| 1 | smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-56-generic] (local build) |
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| 2 | Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org |
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| 3 | |
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| 4 | === START OF INFORMATION SECTION === |
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| 5 | Device Model: HFS512G39MND-3510A |
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| 6 | Serial Number: FS67N121910607O0S |
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| 7 | Firmware Version: 20400P00 |
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| 8 | User Capacity: 512,110,190,592 bytes [512 GB] |
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| 9 | Sector Sizes: 512 bytes logical, 4096 bytes physical |
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| 10 | Rotation Rate: Solid State Device |
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| 11 | Device is: Not in smartctl database [for details use: -P showall] |
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| 12 | ATA Version is: ATA8-ACS (minor revision not indicated) |
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| 13 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) |
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| 14 | Local Time is: Thu Dec 10 20:51:00 2020 NZDT |
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| 15 | SMART support is: Available - device has SMART capability. |
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| 16 | SMART support is: Enabled |
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| 17 | AAM feature is: Unavailable |
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| 18 | APM level is: 254 (maximum performance) |
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| 19 | Rd look-ahead is: Enabled |
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| 20 | Write cache is: Enabled |
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| 21 | DSN feature is: Unavailable |
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| 22 | ATA Security is: Disabled, frozen [SEC2] |
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| 23 | Wt Cache Reorder: Unavailable |
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| 24 | |
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| 25 | === START OF READ SMART DATA SECTION === |
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| 26 | SMART overall-health self-assessment test result: PASSED |
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| 27 | |
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| 28 | General SMART Values: |
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| 29 | Offline data collection status: (0x02) Offline data collection activity |
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| 30 | was completed without error. |
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| 31 | Auto Offline Data Collection: Disabled. |
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| 32 | Self-test execution status: ( 0) The previous self-test routine completed |
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| 33 | without error or no self-test has ever |
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| 34 | been run. |
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| 35 | Total time to complete Offline |
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| 36 | data collection: ( 5) seconds. |
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| 37 | Offline data collection |
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| 38 | capabilities: (0x59) SMART execute Offline immediate. |
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| 39 | No Auto Offline data collection support. |
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| 40 | Suspend Offline collection upon new |
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| 41 | command. |
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| 42 | Offline surface scan supported. |
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| 43 | Self-test supported. |
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| 44 | No Conveyance Self-test supported. |
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| 45 | Selective Self-test supported. |
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| 46 | SMART capabilities: (0x0002) Does not save SMART data before |
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| 47 | entering power-saving mode. |
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| 48 | Supports SMART auto save timer. |
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| 49 | Error logging capability: (0x01) Error logging supported. |
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| 50 | General Purpose Logging supported. |
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| 51 | Short self-test routine |
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| 52 | recommended polling time: ( 1) minutes. |
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| 53 | Extended self-test routine |
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| 54 | recommended polling time: ( 60) minutes. |
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| 55 | |
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| 56 | SMART Attributes Data Structure revision number: 0 |
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| 57 | Vendor Specific SMART Attributes with Thresholds: |
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| 58 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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| 59 | 1 Raw_Read_Error_Rate POSR-- 166 166 006 - 0 |
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| 60 | 5 Reallocated_Sector_Ct -O--CK 253 253 036 - 0 |
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| 61 | 9 Power_On_Hours -O--CK 088 088 000 - 11181 |
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| 62 | 12 Power_Cycle_Count -O--CK 100 100 020 - 1032 |
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| 63 | 100 Unknown_Attribute -O--CK 100 100 000 - 15595011 |
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| 64 | 170 Unknown_Attribute -O--CK 100 100 000 - 151 |
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| 65 | 171 Unknown_Attribute -O--CK 253 253 000 - 0 |
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| 66 | 172 Unknown_Attribute -O--CK 253 253 000 - 0 |
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| 67 | 174 Unknown_Attribute ----CK 100 100 000 - 19 |
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| 68 | 175 Program_Fail_Count_Chip -O--CK 253 253 000 - 0 |
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| 69 | 176 Erase_Fail_Count_Chip -O--CK 253 253 000 - 0 |
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| 70 | 177 Wear_Leveling_Count -O--CK 097 097 000 - 119 |
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| 71 | 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 24 |
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| 72 | 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 151 |
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| 73 | 180 Unused_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 8681 |
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| 74 | 183 Runtime_Bad_Block -O--CK 253 253 000 - 0 |
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| 75 | 187 Reported_Uncorrect -O--CK 253 253 000 - 0 |
