Ticket #1945: smartctl-Intenso-M.2_SSD_HIGH.txt

File smartctl-Intenso-M.2_SSD_HIGH.txt, 8.7 KB (added by Cmdr_Zod, 7 months ago)
Line 
1smartctl 7.4 2023-08-01 r5530 [x86_64-linux-6.12.12+bpo-amd64] (local build)
2Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org
3
4=== START OF INFORMATION SECTION ===
5Device Model: SSD 120GB
6Serial Number: TP18070000029
7Firmware Version: R0529A
8User Capacity: 120,034,123,776 bytes [120 GB]
9Sector Size: 512 bytes logical/physical
10Rotation Rate: Solid State Device
11Form Factor: 2.5 inches
12TRIM Command: Available, deterministic, zeroed
13Device is: Not in smartctl database 7.3/5671
14ATA Version is: ACS-2 T13/2015-D revision 3
15SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
16Local Time is: Wed Apr 2 20:04:31 2025 CEST
17SMART support is: Available - device has SMART capability.
18SMART support is: Enabled
19AAM feature is: Unavailable
20APM level is: 128 (minimum power consumption without standby)
21Rd look-ahead is: Enabled
22Write cache is: Enabled
23DSN feature is: Unavailable
24ATA Security is: Disabled, NOT FROZEN [SEC1]
25Wt Cache Reorder: Unavailable
26
27=== START OF READ SMART DATA SECTION ===
28SMART Status not supported: Incomplete response, ATA output registers missing
29SMART overall-health self-assessment test result: PASSED
30Warning: This result is based on an Attribute check.
31
32General SMART Values:
33Offline data collection status: (0x00) Offline data collection activity
34 was never started.
35 Auto Offline Data Collection: Disabled.
36Self-test execution status: ( 0) The previous self-test routine completed
37 without error or no self-test has ever
38 been run.
39Total time to complete Offline
40data collection: ( 120) seconds.
41Offline data collection
42capabilities: (0x11) SMART execute Offline immediate.
43 No Auto Offline data collection support.
44 Suspend Offline collection upon new
45 command.
46 No Offline surface scan supported.
47 Self-test supported.
48 No Conveyance Self-test supported.
49 No Selective Self-test supported.
50SMART capabilities: (0x0002) Does not save SMART data before
51 entering power-saving mode.
52 Supports SMART auto save timer.
53Error logging capability: (0x01) Error logging supported.
54 General Purpose Logging supported.
55Short self-test routine
56recommended polling time: ( 2) minutes.
57Extended self-test routine
58recommended polling time: ( 10) minutes.
59
60SMART Attributes Data Structure revision number: 1
61Vendor Specific SMART Attributes with Thresholds:
62ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
63 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
64 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
65 9 Power_On_Hours -O--CK 100 100 050 - 2102
66 12 Power_Cycle_Count -O--CK 100 100 050 - 1878
67160 Unknown_Attribute -O--CK 100 100 050 - 0
68161 Unknown_Attribute PO--CK 100 100 050 - 100
69163 Unknown_Attribute -O--CK 100 100 050 - 14
70164 Unknown_Attribute -O--CK 100 100 050 - 64404
71165 Unknown_Attribute -O--CK 100 100 050 - 83
72166 Unknown_Attribute -O--CK 100 100 050 - 35
73167 Unknown_Attribute -O--CK 100 100 050 - 50
74168 Unknown_Attribute -O--CK 100 100 050 - 1500
75169 Unknown_Attribute -O--CK 100 100 050 - 97
76175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
77176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
78177 Wear_Leveling_Count -O--CK 100 100 050 - 12954
79178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0
80181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
81182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
82192 Power-Off_Retract_Count -O--CK 100 100 050 - 129
83194 Temperature_Celsius -O---K 100 100 050 - 45
84195 Hardware_ECC_Recovered -O--CK 100 100 050 - 51165
85196 Reallocated_Event_Count -O--CK 100 100 050 - 0
86197 Current_Pending_Sector -O--CK 100 100 050 - 0
87198 Offline_Uncorrectable -O--CK 100 100 050 - 0
88199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 5
89232 Available_Reservd_Space -O--CK 100 100 050 - 100
