| 1 | smartctl 7.0 2019-05-21 r4917 [x86_64-linux-5.3.18-lp152.57-default] (SUSE RPM)
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| 2 | Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: SQF-SM8V2-60G-BBZ
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| 6 | Firmware Version: SBFMP612
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| 7 | User Capacity: 60,022,480,896 bytes [60.0 GB]
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| 8 | Sector Size: 512 bytes logical/physical
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| 9 | Rotation Rate: Solid State Device
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| 10 | Form Factor: M.2
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| 11 | Device is: Not in smartctl database [for details use: -P showall]
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| 12 | ATA Version is: ACS-4 (minor revision not indicated)
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| 13 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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| 14 | Local Time is: Wed Jan 20 08:42:26 2021 CET
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 | AAM feature is: Unavailable
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| 18 | APM feature is: Unavailable
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| 19 | Rd look-ahead is: Enabled
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| 20 | Write cache is: Enabled
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| 21 | DSN feature is: Unavailable
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| 22 | ATA Security is: Disabled, frozen [SEC2]
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| 23 | Wt Cache Reorder: Unavailable
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| 24 |
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| 25 | === START OF READ SMART DATA SECTION ===
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| 26 | SMART overall-health self-assessment test result: PASSED
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| 27 |
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| 28 | General SMART Values:
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| 29 | Offline data collection status: (0x00) Offline data collection activity
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| 30 | was never started.
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| 31 | Auto Offline Data Collection: Disabled.
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| 32 | Self-test execution status: ( 0) The previous self-test routine completed
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| 33 | without error or no self-test has ever
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| 34 | been run.
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| 35 | Total time to complete Offline
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| 36 | data collection: (65535) seconds.
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| 37 | Offline data collection
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| 38 | capabilities: (0x79) SMART execute Offline immediate.
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| 39 | No Auto Offline data collection support.
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| 40 | Suspend Offline collection upon new
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| 41 | command.
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| 42 | Offline surface scan supported.
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| 43 | Self-test supported.
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| 44 | Conveyance Self-test supported.
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| 45 | Selective Self-test supported.
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| 46 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 47 | power-saving mode.
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| 48 | Supports SMART auto save timer.
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| 49 | Error logging capability: (0x01) Error logging supported.
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| 50 | General Purpose Logging supported.
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| 51 | Short self-test routine
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| 52 | recommended polling time: ( 2) minutes.
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| 53 | Extended self-test routine
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| 54 | recommended polling time: ( 30) minutes.
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| 55 | Conveyance self-test routine
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| 56 | recommended polling time: ( 6) minutes.
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| 57 |
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| 58 | SMART Attributes Data Structure revision number: 16
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| 59 | Vendor Specific SMART Attributes with Thresholds:
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| 60 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 61 | 1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0
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| 62 | 9 Power_On_Hours -O--C- 100 100 000 - 1134
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| 63 | 12 Power_Cycle_Count -O--C- 100 100 000 - 132
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| 64 | 14 Unknown_Attribute -O--C- 100 100 000 - 117231408
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| 65 | 15 Unknown_Attribute -O--C- 100 100 000 - 117231408
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| 66 | 16 Unknown_Attribute -O--C- 100 100 000 - 219
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| 67 | 17 Unknown_Attribute -O--C- 100 100 000 - 209
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| 68 | 100 Unknown_Attribute -O--C- 100 100 000 - 19906
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| 69 | 168 Unknown_Attribute -O--C- 100 100 000 - 0
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| 70 | 170 Unknown_Attribute PO---- 096 096 010 - 29
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| 71 | 173 Unknown_Attribute -O--C- 100 100 000 - 917557
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| 72 | 174 Unknown_Attribute -O--C- 100 100 000 - 86
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| 73 | 192 Power-Off_Retract_Count -O--C- 100 100 000 - 86
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| 74 | 175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
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| 75 | 194 Temperature_Celsius PO---K 064 050 000 - 36 (Min/Max 25/50)
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| 76 | 202 Unknown_SSD_Attribute -O--C- 100 100 050 - 1
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| 77 | 231 Temperature_Celsius PO--C- 100 100 000 - 99
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| 78 | 218 Unknown_Attribute PO-R-- 100 100 050 - 0
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| 79 | 234 Unknown_Attribute PO-R-- 100 100 000 - 25657978904
