1 | smartctl 7.1 2020-04-05 r5049 [aarch64-linux-4.18.0-305.3.1.el8.aarch64] (local build)
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2 | Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
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3 |
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4 | === START OF INFORMATION SECTION ===
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5 | Device Model: SK HYNIX SE5110 1920GB ZIRCON LITE 3DTLC
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6 | Serial Number: 1_4-COM54-348C
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7 | LU WWN Device Id: 5 536444 241393341
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8 | Firmware Version: 410A5Z00
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9 | User Capacity: 1,920,383,410,176 bytes [1.92 TB]
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10 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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11 | Rotation Rate: Solid State Device
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12 | Form Factor: 2.5 inches
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13 | Device is: Not in smartctl database [for details use: -P showall]
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14 | ATA Version is: ACS-4 (minor revision not indicated)
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15 | SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s)
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16 | Local Time is: Mon Nov 27 20:19:12 2023 EST
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17 | SMART support is: Available - device has SMART capability.
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18 | SMART support is: Enabled
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19 | AAM feature is: Unavailable
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20 | APM feature is: Unavailable
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21 | Rd look-ahead is: Enabled
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22 | Write cache is: Enabled
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23 | DSN feature is: Unavailable
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24 | ATA Security is: Disabled, NOT FROZEN [SEC1]
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25 | Wt Cache Reorder: Enabled
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26 |
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27 | === START OF READ SMART DATA SECTION ===
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28 | SMART overall-health self-assessment test result: PASSED
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29 |
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30 | General SMART Values:
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31 | Offline data collection status: (0x02) Offline data collection activity
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32 | was completed without error.
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33 | Auto Offline Data Collection: Disabled.
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34 | Self-test execution status: ( 0) The previous self-test routine completed
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35 | without error or no self-test has ever
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36 | been run.
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37 | Total time to complete Offline
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38 | data collection: ( 110) seconds.
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39 | Offline data collection
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40 | capabilities: (0x79) SMART execute Offline immediate.
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41 | No Auto Offline data collection support.
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42 | Suspend Offline collection upon new
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43 | command.
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44 | Offline surface scan supported.
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45 | Self-test supported.
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46 | Conveyance Self-test supported.
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47 | Selective Self-test supported.
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48 | SMART capabilities: (0x0002) Does not save SMART data before
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49 | entering power-saving mode.
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50 | Supports SMART auto save timer.
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51 | Error logging capability: (0x01) Error logging supported.
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52 | General Purpose Logging supported.
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53 | Short self-test routine
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54 | recommended polling time: ( 2) minutes.
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55 | Extended self-test routine
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56 | recommended polling time: ( 16) minutes.
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57 | Conveyance self-test routine
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58 | recommended polling time: ( 2) minutes.
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59 | SCT capabilities: (0x003d) SCT Status supported.
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60 | SCT Error Recovery Control supported.
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61 | SCT Feature Control supported.
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62 | SCT Data Table supported.
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63 |
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64 | SMART Attributes Data Structure revision number: 0
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65 | Vendor Specific SMART Attributes with Thresholds:
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66 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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67 | 1 Raw_Read_Error_Rate -OSR-- 100 100 006 - 0
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68 | 5 Reallocated_Sector_Ct PO--CK 100 100 002 - 0
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69 | 9 Power_On_Hours -O--CK 100 100 000 - 332
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70 | 12 Power_Cycle_Count -O--CK 100 100 000 - 139
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71 | 13 Read_Soft_Error_Rate -OSR-K 100 100 000 - 0
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72 | 173 Unknown_Attribute -O--CK 100 100 000 - 63
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73 | 174 Unknown_Attribute ----CK 100 100 000 - 139
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74 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 12
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75 | 179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 002 - 0
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76 | 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0
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77 | 182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0
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78 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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79 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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80 | 194 Temperature_Celsius -O---- 060 055 000 - 40 (Min/Max 31/45)
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81 | 195 Hardware_ECC_Recovered -O-RC- 100 100 000 - 0
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82 | 197 Current_Pending_Sector -O--CK 100 100 000 - 0
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83 | 198 Offline_Uncorrectable ----C- 100 100 000 - 0
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84 | 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
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85 | 202 Unknown_SSD_Attribute PO--CK 100 100 050 - 0
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86 | 203 Run_Out_Cancel PO--CK 100 100 050 - 0
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87 | 231 Temperature_Celsius PO--CK 100 100 001 - 100
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88 | 235 Unknown_Attribute -O--CK 100 100 000 - 23630
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89 | 241 Total_LBAs_Written -O--CK 100 100 000 - 24670
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90 | 242 Total_LBAs_Read -O--CK 100 100 000 - 37295
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91 | ||||||_ K auto-keep
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92 | |||||__ C event count
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93 | ||||___ R error rate
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94 | |||____ S speed/performance
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95 | ||_____ O updated online
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96 | |______ P prefailure warning
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97 |
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98 | General Purpose Log Directory Version 1
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99 | SMART Log Directory Version 1 [multi-sector log support]
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100 | Address Access R/W Size Description
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101 | 0x00 GPL,SL R/O 1 Log Directory
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102 | 0x01 SL R/O 1 Summary SMART error log
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103 | 0x02 SL R/O 4 Comprehensive SMART error log
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104 | 0x03 GPL R/O 5 Ext. Comprehensive SMART error log
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105 | 0x04 GPL,SL R/O 8 Device Statistics log
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106 | 0x06 SL R/O 1 SMART self-test log
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107 | 0x07 GPL R/O 2 Extended self-test log
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108 | 0x09 SL R/W 1 Selective self-test log
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109 | 0x10 GPL R/O 1 NCQ Command Error log
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110 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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111 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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112 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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113 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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114 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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115 |
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116 | SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
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117 | No Errors Logged
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118 |
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119 | SMART Extended Self-test Log Version: 1 (2 sectors)
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120 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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121 | # 1 Short offline Completed without error 00% 332 -
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122 |
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123 | SMART Selective self-test log data structure revision number 1
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124 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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125 | 1 0 0 Not_testing
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126 | 2 0 0 Not_testing
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127 | 3 0 0 Not_testing
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128 | 4 0 0 Not_testing
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129 | 5 0 0 Not_testing
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130 | Selective self-test flags (0x0):
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131 | After scanning selected spans, do NOT read-scan remainder of disk.
