| 1 | Device Name : /dev/sdd
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| 2 |
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| 3 | ID Attribute Name Attribute Data Units
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| 4 |
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| 5 | 1 Raw Read Error Rate 0 Errors/Page
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| 6 |
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| 7 | 5 Retired NAND Blocks 0 NAND Blocks
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| 8 |
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| 9 | 9 Power On Hours Count 2 Hours
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| 10 |
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| 11 | 12 Power Cycle Count 1 Cycles
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| 12 |
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| 13 | 170 Reserved block count 0 Blocks
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| 14 |
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| 15 | 171 Program Fail Count 0 NAND Page Program Failures
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| 16 |
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| 17 | 172 Erase Fail Count 0 NAND Block Erase Failures
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| 18 |
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| 19 | 173 Average Block-Erase Count 1 Erases
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| 20 |
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| 21 | 174 Unexpected Power Loss Count 0 Unexpected Power Loss events
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| 22 |
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| 23 | 180 Unused reserved block count 18961 Blocks
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| 24 |
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| 25 | 183 SATA Interface Downshift 0 Downshifts
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| 26 |
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| 27 | 184 Error Correction Count 0 Correction Events
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| 28 |
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| 29 | 187 Reported Uncorrectable Errors 0 ECC Correction Failures
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| 30 |
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| 31 | 188 Command Timeouts 0 Outstanding Commands Since
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| 32 | Last Reset
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| 33 |
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| 34 | 194 Enclosure Temperature 33 Current Temperature (C)
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| 35 |
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| 36 | 34 Highest Lifetime Temperature (C)
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| 37 |
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| 38 | 195 Cumulative Corrected ECC 0 Corrected ECC
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| 39 |
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| 40 | 196 Reallocation Event Count 0 Events
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| 41 |
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| 42 | 197 Current Pending Sector Count 0 512 Byte Sectors
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| 43 |
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| 44 | 198 SMART Off-line Scan 0 Errors
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| 45 |
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| 46 | Uncorrectable Errors
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| 47 |
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| 48 | 199 Ultra-DMA CRC Error Count 0 Errors
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| 49 |
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| 50 | 202 Percentage Lifetime Remaining 100 % Lifetime Remaining
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| 51 |
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| 52 | 206 Write Error Rate 0 Program Fails/MB
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| 53 |
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| 54 | 210 RAIN Successful Recovery 0 TUs successfully recovered by
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| 55 |
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| 56 | Page Count RAIN
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| 57 |
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| 58 | 211 Integrity Scan Complete Count 2 Count
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| 59 |
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| 60 | 212 Integrity Scan Folding 0 Count
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| 61 |
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| 62 | Completed Count
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| 63 |
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| 64 | 246 Cumulative Host Write 0 512 Byte Sectors
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| 65 |
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| 66 | Sector Count
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| 67 |
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| 68 | 247 Host Program Page Count 0 NAND Page
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| 69 |
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| 70 | 248 FTL Program Page Count 1203 NAND Page
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| 71 |
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