1 | smartctl 7.2 2020-01-02 r5028M [x86_64-linux-5.4.7-arch1-1] (local build) |
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2 | Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org |
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3 | |
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4 | === START OF INFORMATION SECTION === |
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5 | Model Family: Silicon Motion based SSDs |
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6 | Device Model: TS256GSSD360S |
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7 | Serial Number: E754150185 |
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8 | LU WWN Device Id: 5 7c3548 156f95d29 |
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9 | Firmware Version: R0123A0 |
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10 | User Capacity: 256,060,514,304 bytes [256 GB] |
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11 | Sector Size: 512 bytes logical/physical |
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12 | Rotation Rate: Solid State Device |
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13 | Form Factor: 2.5 inches |
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14 | Device is: In smartctl database [for details use: -P show] |
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15 | ATA Version is: ACS-2 T13/2015-D revision 3 |
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16 | SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) |
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17 | Local Time is: Wed Jan 8 04:24:50 2020 EET |
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18 | SMART support is: Available - device has SMART capability. |
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19 | SMART support is: Enabled |
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20 | AAM feature is: Unavailable |
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21 | APM level is: 128 (minimum power consumption without standby) |
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22 | Rd look-ahead is: Enabled |
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23 | Write cache is: Enabled |
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24 | DSN feature is: Unavailable |
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25 | ATA Security is: Disabled, frozen [SEC2] |
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26 | Wt Cache Reorder: Unavailable |
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27 | |
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28 | === START OF READ SMART DATA SECTION === |
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29 | SMART overall-health self-assessment test result: PASSED |
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30 | |
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31 | General SMART Values: |
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32 | Offline data collection status: (0x00) Offline data collection activity |
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33 | was never started. |
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34 | Auto Offline Data Collection: Disabled. |
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35 | Self-test execution status: ( 0) The previous self-test routine completed |
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36 | without error or no self-test has ever |
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37 | been run. |
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38 | Total time to complete Offline |
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39 | data collection: ( 120) seconds. |
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40 | Offline data collection |
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41 | capabilities: (0x11) SMART execute Offline immediate. |
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42 | No Auto Offline data collection support. |
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43 | Suspend Offline collection upon new |
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44 | command. |
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45 | No Offline surface scan supported. |
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46 | Self-test supported. |
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47 | No Conveyance Self-test supported. |
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48 | No Selective Self-test supported. |
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49 | SMART capabilities: (0x0002) Does not save SMART data before |
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50 | entering power-saving mode. |
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51 | Supports SMART auto save timer. |
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52 | Error logging capability: (0x01) Error logging supported. |
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53 | General Purpose Logging supported. |
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54 | Short self-test routine |
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55 | recommended polling time: ( 2) minutes. |
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56 | Extended self-test routine |
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57 | recommended polling time: ( 10) minutes. |
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58 | |
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59 | SMART Attributes Data Structure revision number: 1 |
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60 | Vendor Specific SMART Attributes with Thresholds: |
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61 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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62 | 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 |
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63 | 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 |
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64 | 9 Power_On_Hours -O--CK 100 100 050 - 5814 |
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65 | 12 Power_Cycle_Count -O--CK 100 100 050 - 22 |
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66 | 160 Uncorrectable_Error_Cnt -O--CK 100 100 050 - 0 |
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67 | 161 Valid_Spare_Block_Cnt PO--CK 100 100 050 - 100 |
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68 | 163 Initial_Bad_Block_Count -O--CK 100 100 050 - 24 |
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69 | 164 Total_Erase_Count -O--CK 100 100 050 - 1857 |
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70 | 165 Max_Erase_Count -O--CK 100 100 050 - 6 |
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71 | 166 Min_Erase_Count -O--CK 100 100 050 - 1 |
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72 | 167 Average_Erase_Count -O--CK 100 100 050 - 3 |
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73 | 168 Max_Erase_Count_of_Spec -O--CK 100 100 050 - 1000 |
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74 | 169 Remaining_Lifetime_Perc -O--CK 100 100 050 - 100 |
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75 | 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 |
