| 1 | smartctl 7.2 2020-12-30 r5155 [Darwin 17.7.0 x86_64] (sf-7.2-1)
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| 2 | Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: MKNSSDTR128GB-3DL
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| 6 | Serial Number: MK17082910038F261
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| 7 | LU WWN Device Id: 5 888914 10038f261
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| 8 | Firmware Version: Q0616B0
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| 9 | User Capacity: 128,035,676,160 bytes [128 GB]
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| 10 | Sector Size: 512 bytes logical/physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: 2.5 inches
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| 13 | TRIM Command: Available, deterministic, zeroed
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| 14 | Device is: Not in smartctl database [for details use: -P showall]
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| 15 | ATA Version is: ACS-2 T13/2015-D revision 3
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| 16 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
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| 17 | Local Time is: Fri Apr 15 20:00:53 2022 CDT
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| 18 | SMART support is: Available - device has SMART capability.
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| 19 | SMART support is: Enabled
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| 20 | AAM feature is: Unavailable
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| 21 | APM level is: 128 (minimum power consumption without standby)
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| 22 | Rd look-ahead is: Enabled
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| 23 | Write cache is: Enabled
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| 24 | DSN feature is: Unavailable
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| 25 | ATA Security is: Disabled, frozen [SEC2]
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| 26 | Wt Cache Reorder: Unavailable
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| 27 |
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| 28 | === START OF READ SMART DATA SECTION ===
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| 29 | SMART overall-health self-assessment test result: PASSED
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| 30 |
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| 31 | General SMART Values:
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| 32 | Offline data collection status: (0x02) Offline data collection activity
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| 33 | was completed without error.
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| 34 | Auto Offline Data Collection: Disabled.
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| 35 | Self-test execution status: ( 0) The previous self-test routine completed
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| 36 | without error or no self-test has ever
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| 37 | been run.
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| 38 | Total time to complete Offline
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| 39 | data collection: ( 120) seconds.
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| 40 | Offline data collection
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| 41 | capabilities: (0x11) SMART execute Offline immediate.
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| 42 | No Auto Offline data collection support.
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| 43 | Suspend Offline collection upon new
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| 44 | command.
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| 45 | No Offline surface scan supported.
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| 46 | Self-test supported.
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| 47 | No Conveyance Self-test supported.
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| 48 | No Selective Self-test supported.
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| 49 | SMART capabilities: (0x0002) Does not save SMART data before
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| 50 | entering power-saving mode.
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| 51 | Supports SMART auto save timer.
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| 52 | Error logging capability: (0x01) Error logging supported.
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| 53 | General Purpose Logging supported.
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| 54 | Short self-test routine
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| 55 | recommended polling time: ( 2) minutes.
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| 56 | Extended self-test routine
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| 57 | recommended polling time: ( 10) minutes.
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| 58 |
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| 59 | SMART Attributes Data Structure revision number: 1
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| 60 | Vendor Specific SMART Attributes with Thresholds:
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| 61 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 62 | 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
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| 63 | 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 2
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| 64 | 9 Power_On_Hours -O--CK 100 100 050 - 207
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| 65 | 12 Power_Cycle_Count -O--CK 100 100 050 - 438
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| 66 | 160 Unknown_Attribute -O--CK 100 100 050 - 0
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| 67 | 161 Unknown_Attribute PO--CK 100 100 050 - 97
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| 68 | 163 Unknown_Attribute -O--CK 100 100 050 - 6
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| 69 | 164 Unknown_Attribute -O--CK 100 100 050 - 17952
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| 70 | 165 Unknown_Attribute -O--CK 100 100 050 - 75
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| 71 | 166 Unknown_Attribute -O--CK 100 100 050 - 2
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| 72 | 167 Unknown_Attribute -O--CK 100 100 050 - 33
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| 73 | 168 Unknown_Attribute -O--CK 100 100 050 - 7000
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| 74 | 169 Unknown_Attribute -O--CK 100 100 050 - 100
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| 75 | 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 76 | 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 77 | 177 Wear_Leveling_Count -O--CK 100 100 050 - 0
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| 78 | 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 2
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| 79 | 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
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| 80 | 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
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| 81 | 192 Power-Off_Retract_Count -O--CK 100 100 050 - 332
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| 82 | 194 Temperature_Celsius -O---K 100 100 050 - 37
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| 83 | 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 68061
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| 84 | 196 Reallocated_Event_Count -O--CK 100 100 050 - 0
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| 85 | 197 Current_Pending_Sector -O--CK 100 100 050 - 2
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| 86 | 198 Offline_Uncorrectable -O--CK 100 100 050 - 0
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| 87 | 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
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| 88 | 232 Available_Reservd_Space -O--CK 100 100 050 - 97
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| 89 | 241 Total_LBAs_Written ----CK 100 100 050 - 19971
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| 90 | 242 Total_LBAs_Read ----CK 100 100 050 - 27920
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| 91 | 245 Unknown_Attribute -O--CK 100 100 050 - 31475
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| 92 | ||||||_ K auto-keep
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| 93 | |||||__ C event count
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| 94 | ||||___ R error rate
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| 95 | |||____ S speed/performance
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| 96 | ||_____ O updated online
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| 97 | |______ P prefailure warning
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| 98 |
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| 99 | ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
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| 100 | Read GP Log Directory failed
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| 101 |
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| 102 | SMART Log Directory Version 1 [multi-sector log support]
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| 103 | Address Access R/W Size Description
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| 104 | 0x00 SL R/O 1 Log Directory
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| 105 | 0x01 SL R/O 1 Summary SMART error log
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| 106 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 107 | 0x04 SL R/O 8 Device Statistics log
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| 108 | 0x06 SL R/O 1 SMART self-test log
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| 109 | 0x30 SL R/O 9 IDENTIFY DEVICE data log
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| 110 | 0x80-0x9f SL R/W 16 Host vendor specific log
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| 111 |
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| 112 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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| 113 |
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| 114 | SMART Error Log Version: 1
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| 115 | No Errors Logged
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| 116 |
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| 117 | SMART Extended Self-test Log (GP Log 0x07) not supported
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| 118 |
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| 119 | SMART Self-test log structure revision number 1
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| 120 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 121 | # 1 Short offline Completed without error 00% 207 -
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| 122 |
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| 123 | Selective Self-tests/Logging not supported
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| 124 |
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| 125 | SCT Commands not supported
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| 126 |
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| 127 | Device Statistics (SMART Log 0x04)
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| 128 | Page Offset Size Value Flags Description
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| 129 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 130 | 0x01 0x008 4 438 --- Lifetime Power-On Resets
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| 131 | 0x01 0x010 4 207 --- Power-on Hours
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| 132 | 0x01 0x018 6 1308854260 --- Logical Sectors Written
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| 133 | 0x01 0x020 6 17237121 --- Number of Write Commands
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| 134 | 0x01 0x028 6 1829826364 --- Logical Sectors Read
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| 135 | 0x01 0x030 6 35336856 --- Number of Read Commands
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| 136 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 137 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 138 | |||_ C monitored condition met
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| 139 | ||__ D supports DSN
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| 140 | |___ N normalized value
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| 141 |
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| 142 | Pending Defects log (GP Log 0x0c) not supported
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| 143 |
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| 144 | ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
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| 145 | Read SATA Phy Event Counters failed
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| 146 |
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