1 | smartctl 6.6 2017-11-05 r4594 [x86_64-linux-4.19.8-200.fc28.x86_64] (local build) |
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2 | Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org |
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3 | |
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4 | === START OF INFORMATION SECTION === |
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5 | Device Model: Ramsta SSD S800 480GB |
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6 | Firmware Version: RS81V0 |
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7 | User Capacity: 480.103.981.056 bytes [480 GB] |
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8 | Sector Size: 512 bytes logical/physical |
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9 | Rotation Rate: Solid State Device |
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10 | Device is: Not in smartctl database [for details use: -P showall] |
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11 | ATA Version is: ACS-2 (minor revision not indicated) |
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12 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) |
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13 | Local Time is: Thu Jan 17 11:54:20 2019 -03 |
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14 | SMART support is: Available - device has SMART capability. |
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15 | SMART support is: Enabled |
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16 | AAM feature is: Unavailable |
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17 | APM feature is: Unavailable |
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18 | Rd look-ahead is: Enabled |
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19 | Write cache is: Enabled |
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20 | DSN feature is: Disabled |
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21 | ATA Security is: Disabled, NOT FROZEN [SEC1] |
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22 | Wt Cache Reorder: Unknown (0xe001) |
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23 | |
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24 | === START OF READ SMART DATA SECTION === |
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25 | SMART overall-health self-assessment test result: PASSED |
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26 | |
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27 | General SMART Values: |
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28 | Offline data collection status: (0x02) Offline data collection activity |
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29 | was completed without error. |
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30 | Auto Offline Data Collection: Disabled. |
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31 | Self-test execution status: ( 0) The previous self-test routine completed |
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32 | without error or no self-test has ever |
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33 | been run. |
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34 | Total time to complete Offline |
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35 | data collection: ( 0) seconds. |
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36 | Offline data collection |
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37 | capabilities: (0x71) SMART execute Offline immediate. |
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38 | No Auto Offline data collection support. |
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39 | Suspend Offline collection upon new |
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40 | command. |
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41 | No Offline surface scan supported. |
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42 | Self-test supported. |
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43 | Conveyance Self-test supported. |
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44 | Selective Self-test supported. |
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45 | SMART capabilities: (0x0002) Does not save SMART data before |
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46 | entering power-saving mode. |
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47 | Supports SMART auto save timer. |
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48 | Error logging capability: (0x01) Error logging supported. |
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49 | General Purpose Logging supported. |
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50 | Short self-test routine |
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51 | recommended polling time: ( 1) minutes. |
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52 | Extended self-test routine |
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53 | recommended polling time: ( 2) minutes. |
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54 | Conveyance self-test routine |
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55 | recommended polling time: ( 1) minutes. |
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56 | SCT capabilities: (0x0035) SCT Status supported. |
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57 | SCT Feature Control supported. |
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58 | SCT Data Table supported. |
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59 | |
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60 | SMART Attributes Data Structure revision number: 1 |
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61 | Vendor Specific SMART Attributes with Thresholds: |
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62 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE |
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63 | 1 Raw_Read_Error_Rate ------ 100 100 000 - 0 |
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64 | 5 Reallocated_Sector_Ct ------ 100 100 000 - 0 |
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65 | 9 Power_On_Hours ------ 100 100 000 - 825 |
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66 | 12 Power_Cycle_Count ------ 100 100 000 - 428 |
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67 | 160 Unknown_Attribute ------ 100 100 000 - 0 |
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68 | 161 Unknown_Attribute ------ 100 100 000 - 317 |
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69 | 163 Unknown_Attribute ------ 100 100 000 - 24 |
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70 | 164 Unknown_Attribute ------ 100 100 000 - 26581 |
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71 | 165 Unknown_Attribute ------ 100 100 000 - 36 |
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72 | 166 Unknown_Attribute ------ 100 100 000 - 2 |
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73 | 167 Unknown_Attribute ------ 100 100 000 - 7 |
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74 | 168 Unknown_Attribute ------ 100 100 000 - 1000 |
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75 | 169 Unknown_Attribute ------ 100 100 000 - 100 |
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76 | 175 Program_Fail_Count_Chip ------ 100 100 000 - 0 |
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77 | 176 Erase_Fail_Count_Chip ------ 100 100 000 - 0 |
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78 | 177 Wear_Leveling_Count ------ 100 100 050 - 123 |
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79 | 178 Used_Rsvd_Blk_Cnt_Chip ------ 100 100 000 - 0 |
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80 | 181 Program_Fail_Cnt_Total ------ 100 100 000 - 0 |
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81 | 182 Erase_Fail_Count_Total ------ 100 100 000 - 0 |
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82 | 192 Power-Off_Retract_Count ------ 100 100 000 - 4 |
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83 | 194 Temperature_Celsius ------ 100 100 000 - 40 |
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84 | 195 Hardware_ECC_Recovered ------ 100 100 000 - 0 |
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85 | 196 Reallocated_Event_Count ------ 100 100 016 - 0 |
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86 | 197 Current_Pending_Sector ------ 100 100 000 - 0 |
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87 | 198 Offline_Uncorrectable ------ 100 100 000 - 0 |
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88 | 199 UDMA_CRC_Error_Count ------ 100 100 050 - 0 |
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89 | 232 Available_Reservd_Space ------ 100 100 000 - 100 |
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90 | 241 Total_LBAs_Written ------ 100 100 000 - 118254 |
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91 | 242 Total_LBAs_Read ------ 100 100 000 - 172698 |
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92 | 245 Unknown_Attribute ------ 100 100 000 - 106324 |
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93 | ||||||_ K auto-keep |
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94 | |||||__ C event count |
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95 | ||||___ R error rate |
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96 | |||____ S speed/performance |
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97 | ||_____ O updated online |
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98 | |______ P prefailure warning |
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99 | |
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100 | General Purpose Log Directory Version 1 |
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101 | SMART Log Directory Version 1 [multi-sector log support] |
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102 | Address Access R/W Size Description |