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| 76 | 188 Command_Timeout -O--CK 253 253 000 - 0 |
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| 77 | 194 Temperature_Celsius -O---- 030 000 000 - 30 (Min/Max 9/70) |
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| 78 | 195 Hardware_ECC_Recovered -O--CK 253 253 000 - 0 |
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| 79 | 199 UDMA_CRC_Error_Count -O--CK 253 253 000 - 0 |
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| 80 | 201 Unknown_SSD_Attribute -OSR-- 100 100 000 - 0 |
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| 81 | 204 Soft_ECC_Correction -OSR-- 100 100 --- - 0 |
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| 82 | 212 Unknown_Attribute -O--CK 100 100 --- - 3369348 |
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| 83 | 231 Temperature_Celsius PO--CK 253 253 --- - 0 |
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| 84 | 234 Unknown_Attribute -O--CK 100 100 --- - 60864 |
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| 85 | 241 Total_LBAs_Written -O--CK 100 100 --- - 5778 |
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| 86 | 242 Total_LBAs_Read -O--CK 100 100 --- - 13049 |
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| 87 | 250 Read_Error_Retry_Rate -O--CK 100 100 --- - 19 |
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| 88 | ||||||_ K auto-keep |
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| 89 | |||||__ C event count |
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| 90 | ||||___ R error rate |
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| 91 | |||____ S speed/performance |
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| 92 | ||_____ O updated online |
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| 93 | |______ P prefailure warning |
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| 94 | |
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| 95 | General Purpose Log Directory Version 1 |
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| 96 | SMART Log Directory Version 1 [multi-sector log support] |
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| 97 | Address Access R/W Size Description |
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| 98 | 0x00 GPL,SL R/O 1 Log Directory |
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| 99 | 0x01 SL R/O 1 Summary SMART error log |
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| 100 | 0x02 SL R/O 4 Comprehensive SMART error log |
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| 101 | 0x03 GPL R/O 5 Ext. Comprehensive SMART error log |
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| 102 | 0x04 GPL,SL R/O 8 Device Statistics log |
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| 103 | 0x06 SL R/O 1 SMART self-test log |
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| 104 | 0x07 GPL R/O 2 Extended self-test log |
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| 105 | 0x09 SL R/W 1 Selective self-test log |
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| 106 | 0x10 GPL R/O 1 NCQ Command Error log |
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| 107 | 0x11 GPL R/O 1 SATA Phy Event Counters log |
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| 108 | 0x30 GPL R/O 8 IDENTIFY DEVICE data log |
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| 109 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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| 110 | |
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| 111 | SMART Extended Comprehensive Error Log Version: 1 (5 sectors) |
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| 112 | No Errors Logged |
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| 113 | |
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| 114 | SMART Extended Self-test Log Version: 1 (2 sectors) |
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| 115 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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| 116 | # 1 Short offline Completed without error 00% 11181 - |
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| 117 | # 2 Extended offline Completed without error 00% 11172 - |
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| 118 | |
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| 119 | SMART Selective self-test log data structure revision number 0 |
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| 120 | Note: revision number not 1 implies that no selective self-test has ever been run |
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| 121 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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| 122 | 1 0 0 Not_testing |
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| 123 | 2 0 0 Not_testing |
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| 124 | 3 0 0 Not_testing |
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| 125 | 4 0 0 Not_testing |
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| 126 | 5 0 0 Not_testing |
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| 127 | Selective self-test flags (0x0): |
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| 128 | After scanning selected spans, do NOT read-scan remainder of disk. |
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| 129 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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| 130 | |
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| 131 | SCT Commands not supported |
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| 132 | |
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| 133 | Device Statistics (GP Log 0x04) |
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| 134 | Page Offset Size Value Flags Description |
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| 135 | 0x01 ===== = = === == General Statistics (empty) == |
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| 136 | 0x04 ===== = = === == General Errors Statistics (empty) == |
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| 137 | 0x05 ===== = = === == Temperature Statistics (empty) == |
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| 138 | 0x06 ===== = = === == Transport Statistics (empty) == |
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| 139 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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| 140 | |||_ C monitored condition met |
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| 141 | ||__ D supports DSN |
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| 142 | |___ N normalized value |
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| 143 | |
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| 144 | Pending Defects log (GP Log 0x0c) not supported |
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| 145 | |
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| 146 | SATA Phy Event Counters (GP Log 0x11) |
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| 147 | ID Size Value Description |
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| 148 | 0x0001 2 0 Command failed due to ICRC error |
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| 149 | 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET |
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| 150 | |
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