| 1 | smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE-p9 amd64] (local build)
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| 2 | Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SHGS31-1000GS-2
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| 6 | Firmware Version: 90000Q00
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| 7 | User Capacity: 1,000,204,886,016 bytes [1.00 TB]
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| 8 | Sector Sizes: 512 bytes logical, 4096 bytes physical
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| 9 | Rotation Rate: Solid State Device
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| 10 | Form Factor: 2.5 inches
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| 11 | TRIM Command: Available, deterministic
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| 12 | Device is: Not in smartctl database [for details use: -P showall]
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| 13 | ATA Version is: ACS-3 (minor revision not indicated)
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| 14 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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| 15 | Local Time is: Sat Sep 4 01:45:46 2021 EDT
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| 16 | SMART support is: Available - device has SMART capability.
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| 17 | SMART support is: Enabled
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| 18 | AAM feature is: Unavailable
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| 19 | APM feature is: Disabled
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| 20 | Rd look-ahead is: Enabled
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| 21 | Write cache is: Enabled
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| 22 | DSN feature is: Unavailable
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| 23 | ATA Security is: Disabled, frozen [SEC2]
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| 24 | Wt Cache Reorder: Unavailable
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| 25 |
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| 26 | === START OF READ SMART DATA SECTION ===
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| 27 | SMART overall-health self-assessment test result: PASSED
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| 28 |
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| 29 | General SMART Values:
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| 30 | Offline data collection status: (0x02) Offline data collection activity
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| 31 | was completed without error.
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| 32 | Auto Offline Data Collection: Disabled.
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed
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| 34 | without error or no self-test has ever
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| 35 | been run.
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| 36 | Total time to complete Offline
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| 37 | data collection: ( 9530) seconds.
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| 38 | Offline data collection
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| 39 | capabilities: (0x51) SMART execute Offline immediate.
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| 40 | No Auto Offline data collection support.
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| 41 | Suspend Offline collection upon new
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| 42 | command.
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| 43 | No Offline surface scan supported.
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| 44 | Self-test supported.
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| 45 | No Conveyance Self-test supported.
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| 46 | Selective Self-test supported.
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| 47 | SMART capabilities: (0x0002) Does not save SMART data before
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| 48 | entering power-saving mode.
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| 49 | Supports SMART auto save timer.
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| 50 | Error logging capability: (0x01) Error logging supported.
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| 51 | General Purpose Logging supported.
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| 52 | Short self-test routine
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| 53 | recommended polling time: ( 2) minutes.
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| 54 | Extended self-test routine
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| 55 | recommended polling time: ( 160) minutes.
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| 56 |
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| 57 | SMART Attributes Data Structure revision number: 0
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| 58 | Vendor Specific SMART Attributes with Thresholds:
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| 59 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 60 | 1 Raw_Read_Error_Rate -OSR-- 166 166 006 - 0
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| 61 | 5 Reallocated_Sector_Ct -O--CK 100 100 036 - 0
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| 62 | 9 Power_On_Hours -O--CK 100 100 000 - 299
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| 63 | 12 Power_Cycle_Count -O--CK 100 100 020 - 3
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| 64 | 100 Unknown_Attribute -O--CK 100 100 000 - 59737
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| 65 | 168 Unknown_Attribute -O--CK 100 100 000 - 1
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| 66 | 169 Unknown_Attribute -O--CK 100 100 000 - 0
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| 67 | 171 Unknown_Attribute -O--CK 100 100 000 - 0
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| 68 | 172 Unknown_Attribute -O--CK 100 100 000 - 0
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| 69 | 174 Unknown_Attribute -O--CK 100 100 000 - 1
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| 70 | 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0
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| 71 | 176 Erase_Fail_Count_Chip -O--CK 100 100 000 - 0
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| 72 | 177 Wear_Leveling_Count -O--CK 100 100 000 - 1
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| 73 | 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 0
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| 74 | 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 0
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| 75 | 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 1804
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| 76 | 184 End-to-End_Error -O--CK 100 100 000 - 0
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| 77 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 78 | 188 Command_Timeout -O--CK 100 100 000 - 0
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| 79 | 194 Temperature_Celsius -O---K 027 061 000 - 27 (Min/Max 24/61)
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| 80 | 195 Hardware_ECC_Recovered -OSR-- 100 100 000 - 0
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| 81 | 196 Reallocated_Event_Count -O--CK 100 100 036 - 0
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| 82 | 198 Offline_Uncorrectable ----CK 100 100 000 - 0
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| 83 | 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0
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| 84 | 204 Soft_ECC_Correction -OSR-- 001 001 000 - 448855
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| 85 | 212 Unknown_Attribute -O--CK 100 100 000 - 20
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| 86 | 233 Media_Wearout_Indicator PO---K 100 100 001 - 100
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| 87 | 234 Unknown_Attribute -O--CK 100 100 000 - 844
