| 1 | smartctl 7.2 2020-12-30 r5155 [x86_64-linux-3.10.0-1160.119.1.0.18.el7.x86_64] (local build)
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| 2 | Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Model Family: BIWIN SSDs
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| 6 | Device Model: Acer SSD SA100 480GB
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| 7 | Serial Number: ASA31520200330
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| 8 | Firmware Version: U0401A0
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| 9 | User Capacity: 480,103,981,056 bytes [480 GB]
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| 10 | Sector Size: 512 bytes logical/physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: 2.5 inches
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| 13 | TRIM Command: Available
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| 14 | Device is: In smartctl database [for details use: -P show]
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| 15 | ATA Version is: ACS-3 T13/2161-D revision 4
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| 16 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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| 17 | Local Time is: Wed Mar 18 22:24:35 2026 MDT
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| 18 | SMART support is: Available - device has SMART capability.
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| 19 | SMART support is: Enabled
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| 20 | AAM feature is: Unavailable
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| 21 | APM feature is: Disabled
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| 22 | Rd look-ahead is: Enabled
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| 23 | Write cache is: Enabled
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| 24 | DSN feature is: Unavailable
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| 25 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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| 26 | Wt Cache Reorder: Unavailable
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| 27 |
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| 28 | === START OF READ SMART DATA SECTION ===
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| 29 | SMART overall-health self-assessment test result: PASSED
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| 30 |
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| 31 | General SMART Values:
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| 32 | Offline data collection status: (0x02) Offline data collection activity
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| 33 | was completed without error.
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| 34 | Auto Offline Data Collection: Disabled.
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| 35 | Self-test execution status: ( 0) The previous self-test routine completed
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| 36 | without error or no self-test has ever
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| 37 | been run.
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| 38 | Total time to complete Offline
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| 39 | data collection: ( 120) seconds.
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| 40 | Offline data collection
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| 41 | capabilities: (0x11) SMART execute Offline immediate.
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| 42 | No Auto Offline data collection support.
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| 43 | Suspend Offline collection upon new
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| 44 | command.
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| 45 | No Offline surface scan supported.
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| 46 | Self-test supported.
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| 47 | No Conveyance Self-test supported.
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| 48 | No Selective Self-test supported.
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| 49 | SMART capabilities: (0x0002) Does not save SMART data before
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| 50 | entering power-saving mode.
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| 51 | Supports SMART auto save timer.
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| 52 | Error logging capability: (0x01) Error logging supported.
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| 53 | General Purpose Logging supported.
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| 54 | Short self-test routine
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| 55 | recommended polling time: ( 2) minutes.
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| 56 | Extended self-test routine
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| 57 | recommended polling time: ( 10) minutes.
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| 58 |
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| 59 | SMART Attributes Data Structure revision number: 1
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| 60 | Vendor Specific SMART Attributes with Thresholds:
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| 61 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 62 | 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
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| 63 | 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
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| 64 | 9 Power_On_Hours -O--CK 100 100 050 - 31656
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| 65 | 12 Power_Cycle_Count -O--CK 100 100 050 - 17
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| 66 | 160 Uncorrectable_Sectors -O--CK 100 100 050 - 0
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| 67 | 161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100
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| 68 | 163 Initial_Bad_Block_Count -O--CK 100 100 050 - 9
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| 69 | 164 Total_Erase_Count -O--CK 100 100 050 - 9151
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| 70 | 165 Max_Erase_Count -O--CK 100 100 050 - 158
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| 71 | 166 Min_Erase_Count -O--CK 100 100 050 - 4
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| 72 | 167 Average_Erase_Count -O--CK 100 100 050 - 42
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| 73 | 168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 5050
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| 74 | 169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100
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| 75 | 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 76 | 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 77 | 177 Wear_Leveling_Count -O--CK 100 100 050 - 0
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| 78 | 178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0
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| 79 | 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
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| 80 | 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
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| 81 | 192 Power-Off_Retract_Count -O--CK 100 100 050 - 12