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103 | 0x00 GPL,SL R/O 1 Log Directory |
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104 | 0x01 SL R/O 1 Summary SMART error log |
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105 | 0x02 SL R/O 1 Comprehensive SMART error log |
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106 | 0x03 GPL R/O 1 Ext. Comprehensive SMART error log |
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107 | 0x04 GPL,SL R/O 8 Device Statistics log |
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108 | 0x06 SL R/O 1 SMART self-test log |
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109 | 0x07 GPL R/O 1 Extended self-test log |
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110 | 0x09 SL R/W 1 Selective self-test log |
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111 | 0x0a GPL R/W 8 Device Statistics Notification |
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112 | 0x10 GPL R/O 1 NCQ Command Error log |
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113 | 0x11 GPL R/O 1 SATA Phy Event Counters log |
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114 | 0x24 GPL R/O 88 Current Device Internal Status Data log |
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115 | 0x25 GPL R/O 64 Saved Device Internal Status Data log |
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116 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log |
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117 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log |
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118 | |
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119 | SMART Extended Comprehensive Error Log Version: 1 (1 sectors) |
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120 | No Errors Logged |
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121 | |
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122 | SMART Extended Self-test Log Version: 1 (1 sectors) |
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123 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error |
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124 | # 1 Short offline Completed without error 00% 825 - |
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125 | |
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126 | SMART Selective self-test log data structure revision number 1 |
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127 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS |
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128 | 1 0 0 Not_testing |
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129 | 2 0 0 Not_testing |
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130 | 3 0 0 Not_testing |
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131 | 4 0 0 Not_testing |
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132 | 5 0 0 Not_testing |
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133 | 7 0 65535 Read_scanning was completed without error |
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134 | Selective self-test flags (0x0): |
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135 | After scanning selected spans, do NOT read-scan remainder of disk. |
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136 | If Selective self-test is pending on power-up, resume after 0 minute delay. |
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137 | |
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138 | SCT Status Version: 3 |
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139 | SCT Version (vendor specific): 0 (0x0000) |
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140 | SCT Support Level: 0 |
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141 | Device State: Active (0) |
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142 | Current Temperature: 0 Celsius |
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143 | Power Cycle Min/Max Temperature: -1/ 0 Celsius |
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144 | Lifetime Min/Max Temperature: 0/40 Celsius |
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145 | Under/Over Temperature Limit Count: 0/0 |
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146 | |
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147 | SCT Temperature History Version: 2 |
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148 | Temperature Sampling Period: 1 minute |
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149 | Temperature Logging Interval: 1 minute |
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150 | Min/Max recommended Temperature: 0/100 Celsius |
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151 | Min/Max Temperature Limit: 0/100 Celsius |
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152 | Temperature History Size (Index): 128 (75) |
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153 | |
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154 | Index Estimated Time Temperature Celsius |
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155 | 76 2019-01-17 09:47 40 ********************* |
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156 | ... ..(126 skipped). .. ********************* |
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157 | 75 2019-01-17 11:54 40 ********************* |
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158 | |
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159 | SCT Error Recovery Control command not supported |
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160 | |
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161 | Device Statistics (GP Log 0x04) |
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162 | Page Offset Size Value Flags Description |
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163 | 0x01 ===== = = === == General Statistics (rev 1) == |
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164 | 0x01 0x008 4 428 --- Lifetime Power-On Resets |
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165 | 0x01 0x010 4 825 --- Power-on Hours |
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166 | 0x01 0x018 6 3454944060 --- Logical Sectors Written |
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167 | 0x01 0x020 6 180043575 --- Number of Write Commands |
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168 | 0x01 0x028 6 2728037736 --- Logical Sectors Read |
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169 | 0x01 0x030 6 126903871 --- Number of Read Commands |
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170 | 0x04 ===== = = === == General Errors Statistics (rev 1) == |
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171 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors |
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172 | 0x04 0x010 4 4 --- Resets Between Cmd Acceptance and Completion |
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173 | 0x06 ===== = = === == Transport Statistics (rev 1) == |
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174 | 0x06 0x008 4 1961 --- Number of Hardware Resets |
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175 | 0x06 0x018 4 0 --- Number of Interface CRC Errors |
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176 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) == |
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177 | 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |
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178 | |||_ C monitored condition met |
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179 | ||__ D supports DSN |
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180 | |___ N normalized value |
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181 | |
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182 | Pending Defects log (GP Log 0x0c) not supported |
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183 | |
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184 | SATA Phy Event Counters (GP Log 0x11) |
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185 | ID Size Value Description |
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186 | 0x0001 2 0 Command failed due to ICRC error |
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187 | 0x0002 2 0 R_ERR response for data FIS |
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188 | 0x0003 2 0 R_ERR response for device-to-host data FIS |
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189 | 0x0004 2 0 R_ERR response for host-to-device data FIS |
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190 | 0x0005 2 0 R_ERR response for non-data FIS |
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191 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS |
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192 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS |
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193 | 0x0008 2 0 Device-to-host non-data FIS retries |
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194 | 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy |
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195 | 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET |
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196 | 0x000b 2 0 CRC errors within host-to-device FIS |
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197 | 0x000d 2 0 Non-CRC errors within host-to-device FIS |
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198 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC |
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199 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC |
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200 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC |
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201 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC |
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202 | |
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