Ticket #1721: smartctl-Sandisk-SDSA6DM-016G-1006.txt

File smartctl-Sandisk-SDSA6DM-016G-1006.txt, 8.6 KB (added by Cmdr_Zod, 15 months ago)
Line 
1smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.10.0-21-amd64] (local build)
2Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
3
4=== START OF INFORMATION SECTION ===
5Device Model: SanDisk SDSA6DM-016G-1006
6Serial Number: 143038402906
7LU WWN Device Id: 5 001b44 c5955cd5a
8Firmware Version: U221006
9User Capacity: 16,013,942,784 bytes [16.0 GB]
10Sector Size: 512 bytes logical/physical
11Rotation Rate: Solid State Device
12Form Factor: 1.8 inches
13TRIM Command: Available, deterministic
14Device is: Not in smartctl database [for details use: -P showall]
15ATA Version is: ACS-2 T13/2015-D revision 3
16SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
17Local Time is: Fri Apr 28 14:19:05 2023 CEST
18SMART support is: Available - device has SMART capability.
19SMART support is: Enabled
20AAM feature is: Unavailable
21APM feature is: Disabled
22Rd look-ahead is: Enabled
23Write cache is: Enabled
24DSN feature is: Unavailable
25ATA Security is: Disabled, NOT FROZEN [SEC1]
26Wt Cache Reorder: Unavailable
27
28=== START OF READ SMART DATA SECTION ===
29SMART Status command failed: scsi error unsupported scsi opcode
30SMART overall-health self-assessment test result: PASSED
31Warning: This result is based on an Attribute check.
32
33General SMART Values:
34Offline data collection status: (0x00) Offline data collection activity
35 was never started.
36 Auto Offline Data Collection: Disabled.
37Self-test execution status: ( 0) The previous self-test routine completed
38 without error or no self-test has ever
39 been run.
40Total time to complete Offline
41data collection: ( 120) seconds.
42Offline data collection
43capabilities: (0x51) SMART execute Offline immediate.
44 No Auto Offline data collection support.
45 Suspend Offline collection upon new
46 command.
47 No Offline surface scan supported.
48 Self-test supported.
49 No Conveyance Self-test supported.
50 Selective Self-test supported.
51SMART capabilities: (0x0003) Saves SMART data before entering
52 power-saving mode.
53 Supports SMART auto save timer.
54Error logging capability: (0x01) Error logging supported.
55 General Purpose Logging supported.
56Short self-test routine
57recommended polling time: ( 2) minutes.
58Extended self-test routine
59recommended polling time: ( 3) minutes.
60
61SMART Attributes Data Structure revision number: 1
62Vendor Specific SMART Attributes with Thresholds:
63ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
64 1 Raw_Read_Error_Rate POSR-K 100 100 002 - 0
65 5 Reallocated_Sector_Ct PO--CK 100 100 002 - 0
66 9 Power_On_Hours -O--CK 100 100 000 - 335
67 12 Power_Cycle_Count -O--CK 100 100 000 - 647
68165 Unknown_Attribute -O---- 100 100 000 - 1558164
69170 Unknown_Attribute PO--CK 100 100 005 - 0
70171 Unknown_Attribute -O---- 100 100 000 - 0
71172 Unknown_Attribute -O---- 100 100 000 - 0
72173 Unknown_Attribute -O---- 100 100 000 - 780
73174 Unknown_Attribute -O---- 100 100 000 - 48
74184 End-to-End_Error PO--CK 100 100 097 - 0
75187 Reported_Uncorrect -O--CK 100 100 000 - 0
76188 Command_Timeout -O--CK 100 100 000 - 0
77194 Temperature_Celsius -O---K 065 035 000 - 35 (Min/Max 16/47)
78198 Offline_Uncorrectable ----CK 100 100 000 - 0
79199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0
80230 Unknown_SSD_Attribute -O---- 100 100 000 - 2600
81234 Unknown_Attribute -O---- 100 100 000 - 1315
82241 Total_LBAs_Written -O---- 100 100 000 - 11597794947
83242 Total_LBAs_Read -O---- 100 100 000 - 6520432351
84 ||||||_ K auto-keep
85 |||||__ C event count
86 ||||___ R error rate
87 |||____ S speed/performance
88 ||_____ O updated online
89 |______ P prefailure warning
90
91General Purpose Log Directory Version 1
92SMART Log Directory Version 1 [multi-sector log support]
93Address Access R/W Size Description
940x00 GPL,SL R/O 1 Log Directory
950x01 GPL,SL R/O 1 Summary SMART error log
960x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log
970x04 GPL,SL R/O 8 Device Statistics log
980x06 GPL,SL R/O 1 SMART self-test log
990x09 GPL,SL R/W 1 Selective self-test log
1000x10 GPL,SL R/O 1 NCQ Command Error log
1010x11 GPL,SL R/O 1 SATA Phy Event Counters log
1020x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
1030x80-0x9f GPL,SL R/W 16 Host vendor specific log
1040xa1 GPL,SL VS 1 Device vendor specific log
1050xa2 GPL,SL VS 2 Device vendor specific log
1060xa3 GPL,SL VS 1 Device vendor specific log
1070xa6-0xa7 GPL,SL VS 255 Device vendor specific log
108
109Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum.