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| 82 | 194 Device_Temperature -O---K 100 100 050 - 54
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| 83 | 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
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| 84 | 196 Reallocated_Event_Count -O--CK 100 100 050 - 0
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| 85 | 197 Current_Pending_Sector -O--CK 100 100 050 - 0
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| 86 | 198 Offline_Uncorrectable -O--CK 100 100 050 - 0
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| 87 | 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
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| 88 | 232 Available_Reservd_Space -O--CK 100 100 050 - 100
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| 89 | 241 Total_LBAs_Written ----CK 100 100 050 - 71519
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| 90 | 242 Total_LBAs_Read ----CK 100 100 050 - 2515
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| 91 | 245 Flash_Writes_Sectors -O--CK 100 100 050 - 192394
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| 92 | ||||||_ K auto-keep
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| 93 | |||||__ C event count
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| 94 | ||||___ R error rate
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| 95 | |||____ S speed/performance
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| 96 | ||_____ O updated online
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| 97 | |______ P prefailure warning
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| 98 |
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| 99 | General Purpose Log Directory Version 1
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| 100 | SMART Log Directory Version 1 [multi-sector log support]
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| 101 | Address Access R/W Size Description
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| 102 | 0x00 GPL,SL R/O 1 Log Directory
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| 103 | 0x01 SL R/O 1 Summary SMART error log
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| 104 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 105 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 106 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 107 | 0x06 SL R/O 1 SMART self-test log
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| 108 | 0x07 GPL R/O 1 Extended self-test log
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| 109 | 0x10 GPL R/O 1 NCQ Command Error log
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| 110 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 111 | 0x24 GPL R/O 88 Current Device Internal Status Data log
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| 112 | 0x25 GPL R/O 32 Saved Device Internal Status Data log
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| 113 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 114 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 115 |
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| 116 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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| 117 | No Errors Logged
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| 118 |
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| 119 | SMART Error Log Version: 1
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| 120 | No Errors Logged
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| 121 |
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| 122 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 123 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 124 | # 1 Short offline Completed without error 00% 31656 -
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| 125 | # 2 Short offline Completed without error 00% 31654 -
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| 126 | # 3 Extended offline Completed without error 00% 31654 -
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| 127 | # 4 Extended offline Completed without error 00% 31489 -
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| 128 |
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| 129 | SMART Self-test log structure revision number 1
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| 130 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 131 | # 1 Short offline Completed without error 00% 31656 -
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| 132 | # 2 Short offline Completed without error 00% 31654 -
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| 133 | # 3 Extended offline Completed without error 00% 31654 -
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| 134 | # 4 Extended offline Completed without error 00% 31489 -
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| 135 |
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| 136 | Selective Self-tests/Logging not supported
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| 137 |
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| 138 | SCT Commands not supported
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| 139 |
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| 140 | Device Statistics (GP Log 0x04)
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| 141 | Page Offset Size Value Flags Description
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| 142 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 143 | 0x01 0x008 4 17 --- Lifetime Power-On Resets
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| 144 | 0x01 0x010 4 31656 --- Power-on Hours
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| 145 | 0x01 0x018 6 392109796 --- Logical Sectors Written
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| 146 | 0x01 0x020 6 242874062 --- Number of Write Commands
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| 147 | 0x01 0x028 6 164852426 --- Logical Sectors Read
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| 148 | 0x01 0x030 6 628025 --- Number of Read Commands
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| 149 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 150 | 0x07 0x008 1 1 --- Percentage Used Endurance Indicator
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| 151 | |||_ C monitored condition met
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| 152 | ||__ D supports DSN
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| 153 | |___ N normalized value
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| 154 |
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| 155 | Pending Defects log (GP Log 0x0c) not supported
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| 156 |
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| 157 | SATA Phy Event Counters (GP Log 0x11)
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| 158 | ID Size Value Description
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| 159 | 0x0001 4 0 Command failed due to ICRC error
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| 160 | 0x0002 4 0 R_ERR response for data FIS
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| 161 | 0x0005 4 0 R_ERR response for non-data FIS
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| 162 | 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET
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| 163 |
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