| 1 | smartctl 6.1 2013-03-16 r3800 [x86_64-w64-mingw32-win7-sp1] (sf-6.1-1)
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| 2 | Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: KINGSTON SV200S3128G
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| 6 | Serial Number: 12BA319XKAWK
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| 7 | Firmware Version: E120506a
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| 8 | User Capacity: 128 035 676 160 bytes [128 GB]
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| 9 | Sector Size: 512 bytes logical/physical
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| 10 | Rotation Rate: Solid State Device
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| 11 | Device is: Not in smartctl database [for details use: -P showall]
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| 12 | ATA Version is: ACS-2 (minor revision not indicated)
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| 13 | SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
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| 14 | Local Time is: Sat Apr 06 22:37:18 2013
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 |
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| 18 | === START OF READ SMART DATA SECTION ===
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| 19 | SMART overall-health self-assessment test result: PASSED
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| 20 |
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| 21 | General SMART Values:
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| 22 | Offline data collection status: (0x00) Offline data collection activity
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| 23 | was never started.
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| 24 | Auto Offline Data Collection: Disabled.
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| 25 | Self-test execution status: ( 0) The previous self-test routine completed
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| 26 |
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| 27 | without error or no self-test has ever
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| 28 | been run.
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| 29 | Total time to complete Offline
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| 30 | data collection: ( 32) seconds.
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| 31 | Offline data collection
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| 32 | capabilities: (0x5b) SMART execute Offline immediate.
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| 33 | Auto Offline data collection on/off supp
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| 34 | ort.
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| 35 | Suspend Offline collection upon new
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| 36 | command.
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| 37 | Offline surface scan supported.
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| 38 | Self-test supported.
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| 39 | No Conveyance Self-test supported.
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| 40 | Selective Self-test supported.
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| 41 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 42 | power-saving mode.
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| 43 | Supports SMART auto save timer.
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| 44 | Error logging capability: (0x01) Error logging supported.
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| 45 | General Purpose Logging supported.
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| 46 | Short self-test routine
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| 47 | recommended polling time: ( 1) minutes.
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| 48 | Extended self-test routine
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| 49 | recommended polling time: ( 1) minutes.
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| 50 | SCT capabilities: (0x0039) SCT Status supported.
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| 51 | SCT Error Recovery Control supported.
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| 52 | SCT Feature Control supported.
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| 53 | SCT Data Table supported.
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| 54 |
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| 55 | SMART Attributes Data Structure revision number: 16
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| 56 | Vendor Specific SMART Attributes with Thresholds:
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| 57 | ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_
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| 58 | FAILED RAW_VALUE
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| 59 | 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always -
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| 60 | 0
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| 61 | 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline -
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| 62 | 0
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| 63 | 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always -
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| 64 | 0
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| 65 | 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always -
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| 66 | 0
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| 67 | 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always -
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| 68 | 0
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| 69 | 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline -
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| 70 | 0
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| 71 | 9 Power_On_Hours 0x0012 100 100 000 Old_age Always -
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| 72 | 1698
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| 73 | 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always -
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| 74 | 0
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| 75 | 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always -
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| 76 | 1511
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| 77 | 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always -
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| 78 | 0
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| 79 | 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always -
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| 80 | 1
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| 81 | 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always -
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| 82 | 0
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| 83 | 173 Unknown_Attribute 0x0012 200 200 000 Old_age Always -
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| 84 | 0
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| 85 | 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always -
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| 86 | 0
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| 87 | 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always -
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| 88 | 0
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| 89 | 194 Temperature_Celsius 0x0023 048 048 030 Pre-fail Always -
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| 90 | 48 (Min/Max 31/49)
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| 91 | 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always -
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| 92 | 0
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| 93 | 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always -
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| 94 | 0
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| 95 |
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| 96 | SMART Error Log Version: 1
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| 97 | ATA Error Count: 1
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| 98 | CR = Command Register [HEX]
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| 99 | FR = Features Register [HEX]
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| 100 | SC = Sector Count Register [HEX]
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| 101 | SN = Sector Number Register [HEX]
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| 102 | CL = Cylinder Low Register [HEX]
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| 103 | CH = Cylinder High Register [HEX]
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| 104 | DH = Device/Head Register [HEX]
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| 105 | DC = Device Command Register [HEX]
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| 106 | ER = Error register [HEX]
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| 107 | ST = Status register [HEX]
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| 108 | Powered_Up_Time is measured from power on, and printed as
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| 109 | DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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| 110 | SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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| 111 |
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| 112 | Error 1 occurred at disk power-on lifetime: 1537 hours (64 days + 1 hours)
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| 113 | When the command that caused the error occurred, the device was active or idle
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| 114 | .
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| 115 |
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| 116 | After command completion occurred, registers were:
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| 117 | ER ST SC SN CL CH DH
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| 118 | -- -- -- -- -- -- --
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| 119 | 84 51 00 00 00 00 00
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| 120 |
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| 121 | Commands leading to the command that caused the error were:
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| 122 | CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
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| 123 | -- -- -- -- -- -- -- -- ---------------- --------------------
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| 124 | ec 00 00 00 00 00 00 00 00:19:35.000 IDENTIFY DEVICE
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| 125 | e5 00 00 00 00 00 00 ff 00:19:34.500 CHECK POWER MODE
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| 126 | b0 da 00 00 4f c2 00 00 00:17:57.100 SMART RETURN STATUS
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| 127 | ef 02 00 00 00 00 a0 00 00:17:57.100 SET FEATURES [Enable write cache]
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| 128 | ef aa 00 00 00 00 a0 00 00:17:57.100 SET FEATURES [Enable read look-ahea
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| 129 | d]
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| 130 |
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| 131 | SMART Self-test log structure revision number 1
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| 132 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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| 133 |
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| 134 |
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| 135 | SMART Selective self-test log data structure revision number 1
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| 136 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 137 | 1 0 0 Not_testing
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| 138 | 2 0 0 Not_testing
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| 139 | 3 0 0 Not_testing
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| 140 | 4 0 0 Not_testing
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| 141 | 5 0 0 Not_testing
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| 142 | Selective self-test flags (0x0):
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| 143 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 144 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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