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| 80 | 235 Unknown_Attribute PO-R-- 100 100 000 - 1368576544
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| 81 | 241 Total_LBAs_Written -O--C- 100 100 000 - 1556409084
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| 82 | 242 Total_LBAs_Read -O--C- 100 100 000 - 5109714815
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| 83 | ||||||_ K auto-keep
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| 84 | |||||__ C event count
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| 85 | ||||___ R error rate
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| 86 | |||____ S speed/performance
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| 87 | ||_____ O updated online
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| 88 | |______ P prefailure warning
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| 89 |
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| 90 | General Purpose Log Directory Version 1
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| 91 | SMART Log Directory Version 1 [multi-sector log support]
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| 92 | Address Access R/W Size Description
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| 93 | 0x00 GPL,SL R/O 1 Log Directory
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| 94 | 0x01 SL R/O 1 Summary SMART error log
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| 95 | 0x02 SL R/O 51 Comprehensive SMART error log
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| 96 | 0x03 GPL R/O 64 Ext. Comprehensive SMART error log
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| 97 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 98 | 0x06 SL R/O 1 SMART self-test log
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| 99 | 0x07 GPL R/O 1 Extended self-test log
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| 100 | 0x09 SL R/W 1 Selective self-test log
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| 101 | 0x10 GPL R/O 1 NCQ Command Error log
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| 102 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 103 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 104 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 105 |
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| 106 | SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
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| 107 | No Errors Logged
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| 108 |
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| 109 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 110 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 111 | # 1 Short offline Completed without error 00% 1134 -
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| 112 |
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| 113 | SMART Selective self-test log data structure revision number 0
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| 114 | Note: revision number not 1 implies that no selective self-test has ever been run
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| 115 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 116 | 1 0 0 Not_testing
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| 117 | 2 0 0 Not_testing
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| 118 | 3 0 0 Not_testing
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| 119 | 4 0 0 Not_testing
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| 120 | 5 0 0 Not_testing
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| 121 | Selective self-test flags (0x0):
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| 122 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 123 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 124 |
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| 125 | SCT Commands not supported
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| 126 |
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| 127 | Device Statistics (GP Log 0x04)
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| 128 | Page Offset Size Value Flags Description
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| 129 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 130 | 0x01 0x008 4 132 --- Lifetime Power-On Resets
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| 131 | 0x01 0x010 4 1134 --- Power-on Hours
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| 132 | 0x01 0x018 6 1556409084 --- Logical Sectors Written
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| 133 | 0x01 0x028 6 5109714815 --- Logical Sectors Read
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| 134 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 135 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 136 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 137 | 0x05 0x008 1 36 --- Current Temperature
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| 138 | 0x05 0x020 1 50 --- Highest Temperature
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| 139 | 0x05 0x028 1 25 --- Lowest Temperature
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| 140 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 141 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 142 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 143 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 144 | |||_ C monitored condition met
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| 145 | ||__ D supports DSN
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| 146 | |___ N normalized value
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| 147 |
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| 148 | Pending Defects log (GP Log 0x0c) not supported
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| 149 |
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| 150 | SATA Phy Event Counters (GP Log 0x11)
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| 151 | ID Size Value Description
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| 152 | 0x0001 2 0 Command failed due to ICRC error
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| 153 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 154 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 155 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 156 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 157 | 0x0008 2 0 Device-to-host non-data FIS retries
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| 158 | 0x0009 4 2 Transition from drive PhyRdy to drive PhyNRdy
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| 159 | 0x000a 4 3 Device-to-host register FISes sent due to a COMRESET
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| 160 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 161 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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| 162 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 163 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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| 164 |
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