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132 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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133 |
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134 | SCT Status Version: 3
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135 | SCT Version (vendor specific): 1 (0x0001)
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136 | Device State: Active (0)
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137 | Current Temperature: 40 Celsius
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138 | Power Cycle Min/Max Temperature: 39/40 Celsius
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139 | Lifetime Min/Max Temperature: 31/45 Celsius
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140 | Specified Max Operating Temperature: 65 Celsius
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141 | Under/Over Temperature Limit Count: 0/0
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142 | SMART Status: 0xc24f (PASSED)
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143 |
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144 | SCT Temperature History Version: 2
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145 | Temperature Sampling Period: 1 minute
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146 | Temperature Logging Interval: 1 minute
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147 | Min/Max recommended Temperature: -20/65 Celsius
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148 | Min/Max Temperature Limit: -20/125 Celsius
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149 | Temperature History Size (Index): 192 (134)
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150 |
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151 | Index Estimated Time Temperature Celsius
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152 | 135 2023-11-27 17:08 33 **************
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153 | ... ..(164 skipped). .. **************
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154 | 108 2023-11-27 19:53 33 **************
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155 | 109 2023-11-27 19:54 ? -
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156 | 110 2023-11-27 19:55 34 ***************
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157 | 111 2023-11-27 19:56 ? -
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158 | 112 2023-11-27 19:57 37 ******************
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159 | 113 2023-11-27 19:58 38 *******************
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160 | ... ..( 4 skipped). .. *******************
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161 | 118 2023-11-27 20:03 38 *******************
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162 | 119 2023-11-27 20:04 ? -
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163 | 120 2023-11-27 20:05 38 *******************
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164 | 121 2023-11-27 20:06 39 ********************
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165 | 122 2023-11-27 20:07 38 *******************
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166 | ... ..( 8 skipped). .. *******************
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167 | 131 2023-11-27 20:16 38 *******************
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168 | 132 2023-11-27 20:17 ? -
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169 | 133 2023-11-27 20:18 39 ********************
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170 | 134 2023-11-27 20:19 40 *********************
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171 |
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172 | SCT Error Recovery Control:
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173 | Read: 80 (8.0 seconds)
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174 | Write: 80 (8.0 seconds)
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175 |
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176 | Device Statistics (GP Log 0x04)
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177 | Page Offset Size Value Flags Description
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178 | 0x01 ===== = = === == General Statistics (rev 1) ==
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179 | 0x01 0x008 4 139 --- Lifetime Power-On Resets
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180 | 0x01 0x010 4 332 --- Power-on Hours
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181 | 0x01 0x018 6 49556223485 --- Logical Sectors Written
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182 | 0x01 0x020 6 364155389 --- Number of Write Commands
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183 | 0x01 0x028 6 78215356170 --- Logical Sectors Read
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184 | 0x01 0x030 6 2503084614 --- Number of Read Commands
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185 | 0x01 0x038 6 1195200000 --- Date and Time TimeStamp
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186 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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187 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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188 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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189 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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190 | 0x05 0x008 1 40 --- Current Temperature
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191 | 0x05 0x010 1 - --- Average Short Term Temperature
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192 | 0x05 0x018 1 - --- Average Long Term Temperature
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193 | 0x05 0x020 1 45 --- Highest Temperature
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194 | 0x05 0x028 1 31 --- Lowest Temperature
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195 | 0x05 0x030 1 37 --- Highest Average Short Term Temperature
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196 | 0x05 0x038 1 33 --- Lowest Average Short Term Temperature
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197 | 0x05 0x040 1 - --- Highest Average Long Term Temperature
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198 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature
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199 | 0x05 0x050 4 0 --- Time in Over-Temperature
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200 | 0x05 0x058 1 65 --- Specified Maximum Operating Temperature
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201 | 0x05 0x060 4 0 --- Time in Under-Temperature
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202 | 0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
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203 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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204 | 0x06 0x008 4 2394 --- Number of Hardware Resets
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205 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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206 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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207 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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208 | |||_ C monitored condition met
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209 | ||__ D supports DSN
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210 | |___ N normalized value
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211 |
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212 | Pending Defects log (GP Log 0x0c) not supported
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213 |
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214 | SATA Phy Event Counters (GP Log 0x11)
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215 | ID Size Value Description
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216 | 0x0001 2 0 Command failed due to ICRC error
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217 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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218 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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219 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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220 | 0x000a 2 0 Device-to-host register FISes sent due to a COMRESET
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221 | 0x000b 2 0 CRC errors within host-to-device FIS
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222 | 0x000d 2 0 Non-CRC errors within host-to-device FIS
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223 |
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