Ticket #1990: smartctl-Acer-SA100_480GB-U0302B0.txt

File smartctl-Acer-SA100_480GB-U0302B0.txt, 10.7 KB (added by Andrei Ivanov, 7 weeks ago)
Line 
1C:\>smartctl -t short /dev/sdc
2smartctl 7.5 2025-04-30 r5714 [x86_64-w64-mingw32-w11-b26200] (AppVeyor)
3Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
4
5=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
6Sending command: "Execute SMART Short self-test routine immediately in off-line mode".
7Drive command "Execute SMART Short self-test routine immediately in off-line mode" successful.
8Testing has begun.
9Please wait 2 minutes for test to complete.
10Test will complete after Thu Apr 23 18:08:08 2026 MDT
11Use smartctl -X to abort test.
12
13C:\>
14C:\>smartctl -x -a /dev/sdc
15smartctl 7.5 2025-04-30 r5714 [x86_64-w64-mingw32-w11-b26200] (AppVeyor)
16Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
17
18=== START OF INFORMATION SECTION ===
19Model Family: BIWIN Storage Technology SSDs
20Device Model: Acer SSD SA100 480GB
21Serial Number: ASBA32130200120
22Firmware Version: U0302B0
23User Capacity: 480,103,981,056 bytes [480 GB]
24Sector Size: 512 bytes logical/physical
25Rotation Rate: Solid State Device
26Form Factor: 2.5 inches
27TRIM Command: Available
28Device is: In smartctl database
29ATA Version is: ACS-3 T13/2161-D revision 4
30SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
31Local Time is: Thu Apr 23 18:09:03 2026 MDT
32SMART support is: Available - device has SMART capability.
33SMART support is: Enabled
34AAM feature is: Unavailable
35APM feature is: Disabled
36Rd look-ahead is: Enabled
37Write cache is: Enabled
38DSN feature is: Unavailable
39ATA Security is: Disabled, NOT FROZEN [SEC1]
40
41=== START OF READ SMART DATA SECTION ===
42SMART overall-health self-assessment test result: PASSED
43
44General SMART Values:
45Offline data collection status: (0x02) Offline data collection activity
46 was completed without error.
47 Auto Offline Data Collection: Disabled.
48Self-test execution status: ( 0) The previous self-test routine completed
49 without error or no self-test has ever
50 been run.
51Total time to complete Offline
52data collection: ( 120) seconds.
53Offline data collection
54capabilities: (0x11) SMART execute Offline immediate.
55 No Auto Offline data collection support.
56 Suspend Offline collection upon new
57 command.
58 No Offline surface scan supported.
59 Self-test supported.
60 No Conveyance Self-test supported.
61 No Selective Self-test supported.
62SMART capabilities: (0x0002) Does not save SMART data before
63 entering power-saving mode.
64 Supports SMART auto save timer.
65Error logging capability: (0x01) Error logging supported.
66 General Purpose Logging supported.
67Short self-test routine
68recommended polling time: ( 2) minutes.
69Extended self-test routine
70recommended polling time: ( 10) minutes.
71
72SMART Attributes Data Structure revision number: 1
73Vendor Specific SMART Attributes with Thresholds:
74ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
75 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
76 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
77 9 Power_On_Hours -O--CK 100 100 050 - 11864
78 12 Power_Cycle_Count -O--CK 100 100 050 - 96
79160 Uncorrectable_Sectors -O--CK 100 100 050 - 0
80161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100
81163 Initial_Bad_Block_Count -O--CK 100 100 050 - 19
82164 Total_Erase_Count -O--CK 100 100 050 - 4159
83165 Max_Erase_Count -O--CK 100 100 050 - 49
84166 Min_Erase_Count -O--CK 100 100 050 - 2
85167 Average_Erase_Count -O--CK 100 100 050 - 23
86168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 5050
87169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100
88175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
89176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
90177 Wear_Leveling_Count -O--CK 100 100 050 - 0
91178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0
92181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
93182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
94192 Power-Off_Retract_Count -O--CK 100 100 050 - 25
95194 Device_Temperature -O---K 100 100 050 - 62
96195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
97196 Reallocated_Event_Count -O--CK 100 100 050 - 0
98197 Current_Pending_Sector -O--CK 100 100 050 - 0
99198 Offline_Uncorrectable -O--CK 100 100 050 - 0
100199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 1
101232 Available_Reservd_Space -O--CK 100 100 050 - 100
102241 Total_LBAs_Written ----CK 100 100 050 - 119518
103242 Total_LBAs_Read ----CK 100 100 050 - 118664
104245 Flash_Writes_Sectors -O--CK 100 100 050 - 91239
105 ||||||_ K auto-keep