110SMART Extended Comprehensive Error Log Version: 1 (16 sectors)
111No Errors Logged
112
113SMART Extended Self-test Log (GP Log 0x07) not supported
114
115SMART Self-test log structure revision number 1
116Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
117# 1 Short offline Completed without error 00% 335 -
118# 2 Short offline Completed without error 00% 110 -
119# 3 Short offline Completed without error 00% 106 -
120# 4 Short offline Completed without error 00% 102 -
121# 5 Short offline Completed without error 00% 99 -
122# 6 Short offline Completed without error 00% 96 -
123# 7 Short offline Completed without error 00% 94 -
124# 8 Short offline Completed without error 00% 88 -
125# 9 Short offline Completed without error 00% 0 -
126
127SMART Selective self-test log data structure revision number 1
128 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
129 1 0 0 Not_testing
130 2 0 0 Not_testing
131 3 0 0 Not_testing
132 4 0 0 Not_testing
133 5 0 0 Not_testing
134Selective self-test flags (0x0):
135 After scanning selected spans, do NOT read-scan remainder of disk.
136If Selective self-test is pending on power-up, resume after 0 minute delay.
137
138SCT Commands not supported
139
140Device Statistics (GP Log 0x04)
141Page Offset Size Value Flags Description
1420x05 ===== = = === == Temperature Statistics (rev 1) ==
1430x05 0x008 1 35 --- Current Temperature
1440x05 0x010 1 - --- Average Short Term Temperature
1450x05 0x018 1 - --- Average Long Term Temperature
1460x05 0x020 1 46 --- Highest Temperature
1470x05 0x028 1 22 --- Lowest Temperature
1480x05 0x030 1 - --- Highest Average Short Term Temperature
1490x05 0x038 1 - --- Lowest Average Short Term Temperature
1500x05 0x040 1 - --- Highest Average Long Term Temperature
1510x05 0x048 1 - --- Lowest Average Long Term Temperature
1520x05 0x050 4 0 --- Time in Over-Temperature
1530x05 0x058 1 95 --- Specified Maximum Operating Temperature
1540x05 0x060 4 0 --- Time in Under-Temperature
1550x05 0x068 1 0 --- Specified Minimum Operating Temperature
1560x07 ===== = = === == Solid State Device Statistics (rev 1) ==
1570x07 0x008 1 26 N-- Percentage Used Endurance Indicator
158 |||_ C monitored condition met
159 ||__ D supports DSN
160 |___ N normalized value
161
162Pending Defects log (GP Log 0x0c) not supported
163
164SATA Phy Event Counters (GP Log 0x11)
165ID Size Value Description
1660x0003 2 0 R_ERR response for device-to-host data FIS
1670x0004 2 0 R_ERR response for host-to-device data FIS
1680x0006 2 0 R_ERR response for device-to-host non-data FIS
1690x0007 2 0 R_ERR response for host-to-device non-data FIS
1700x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy
1710x000a 2 1 Device-to-host register FISes sent due to a COMRESET
1720x000f 2 0 R_ERR response for host-to-device data FIS, CRC
1730x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
1740x0001 2 0 Command failed due to ICRC error
175