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| 88 | 241 Total_LBAs_Written -O--CK 100 100 000 - 903
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| 89 | 242 Total_LBAs_Read -O--CK 100 100 000 - 180
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| 90 | ||||||_ K auto-keep
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| 91 | |||||__ C event count
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| 92 | ||||___ R error rate
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| 93 | |||____ S speed/performance
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| 94 | ||_____ O updated online
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| 95 | |______ P prefailure warning
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| 96 |
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| 97 | General Purpose Log Directory Version 1
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| 98 | SMART Log Directory Version 1 [multi-sector log support]
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| 99 | Address Access R/W Size Description
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| 100 | 0x00 GPL,SL R/O 1 Log Directory
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| 101 | 0x01 SL R/O 1 Summary SMART error log
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| 102 | 0x02 SL R/O 4 Comprehensive SMART error log
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| 103 | 0x03 GPL R/O 5 Ext. Comprehensive SMART error log
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| 104 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 105 | 0x06 SL R/O 1 SMART self-test log
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| 106 | 0x07 GPL R/O 2 Extended self-test log
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| 107 | 0x09 SL R/W 1 Selective self-test log
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| 108 | 0x10 GPL R/O 1 NCQ Command Error log
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| 109 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 110 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 111 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 112 |
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| 113 | SMART Extended Comprehensive Error Log Version: 1 (5 sectors)
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| 114 | No Errors Logged
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| 115 |
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| 116 | SMART Extended Self-test Log Version: 1 (2 sectors)
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| 117 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 118 | # 1 Extended offline Completed without error 00% 134 -
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| 119 | # 2 Short offline Completed without error 00% 126 -
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| 120 | # 3 Extended offline Completed without error 00% 2 -
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| 121 | # 4 Short offline Completed without error 00% 0 -
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| 122 |
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| 123 | SMART Selective self-test log data structure revision number 0
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| 124 | Note: revision number not 1 implies that no selective self-test has ever been run
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| 125 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 126 | 1 0 0 Not_testing
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| 127 | 2 0 0 Not_testing
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| 128 | 3 0 0 Not_testing
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| 129 | 4 0 0 Not_testing
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| 130 | 5 0 0 Not_testing
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| 131 | Selective self-test flags (0x0):
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| 132 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 133 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 134 |
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| 135 | SCT Commands not supported
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| 136 |
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| 137 | Device Statistics (GP Log 0x04)
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| 138 | Page Offset Size Value Flags Description
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| 139 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 140 | 0x01 0x008 4 3 --- Lifetime Power-On Resets
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| 141 | 0x01 0x010 4 299 --- Power-on Hours
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| 142 | 0x01 0x018 6 1765533946 --- Logical Sectors Written
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| 143 | 0x01 0x020 6 20267320 --- Number of Write Commands
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| 144 | 0x01 0x028 6 352246877 --- Logical Sectors Read
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| 145 | 0x01 0x030 6 1739381 --- Number of Read Commands
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| 146 | 0x01 0x038 6 1076400000 --- Date and Time TimeStamp
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| 147 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 148 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 149 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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| 150 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 151 | 0x05 0x008 1 27 --- Current Temperature
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| 152 | 0x05 0x010 1 28 --- Average Short Term Temperature
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| 153 | 0x05 0x018 1 - --- Average Long Term Temperature
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| 154 | 0x05 0x020 1 61 --- Highest Temperature
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| 155 | 0x05 0x028 1 24 --- Lowest Temperature
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| 156 | 0x05 0x030 1 - --- Highest Average Short Term Temperature
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| 157 | 0x05 0x038 1 27 --- Lowest Average Short Term Temperature
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| 158 | 0x05 0x040 1 - --- Highest Average Long Term Temperature
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| 159 | 0x05 0x048 1 - --- Lowest Average Long Term Temperature
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| 160 | 0x05 0x050 4 0 --- Time in Over-Temperature
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| 161 | 0x05 0x058 1 80 --- Specified Maximum Operating Temperature
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| 162 | 0x05 0x060 4 17900 --- Time in Under-Temperature
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| 163 | 0x05 0x068 1 -20 --- Specified Minimum Operating Temperature
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| 164 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 165 | 0x06 0x008 4 18 --- Number of Hardware Resets
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| 166 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 167 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 168 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 169 | |||_ C monitored condition met
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| 170 | ||__ D supports DSN
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| 171 | |___ N normalized value
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| 172 |
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| 173 | Pending Defects log (GP Log 0x0c) not supported
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| 174 |
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| 175 | SATA Phy Event Counters (GP Log 0x11)
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| 176 | ID Size Value Description
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| 177 | 0x0001 2 0 Command failed due to ICRC error
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| 178 | 0x000a 2 8 Device-to-host register FISes sent due to a COMRESET
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| 179 |
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