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76 | 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 |
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77 | 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 |
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78 | 178 Runtime_Invalid_Blk_Cnt -O--CK 100 100 050 - 0 |
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79 | 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 |
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80 | 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 |
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81 | 192 Power-Off_Retract_Count -O--CK 100 100 050 - 14 |
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82 | 194 Temperature_Celsius -O---K 100 100 050 - 36 |
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83 | 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0 |
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84 | 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 |
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85 | 197 Current_Pending_Sector -O--CK 100 100 050 - 0 |
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86 | 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 |
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87 | 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 0 |
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88 | 232 Available_Reservd_Space -O--CK 100 100 050 - 100 |
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89 | 241 Host_Writes_32MiB ----CK 100 100 050 - 11007 |
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90 | 242 Host_Reads_32MiB ----CK 100 100 050 - 11632 |
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91 | 245 TLC_Writes_32MiB -O--CK 100 100 050 - 1904 |
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92 | ||||||_ K auto-keep |
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93 | |||||__ C event count |
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94 | ||||___ R error rate |
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95 | |||____ S speed/performance |
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96 | ||_____ O updated online |
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97 | |______ P prefailure warning |
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98 | |
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99 | General Purpose Log Directory Version 1 |
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100 | SMART Log Directory Version 1 [multi-sector log support] |
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101 | Address Access R/W Size Description |
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102 | 0x00 GPL,SL R/O 1 Log Directory |
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103 | 0x01 SL R/O 1 Summary SMART error log |
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104 | 0x02 SL R/O 1 Comprehensive SMART error log |
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105 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log |
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106 | 0x04 GPL,SL R/O 8 Device Statistics log |
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107 | 0x06 SL R/O 1 SMART self-test log |
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108 | 0x07 GPL R/O 1 Extended self-test log |
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109 | 0x10 GPL R/O 1 NCQ Command Error log |
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110 | 0x11 GPL R/O 1 SATA Phy Event Counters log |
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111 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log |
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112 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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113 | 0xde GPL VS 8 Device vendor specific log |
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114 | |
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115 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors) |
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116 | No Errors Logged |
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117 | |
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118 | SMART Extended Self-test Log Version: 1 (1 sectors) |
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119 | No self-tests have been logged. [To run self-tests, use: smartctl -t] |
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120 | |
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121 | Selective Self-tests/Logging not supported |
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122 | |
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123 | SCT Commands not supported |
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124 | |
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125 | Device Statistics (GP Log 0x04) |
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126 | Page Offset Size Value Flags Description |
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127 | 0x01 ===== = = === == General Statistics (rev 1) == |
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128 | 0x01 0x008 4 22 --- Lifetime Power-On Resets |
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129 | 0x01 0x010 4 5814 --- Power-on Hours |
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130 | 0x01 0x018 6 721407125 --- Logical Sectors Written |
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131 | 0x01 0x020 6 1251460 --- Number of Write Commands |
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132 | 0x01 0x028 6 762324001 --- Logical Sectors Read |
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133 | 0x01 0x030 6 1924767 --- Number of Read Commands |
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134 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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135 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |
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136 | |||_ C monitored condition met |
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137 | ||__ D supports DSN |
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138 | |___ N normalized value |
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139 | |
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140 | Pending Defects log (GP Log 0x0c) not supported |
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141 | |
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142 | SATA Phy Event Counters (GP Log 0x11) |
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143 | ID Size Value Description |
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144 | 0x0001 4 0 Command failed due to ICRC error |
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145 | 0x0002 4 0 R_ERR response for data FIS |
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146 | 0x0005 4 12 R_ERR response for non-data FIS |
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147 | 0x000a 4 36 Device-to-host register FISes sent due to a COMRESET |
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148 | |
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