106 |||||__ C event count
107 ||||___ R error rate
108 |||____ S speed/performance
109 ||_____ O updated online
110 |______ P prefailure warning
111
112General Purpose Log Directory Version 1
113SMART Log Directory Version 1 [multi-sector log support]
114Address Access R/W Size Description
1150x00 GPL,SL R/O 1 Log Directory
1160x01 SL R/O 1 Summary SMART error log
1170x02 SL R/O 1 Comprehensive SMART error log
1180x03 GPL R/O 1 Ext. Comprehensive SMART error log
1190x04 GPL,SL R/O 8 Device Statistics log
1200x06 SL R/O 1 SMART self-test log
1210x07 GPL R/O 1 Extended self-test log
1220x10 GPL R/O 1 NCQ Command Error log
1230x11 GPL R/O 1 SATA Phy Event Counters log
1240x24 GPL R/O 88 Current Device Internal Status Data log
1250x25 GPL R/O 32 Saved Device Internal Status Data log
1260x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
1270x80-0x9f GPL,SL R/W 16 Host vendor specific log
128
129SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
130Device Error Count: 1
131 CR = Command Register
132 FEATR = Features Register
133 COUNT = Count (was: Sector Count) Register
134 LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
135 LH = LBA High (was: Cylinder High) Register ] LBA
136 LM = LBA Mid (was: Cylinder Low) Register ] Register
137 LL = LBA Low (was: Sector Number) Register ]
138 DV = Device (was: Device/Head) Register
139 DC = Device Control Register
140 ER = Error register
141 ST = Status register
142Powered_Up_Time is measured from power on, and printed as
143DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
144SS=sec, and sss=millisec. It "wraps" after 49.710 days.
145
146Error 1 [0] log entry is empty
147SMART Error Log Version: 1
148ATA Error Count: 1
149 CR = Command Register [HEX]
150 FR = Features Register [HEX]
151 SC = Sector Count Register [HEX]
152 SN = Sector Number Register [HEX]
153 CL = Cylinder Low Register [HEX]
154 CH = Cylinder High Register [HEX]
155 DH = Device/Head Register [HEX]
156 DC = Device Command Register [HEX]
157 ER = Error register [HEX]
158 ST = Status register [HEX]
159Powered_Up_Time is measured from power on, and printed as
160DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
161SS=sec, and sss=millisec. It "wraps" after 49.710 days.
162
163Error -3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
164 When the command that caused the error occurred, the device was active or idle.
165
166 After command completion occurred, registers were:
167 ER ST SC SN CL CH DH
168 -- -- -- -- -- -- --
169 00 00 00 00 00 00 00 at LBA = 0x00000000 = 0
170
171 Commands leading to the command that caused the error were:
172 CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
173 -- -- -- -- -- -- -- -- ---------------- --------------------
174 60 10 00 00 00 00 40 00 00:00:00.000 READ FPDMA QUEUED
175 b0 d4 00 01 4f c2 00 00 00:00:00.000 SMART EXECUTE OFF-LINE IMMEDIATE
176 ec 00 01 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE
177 b0 d0 01 00 4f c2 00 00 00:00:00.000 SMART READ DATA
178 ec 00 01 00 00 00 00 00 00:00:00.000 IDENTIFY DEVICE
179
180SMART Extended Self-test Log Version: 1 (1 sectors)
181Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
182# 1 Short offline Completed without error 00% 11864 -
183# 2 Short offline Completed without error 00% 11863 -
184# 3 Short offline Completed without error 00% 11863 -
185
186SMART Self-test log structure revision number 1
187Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
188# 1 Short offline Completed without error 00% 11864 -
189# 2 Short offline Completed without error 00% 11863 -
190# 3 Short offline Completed without error 00% 11863 -
191
192Selective Self-tests/Logging not supported
193
194SCT Commands not supported
195
196Device Statistics (GP Log 0x04)
197Page Offset Size Value Flags Description
1980x01 ===== = = === == General Statistics (rev 1) ==
1990x01 0x008 4 96 --- Lifetime Power-On Resets
2000x01 0x010 4 11864 --- Power-on Hours
2010x01 0x018 6 3537776140 --- Logical Sectors Written
2020x01 0x020 6 167027833 --- Number of Write Commands
2030x01 0x028 6 3481845869 --- Logical Sectors Read
2040x01 0x030 6 68683084 --- Number of Read Commands
2050x07 ===== = = === == Solid State Device Statistics (rev 1) ==
2060x07 0x008 1 0 --- Percentage Used Endurance Indicator
207 |||_ C monitored condition met
208 ||__ D supports DSN
209 |___ N normalized value
210
211Pending Defects log (GP Log 0x0c) not supported
212
213SATA Phy Event Counters (GP Log 0x11)
214ID Size Value Description
2150x0001 4 0 Command failed due to ICRC error
2160x0002 4 0 R_ERR response for data FIS
2170x0005 4 0 R_ERR response for non-data FIS
2180x000a 4 0 Device-to-host register FISes sent due to a COMRESET
219
220
221C:\>