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| 16 | AAM feature is: Disabled |
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| 17 | APM feature is: Unavailable |
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| 18 | Rd look-ahead is: Enabled |
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| 19 | Write cache is: Enabled |
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| 20 | ATA Security is: Disabled, NOT FROZEN [SEC1] |
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| 21 | Wt Cache Reorder: Unavailable |
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| 22 | |
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| 23 | === START OF READ SMART DATA SECTION === |
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| 24 | SMART overall-health self-assessment test result: PASSED |
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| 25 | |
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| 26 | General SMART Values: |
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| 27 | Offline data collection status: (0x00) Offline data collection activity |
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| 28 | was never started. |
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| 29 | Auto Offline Data Collection: Disabled. |
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| 30 | Self-test execution status: ( 0) The previous self-test routine completed |
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| 31 | without error or no self-test has ever |
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| 32 | been run. |
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| 33 | Total time to complete Offline |
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| 34 | data collection: ( 0) seconds. |
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| 35 | Offline data collection |
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| 36 | capabilities: (0x71) SMART execute Offline immediate. |
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| 37 | No Auto Offline data collection support. |
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| 38 | Suspend Offline collection upon new |
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| 39 | command. |
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| 40 | No Offline surface scan supported. |
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| 41 | Self-test supported. |
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| 42 | Conveyance Self-test supported. |
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| 43 | Selective Self-test supported. |
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| 44 | SMART capabilities: (0x0002) Does not save SMART data before |
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| 45 | entering power-saving mode. |
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| 46 | Supports SMART auto save timer. |
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| 47 | Error logging capability: (0x01) Error logging supported. |
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| 48 | General Purpose Logging supported. |
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| 49 | Short self-test routine |
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| 50 | recommended polling time: ( 2) minutes. |
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| 51 | Extended self-test routine |
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| 52 | recommended polling time: ( 10) minutes. |
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| 53 | Conveyance self-test routine |
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| 54 | recommended polling time: ( 2) minutes. |
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| 55 | |
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| 56 | SMART Attributes Data Structure revision number: 1 |
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| 57 | Vendor Specific SMART Attributes with Thresholds: |
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| 58 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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| 59 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 |
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| 60 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 |
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| 61 | 9 Power_On_Hours ------ 100 100 000 - 2 |
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| 62 | 12 Power_Cycle_Count ------ 100 100 000 - 11 |
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| 63 | 160 Unknown_Attribute ------ 100 100 000 - 0 |
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| 64 | 161 Unknown_Attribute ------ 100 100 000 - 45 |
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| 65 | 163 Unknown_Attribute ------ 100 100 000 - 24 |
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| 66 | 164 Unknown_Attribute ------ 100 100 000 - 703 |
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| 67 | 165 Unknown_Attribute ------ 100 100 000 - 5 |
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| 68 | 166 Unknown_Attribute ------ 100 100 000 - 0 |
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| 69 | 167 Unknown_Attribute ------ 100 100 000 - 0 |
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| 70 | 168 Unknown_Attribute ------ 100 100 000 - 3000 |
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| 71 | 169 Unknown_Attribute ------ 100 100 000 - 100 |
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| 72 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0 |
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| 73 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0 |
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| 74 | 177 Wear_Leveling_Count ------ 100 100 050 - 0 |
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| 75 | 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0 |
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| 76 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 |
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| 77 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 |
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| 78 | 192 Power-Off_Retract_Count ------ 100 100 000 - 5 |
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| 79 | 194 Temperature_Celsius ------ 100 100 000 - 30 |
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| 80 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 116 |
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| 81 | 196 Reallocated_Event_Count ------ 100 100 016 - 0 |
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| 82 | 197 Current_Pending_Sector ------ 100 100 000 - 0 |
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| 83 | 198 Offline_Uncorrectable ------ 100 100 000 - 0 |
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| 84 | 199 UDMA_CRC_Error_Count ------ 100 100 050 - 2 |
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| 85 | 232 Available_Reservd_Space ------ 100 100 000 - 100 |
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| 86 | 241 Total_LBAs_Written ------ 100 100 000 - 4766 |
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| 87 | 242 Total_LBAs_Read ------ 100 100 000 - 1813 |
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| 88 | 245 Unknown_Attribute ------ 100 100 000 - 5624 |
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| 89 | ||||||_ K auto-keep |
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| 90 | |||||__ C event count |
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| 91 | ||||___ R error rate |
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| 92 | |||____ S speed/performance |
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| 93 | ||_____ O updated online |
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| 94 | |______ P prefailure warning |
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| 95 | |
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| 96 | ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented |
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| 97 | Read GP Log Directory failed |
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| 98 | |
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| 99 | SMART Log Directory Version 1 [multi-sector log support] |
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| 100 | Address Access R/W Size Description |
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| 101 | 0x00 SL R/O 1 Log Directory |
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| 102 | 0x01 SL R/O 1 Summary SMART error log |
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| 103 | 0x02 SL R/O 1 Comprehensive SMART error log |
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| 104 | 0x03 SL R/O 1 Ext. Comprehensive SMART error log |
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| 105 | 0x04 SL R/O 8 Device Statistics log |
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| 106 | 0x06 SL R/O 1 SMART self-test log |
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| 107 | 0x07 SL R/O 1 Extended self-test log |
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| 108 | 0x09 SL R/W 1 Selective self-test log |
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| 109 | 0x10 SL R/O 1 SATA NCQ Queued Error log |
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| 110 | 0x30 SL R/O 9 IDENTIFY DEVICE data log |
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| 111 | 0x80-0x9f SL R/W 16 Host vendor specific log |
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| 112 | |
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| 113 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported |
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| 114 | |
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| 115 | SMART Error Log Version: 1 |
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| 116 | No Errors Logged |
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| 117 | |
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| 118 | SMART Extended Self-test Log (GP Log 0x07) not supported |
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| 119 | |
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| 120 | SMART Self-test log structure revision number 1 |
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| 121 | No self-tests have been logged. [To run self-tests, use: smartctl -t] |
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| 122 | |
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| 123 | SMART Selective self-test log data structure revision number 1 |
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| 124 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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| 125 | 1 0 0 Not_testing |
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| 126 | 2 0 0 Not_testing |
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| 127 | 3 0 0 Not_testing |
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| 128 | 4 0 0 Not_testing |
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| 129 | 5 0 0 Not_testing |
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| 130 | Selective self-test flags (0x0): |
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| 131 | After scanning selected spans, do NOT read-scan remainder of disk. |
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| 132 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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| 133 | |
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| 134 | SCT Commands not supported |
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| 135 | |
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| 136 | Device Statistics (SMART Log 0x04) |
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| 137 | Page Offset Size Value Flags Description |
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| 138 | ATA_SMART_READ_LOG failed: Undefined error: 0 |
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| 139 | Read Device Statistics pages 0x00-0x07 failed |
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| 140 | |
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| 141 | SATA Phy Event Counters (GP Log 0x11) not supported |
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| 142 | |
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