| 1 | smartctl 7.2 2020-01-02 r5028M [x86_64-linux-5.4.7-arch1-1] (local build)
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| 2 | Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Model Family: Silicon Motion based SSDs
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| 6 | Device Model: TS256GSSD360S
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| 7 | Serial Number: E754150185
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| 8 | LU WWN Device Id: 5 7c3548 156f95d29
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| 9 | Firmware Version: R0123A0
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| 10 | User Capacity: 256,060,514,304 bytes [256 GB]
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| 11 | Sector Size: 512 bytes logical/physical
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| 12 | Rotation Rate: Solid State Device
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| 13 | Form Factor: 2.5 inches
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| 14 | Device is: In smartctl database [for details use: -P show]
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| 15 | ATA Version is: ACS-2 T13/2015-D revision 3
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| 16 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
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| 17 | Local Time is: Wed Jan 8 04:24:50 2020 EET
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| 18 | SMART support is: Available - device has SMART capability.
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| 19 | SMART support is: Enabled
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| 20 | AAM feature is: Unavailable
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| 21 | APM level is: 128 (minimum power consumption without standby)
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| 22 | Rd look-ahead is: Enabled
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| 23 | Write cache is: Enabled
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| 24 | DSN feature is: Unavailable
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| 25 | ATA Security is: Disabled, frozen [SEC2]
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| 26 | Wt Cache Reorder: Unavailable
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| 27 |
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| 28 | === START OF READ SMART DATA SECTION ===
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| 29 | SMART overall-health self-assessment test result: PASSED
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| 30 |
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| 31 | General SMART Values:
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| 32 | Offline data collection status: (0x00) Offline data collection activity
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| 33 | was never started.
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| 34 | Auto Offline Data Collection: Disabled.
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| 35 | Self-test execution status: ( 0) The previous self-test routine completed
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| 36 | without error or no self-test has ever
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| 37 | been run.
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| 38 | Total time to complete Offline
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| 39 | data collection: ( 120) seconds.
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| 40 | Offline data collection
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| 41 | capabilities: (0x11) SMART execute Offline immediate.
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| 42 | No Auto Offline data collection support.
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| 43 | Suspend Offline collection upon new
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| 44 | command.
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| 45 | No Offline surface scan supported.
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| 46 | Self-test supported.
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| 47 | No Conveyance Self-test supported.
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| 48 | No Selective Self-test supported.
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| 49 | SMART capabilities: (0x0002) Does not save SMART data before
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| 50 | entering power-saving mode.
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| 51 | Supports SMART auto save timer.
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| 52 | Error logging capability: (0x01) Error logging supported.
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| 53 | General Purpose Logging supported.
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| 54 | Short self-test routine
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| 55 | recommended polling time: ( 2) minutes.
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| 56 | Extended self-test routine
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| 57 | recommended polling time: ( 10) minutes.
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| 58 |
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| 59 | SMART Attributes Data Structure revision number: 1
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| 60 | Vendor Specific SMART Attributes with Thresholds:
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| 61 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 62 | 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0
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| 63 | 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0
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| 64 | 9 Power_On_Hours -O--CK 100 100 050 - 5814
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| 65 | 12 Power_Cycle_Count -O--CK 100 100 050 - 22
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| 66 | 160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0
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| 67 | 161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100
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| 68 | 163 Initial_Bad_Block_Count -O--CK 100 100 050 - 24
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| 69 | 164 Total_Erase_Count -O--CK 100 100 050 - 1857
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| 70 | 165 Max_Erase_Count -O--CK 100 100 050 - 6
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| 71 | 166 Min_Erase_Count -O--CK 100 100 050 - 1
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| 72 | 167 Average_Erase_Count -O--CK 100 100 050 - 3
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| 73 | 168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 1000
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| 74 | 169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100
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| 75 | 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 76 | 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0
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| 77 | 177 Wear_Leveling_Count -O--CK 100 100 050 - 0
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| 78 | 178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0
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| 79 | 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0
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| 80 | 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0
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| 81 | 192 Power-Off_Retract_Count -O--CK 100 100 050 - 14
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| 82 | 194 Temperature_Celsius -O---K 100 100 050 - 36
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| 83 | 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0
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| 84 | 196 Reallocated_Event_Count -O--CK 100 100 050 - 0
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| 85 | 197 Current_Pending_Sector -O--CK 100 100 050 - 0
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| 86 | 198 Offline_Uncorrectable -O--CK 100 100 050 - 0
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| 87 | 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0
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| 88 | 232 Available_Reservd_Space -O--CK 100 100 050 - 100
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| 89 | 241 Host_Writes_32MiB ----CK 100 100 050 - 11007
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| 90 | 242 Host_Reads_32MiB ----CK 100 100 050 - 11632
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| 91 | 245 TLC_Writes_32MiB -O--CK 100 100 050 - 1904
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| 92 | ||||||_ K auto-keep
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| 93 | |||||__ C event count
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| 94 | ||||___ R error rate
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| 95 | |||____ S speed/performance
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| 96 | ||_____ O updated online
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| 97 | |______ P prefailure warning
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| 98 |
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| 99 | General Purpose Log Directory Version 1
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| 100 | SMART Log Directory Version 1 [multi-sector log support]
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| 101 | Address Access R/W Size Description
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| 102 | 0x00 GPL,SL R/O 1 Log Directory
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| 103 | 0x01 SL R/O 1 Summary SMART error log
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| 104 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 105 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log
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| 106 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 107 | 0x06 SL R/O 1 SMART self-test log
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| 108 | 0x07 GPL R/O 1 Extended self-test log
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| 109 | 0x10 GPL R/O 1 NCQ Command Error log
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| 110 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 111 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 112 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 113 | 0xde GPL VS 8 Device vendor specific log
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| 114 |
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| 115 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
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| 116 | No Errors Logged
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| 117 |
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| 118 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 119 | No self-tests have been logged. [To run self-tests, use: smartctl -t]
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| 120 |
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| 121 | Selective Self-tests/Logging not supported
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| 122 |
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| 123 | SCT Commands not supported
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| 124 |
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| 125 | Device Statistics (GP Log 0x04)
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| 126 | Page Offset Size Value Flags Description
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| 127 | 0x01 ===== = = === == General Statistics (rev 1) ==
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| 128 | 0x01 0x008 4 22 --- Lifetime Power-On Resets
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| 129 | 0x01 0x010 4 5814 --- Power-on Hours
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| 130 | 0x01 0x018 6 721407125 --- Logical Sectors Written
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| 131 | 0x01 0x020 6 1251460 --- Number of Write Commands
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| 132 | 0x01 0x028 6 762324001 --- Logical Sectors Read
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| 133 | 0x01 0x030 6 1924767 --- Number of Read Commands
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| 134 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 135 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator
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| 136 | |||_ C monitored condition met
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| 137 | ||__ D supports DSN
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| 138 | |___ N normalized value
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| 139 |
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| 140 | Pending Defects log (GP Log 0x0c) not supported
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| 141 |
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| 142 | SATA Phy Event Counters (GP Log 0x11)
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| 143 | ID Size Value Description
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| 144 | 0x0001 4 0 Command failed due to ICRC error
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| 145 | 0x0002 4 0 R_ERR response for data FIS
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| 146 | 0x0005 4 12 R_ERR response for non-data FIS
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| 147 | 0x000a 4 36 Device-to-host register FISes sent due to a COMRESET
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| 148 |
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