1 | smartctl 6.4 (build date Jun 5 2015) [x86_64-apple-darwin10.8.0] (local build)
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2 | Copyright (C) 2002-15, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: TS256GSSD370S
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6 | Firmware Version: N1114H
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7 | User Capacity: 256 060 514 304 bytes [256 GB]
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8 | Sector Size: 512 bytes logical/physical
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9 | Rotation Rate: Solid State Device
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10 | Device is: Not in smartctl database [for details use: -P showall]
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11 | ATA Version is: ACS-2 (minor revision not indicated)
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12 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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13 | Local Time is: Sun Jul 19 19:44:28 2015 EEST
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14 | SMART support is: Available - device has SMART capability.
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15 | SMART support is: Enabled
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16 | AAM feature is: Disabled
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17 | APM feature is: Unavailable
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18 | Rd look-ahead is: Enabled
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19 | Write cache is: Enabled
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20 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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21 | Wt Cache Reorder: Unavailable
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22 |
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23 | === START OF READ SMART DATA SECTION ===
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24 | SMART overall-health self-assessment test result: PASSED
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25 |
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26 | General SMART Values:
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27 | Offline data collection status: (0x00) Offline data collection activity
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28 | was never started.
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29 | Auto Offline Data Collection: Disabled.
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30 | Self-test execution status: ( 0) The previous self-test routine completed
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31 | without error or no self-test has ever
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32 | been run.
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33 | Total time to complete Offline
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34 | data collection: ( 0) seconds.
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35 | Offline data collection
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36 | capabilities: (0x71) SMART execute Offline immediate.
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37 | No Auto Offline data collection support.
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38 | Suspend Offline collection upon new
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39 | command.
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40 | No Offline surface scan supported.
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41 | Self-test supported.
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42 | Conveyance Self-test supported.
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43 | Selective Self-test supported.
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44 | SMART capabilities: (0x0002) Does not save SMART data before
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45 | entering power-saving mode.
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46 | Supports SMART auto save timer.
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47 | Error logging capability: (0x01) Error logging supported.
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48 | General Purpose Logging supported.
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49 | Short self-test routine
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50 | recommended polling time: ( 2) minutes.
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51 | Extended self-test routine
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52 | recommended polling time: ( 10) minutes.
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53 | Conveyance self-test routine
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54 | recommended polling time: ( 2) minutes.
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55 |
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56 | SMART Attributes Data Structure revision number: 1
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57 | Vendor Specific SMART Attributes with Thresholds:
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58 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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59 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0
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60 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0
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61 | 9 Power_On_Hours ------ 100 100 000 - 2
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62 | 12 Power_Cycle_Count ------ 100 100 000 - 11
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63 | 160 Unknown_Attribute ------ 100 100 000 - 0
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64 | 161 Unknown_Attribute ------ 100 100 000 - 45
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65 | 163 Unknown_Attribute ------ 100 100 000 - 24
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66 | 164 Unknown_Attribute ------ 100 100 000 - 703
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67 | 165 Unknown_Attribute ------ 100 100 000 - 5
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68 | 166 Unknown_Attribute ------ 100 100 000 - 0
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69 | 167 Unknown_Attribute ------ 100 100 000 - 0
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70 | 168 Unknown_Attribute ------ 100 100 000 - 3000
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71 | 169 Unknown_Attribute ------ 100 100 000 - 100
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72 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0
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73 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0
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74 | 177 Wear_Leveling_Count ------ 100 100 050 - 0
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75 | 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0
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76 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0
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77 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0
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78 | 192 Power-Off_Retract_Count ------ 100 100 000 - 5
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79 | 194 Temperature_Celsius ------ 100 100 000 - 30
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80 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 116
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81 | 196 Reallocated_Event_Count ------ 100 100 016 - 0
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82 | 197 Current_Pending_Sector ------ 100 100 000 - 0
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83 | 198 Offline_Uncorrectable ------ 100 100 000 - 0
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84 | 199 UDMA_CRC_Error_Count ------ 100 100 050 - 2
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85 | 232 Available_Reservd_Space ------ 100 100 000 - 100
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86 | 241 Total_LBAs_Written ------ 100 100 000 - 4766
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87 | 242 Total_LBAs_Read ------ 100 100 000 - 1813
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88 | 245 Unknown_Attribute ------ 100 100 000 - 5624
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89 | ||||||_ K auto-keep
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90 | |||||__ C event count
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91 | ||||___ R error rate
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92 | |||____ S speed/performance
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93 | ||_____ O updated online
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94 | |______ P prefailure warning
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95 |
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96 | ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
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97 | Read GP Log Directory failed
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98 |
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99 | SMART Log Directory Version 1 [multi-sector log support]
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100 | Address Access R/W Size Description
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101 | 0x00 SL R/O 1 Log Directory
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102 | 0x01 SL R/O 1 Summary SMART error log
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103 | 0x02 SL R/O 1 Comprehensive SMART error log
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104 | 0x03 SL R/O 1 Ext. Comprehensive SMART error log
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105 | 0x04 SL R/O 8 Device Statistics log
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106 | 0x06 SL R/O 1 SMART self-test log
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107 | 0x07 SL R/O 1 Extended self-test log
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108 | 0x09 SL R/W 1 Selective self-test log
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109 | 0x10 SL R/O 1 SATA NCQ Queued Error log
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110 | 0x30 SL R/O 9 IDENTIFY DEVICE data log
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111 | 0x80-0x9f SL R/W 16 Host vendor specific log
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112 |
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113 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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114 |
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115 | SMART Error Log Version: 1
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116 | No Errors Logged
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117 |
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118 | SMART Extended Self-test Log (GP Log 0x07) not supported
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119 |
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120 | SMART Self-test log structure revision number 1
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121 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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122 |
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123 | SMART Selective self-test log data structure revision number 1
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124 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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125 | 1 0 0 Not_testing
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126 | 2 0 0 Not_testing
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127 | 3 0 0 Not_testing
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128 | 4 0 0 Not_testing
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129 | 5 0 0 Not_testing
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130 | Selective self-test flags (0x0):
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131 | After scanning selected spans, do NOT read-scan remainder of disk.
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132 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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133 |
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134 | SCT Commands not supported
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135 |
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136 | Device Statistics (SMART Log 0x04)
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137 | Page Offset Size Value Flags Description
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138 | ATA_SMART_READ_LOG failed: Undefined error: 0
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139 | Read Device Statistics pages 0x00-0x07 failed
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140 |
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141 | SATA Phy Event Counters (GP Log 0x11) not supported
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142 |
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