90241 Total_LBAs_Written ----CK 100 100 050 - 295575
91242 Total_LBAs_Read ----CK 100 100 050 - 439946
92245 Unknown_Attribute -O--CK 100 100 050 - 193200
93 ||||||_ K auto-keep
94 |||||__ C event count
95 ||||___ R error rate
96 |||____ S speed/performance
97 ||_____ O updated online
98 |______ P prefailure warning
99
100General Purpose Log Directory Version 1
101SMART Log Directory Version 1 [multi-sector log support]
102Address Access R/W Size Description
1030x00 GPL,SL R/O 1 Log Directory
1040x01 SL R/O 1 Summary SMART error log
1050x02 SL R/O 1 Comprehensive SMART error log
1060x03 GPL R/O 1 Ext. Comprehensive SMART error log
1070x04 GPL,SL R/O 8 Device Statistics log
1080x06 SL R/O 1 SMART self-test log
1090x07 GPL R/O 1 Extended self-test log
1100x10 GPL R/O 1 NCQ Command Error log
1110x11 GPL R/O 1 SATA Phy Event Counters log
1120x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
1130x80-0x9f GPL,SL R/W 16 Host vendor specific log
1140xde GPL VS 8 Device vendor specific log
115
116SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
117Device Error Count: 7 (device log contains only the most recent 4 errors)
118 CR = Command Register
119 FEATR = Features Register
120 COUNT = Count (was: Sector Count) Register
121 LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
122 LH = LBA High (was: Cylinder High) Register ] LBA
123 LM = LBA Mid (was: Cylinder Low) Register ] Register
124 LL = LBA Low (was: Sector Number) Register ]
125 DV = Device (was: Device/Head) Register
126 DC = Device Control Register
127 ER = Error register
128 ST = Status register
129Powered_Up_Time is measured from power on, and printed as
130DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
131SS=sec, and sss=millisec. It "wraps" after 49.710 days.
132
133Error 7 [2] log entry is empty
134Error 6 [1] log entry is empty
135Error 5 [0] log entry is empty
136Error 4 [3] occurred at disk power-on lifetime: 0 hours (0 days + 0 hours)
137 When the command that caused the error occurred, the device was active or idle.
138
139 After command completion occurred, registers were:
140 ER -- ST COUNT LBA_48 LH LM LL DV DC
141 -- -- -- == -- == == == -- -- -- -- --
142 00 -- 00 00 00 00 00 00 00 00 00 00 00
143
144 Commands leading to the command that caused the error were:
145 CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
146 -- == -- == -- == == == -- -- -- -- -- --------------- --------------------
147 b0 00 d1 01 01 00 00 4f 00 c2 01 00 00 00:00:00.000 SMART READ ATTRIBUTE THRESHOLDS [OBS-4]
148 2f 00 00 01 01 00 00 00 00 00 03 00 00 00:00:00.000 READ LOG EXT
149 2f 00 00 01 01 00 00 00 00 00 00 00 00 00:00:00.000 READ LOG EXT
150 b0 00 d5 01 01 00 00 4f 00 c2 00 00 00 00:00:00.000 SMART READ LOG
151 b0 00 da 00 00 00 00 4f 00 c2 00 00 00 00:00:00.000 SMART RETURN STATUS
152
153SMART Extended Self-test Log Version: 1 (1 sectors)
154Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
155# 1 Short offline Completed without error 00% 2102 -
156
157Selective Self-tests/Logging not supported
158
159SCT Commands not supported
160
161Device Statistics (GP Log 0x04)
162Page Offset Size Value Flags Description
1630x01 ===== = = === == General Statistics (rev 1) ==
1640x01 0x008 4 1878 --- Lifetime Power-On Resets
1650x01 0x010 4 2102 --- Power-on Hours
1660x01 0x018 6 2190996142 --- Logical Sectors Written
1670x01 0x020 6 243824767 --- Number of Write Commands
1680x01 0x028 6 3062523409 --- Logical Sectors Read
1690x01 0x030 6 437092505 --- Number of Read Commands
1700x07 ===== = = === == Solid State Device Statistics (rev 1) ==
1710x07 0x008 1 3 --- Percentage Used Endurance Indicator
172 |||_ C monitored condition met
173 ||__ D supports DSN
174 |___ N normalized value
175
176Pending Defects log (GP Log 0x0c) not supported
177
178SATA Phy Event Counters (GP Log 0x11)
179ID Size Value Description
1800x0001 4 0 Command failed due to ICRC error
1810x0002 4 0 R_ERR response for data FIS
1820x0005 4 0 R_ERR response for non-data FIS
1830x000a 4 1 Device-to-host register FISes sent due to a COMRESET
184