| 1 | smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-137-generic] (local build)
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| 2 | Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: TOSHIBA THNSNJ128GCSU
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| 6 | Serial Number: 45AS10OKTB3W
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| 7 | LU WWN Device Id: 5 00080d 910376d23
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| 8 | Firmware Version: JURA0101
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| 9 | User Capacity: 128,035,676,160 bytes [128 GB]
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| 10 | Sector Size: 512 bytes logical/physical
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| 11 | Rotation Rate: Solid State Device
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| 12 | Form Factor: 2.5 inches
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| 13 | Device is: Not in smartctl database [for details use: -P showall]
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| 14 | ATA Version is: ACS-2 (minor revision not indicated)
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| 15 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
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| 16 | Local Time is: Wed Oct 17 08:08:00 2018 MDT
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| 17 | SMART support is: Available - device has SMART capability.
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| 18 | SMART support is: Enabled
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| 19 | AAM feature is: Unavailable
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| 20 | APM level is: 254 (maximum performance)
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| 21 | Rd look-ahead is: Enabled
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| 22 | Write cache is: Enabled
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| 23 | ATA Security is: Disabled, frozen [SEC2]
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| 24 | Wt Cache Reorder: Enabled
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| 25 |
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| 26 | === START OF READ SMART DATA SECTION ===
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| 27 | SMART overall-health self-assessment test result: PASSED
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| 28 |
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| 29 | General SMART Values:
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| 30 | Offline data collection status: (0x00) Offline data collection activity
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| 31 | was never started.
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| 32 | Auto Offline Data Collection: Disabled.
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed
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| 34 | without error or no self-test has ever
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| 35 | been run.
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| 36 | Total time to complete Offline
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| 37 | data collection: ( 120) seconds.
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| 38 | Offline data collection
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| 39 | capabilities: (0x5b) SMART execute Offline immediate.
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| 40 | Auto Offline data collection on/off support.
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| 41 | Suspend Offline collection upon new
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| 42 | command.
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| 43 | Offline surface scan supported.
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| 44 | Self-test supported.
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| 45 | No Conveyance Self-test supported.
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| 46 | Selective Self-test supported.
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| 47 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 48 | power-saving mode.
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| 49 | Supports SMART auto save timer.
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| 50 | Error logging capability: (0x01) Error logging supported.
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| 51 | General Purpose Logging supported.
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| 52 | Short self-test routine
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| 53 | recommended polling time: ( 2) minutes.
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| 54 | Extended self-test routine
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| 55 | recommended polling time: ( 5) minutes.
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| 56 | SCT capabilities: (0x003d) SCT Status supported.
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| 57 | SCT Error Recovery Control supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 16
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
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| 65 | 2 Throughput_Performance P-S--- 100 100 050 - 0
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| 66 | 3 Spin_Up_Time POS--- 100 100 050 - 0
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| 67 | 5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
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| 68 | 7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
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| 69 | 8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
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| 70 | 9 Power_On_Hours -O--C- 100 100 000 - 23249
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| 71 | 10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
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| 72 | 12 Power_Cycle_Count -O--C- 100 100 000 - 76
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| 73 | 167 Unknown_Attribute -O---K 100 100 000 - 0
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| 74 | 168 Unknown_Attribute -O--C- 100 100 000 - 0
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| 75 | 169 Unknown_Attribute PO--C- 100 100 010 - 100
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| 76 | 173 Unknown_Attribute -O--C- 193 193 000 - 0
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| 77 | 175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
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| 78 | 192 Power-Off_Retract_Count -O--C- 100 100 000 - 47
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| 79 | 194 Temperature_Celsius PO---K 074 065 020 - 26 (Min/Max 20/35)
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| 80 | 197 Current_Pending_Sector -O--C- 100 100 000 - 0
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| 81 | 240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
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| 82 | ||||||_ K auto-keep
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| 83 | |||||__ C event count
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| 84 | ||||___ R error rate
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| 85 | |||____ S speed/performance
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| 86 | ||_____ O updated online
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| 87 | |______ P prefailure warning
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| 88 |
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| 89 | General Purpose Log Directory Version 1
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| 90 | SMART Log Directory Version 1 [multi-sector log support]
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| 91 | Address Access R/W Size Description
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| 92 | 0x00 GPL,SL R/O 1 Log Directory
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| 93 | 0x01 SL R/O 1 Summary SMART error log
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| 94 | 0x02 SL R/O 51 Comprehensive SMART error log
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| 95 | 0x03 GPL R/O 64 Ext. Comprehensive SMART error log
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| 96 | 0x04 GPL,SL R/O 8 Device Statistics log
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| 97 | 0x06 SL R/O 1 SMART self-test log
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| 98 | 0x07 GPL R/O 1 Extended self-test log
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| 99 | 0x09 SL R/W 1 Selective self-test log
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| 100 | 0x10 GPL R/O 1 SATA NCQ Queued Error log
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| 101 | 0x11 GPL R/O 1 SATA Phy Event Counters log
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| 102 | 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
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| 103 | 0x80-0x9f GPL,SL R/W 16 Host vendor specific log
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| 104 | 0xe0 GPL,SL R/W 1 SCT Command/Status
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| 105 | 0xe1 GPL,SL R/W 1 SCT Data Transfer
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| 106 |
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| 107 | SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
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| 108 | Device Error Count: 1
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| 109 | CR = Command Register
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| 110 | FEATR = Features Register
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| 111 | COUNT = Count (was: Sector Count) Register
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| 112 | LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8
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| 113 | LH = LBA High (was: Cylinder High) Register ] LBA
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| 114 | LM = LBA Mid (was: Cylinder Low) Register ] Register
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| 115 | LL = LBA Low (was: Sector Number) Register ]
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| 116 | DV = Device (was: Device/Head) Register
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| 117 | DC = Device Control Register
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| 118 | ER = Error register
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| 119 | ST = Status register
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| 120 | Powered_Up_Time is measured from power on, and printed as
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| 121 | DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
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| 122 | SS=sec, and sss=millisec. It "wraps" after 49.710 days.
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| 123 |
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| 124 | Error 1 [0] occurred at disk power-on lifetime: 7509 hours (312 days + 21 hours)
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| 125 | When the command that caused the error occurred, the device was active or idle.
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| 126 |
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| 127 | After command completion occurred, registers were:
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| 128 | ER -- ST COUNT LBA_48 LH LM LL DV DC
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| 129 | -- -- -- == -- == == == -- -- -- -- --
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| 130 | 84 -- 51 00 28 00 00 b0 72 87 d8 ee 08 Error: ICRC, ABRT at LBA = 0xbe7287d8 = 3195176920
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| 131 |
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| 132 | Commands leading to the command that caused the error were:
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| 133 | CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name
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| 134 | -- == -- == -- == == == -- -- -- -- -- --------------- --------------------
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| 135 | ca 00 00 00 28 72 87 b0 72 87 d8 ee 08 27d+11:58:59.005 WRITE DMA
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| 136 | ca 00 00 00 20 72 87 48 72 87 b0 ee 08 27d+11:58:59.004 WRITE DMA
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| 137 | ca 00 00 00 48 72 87 10 72 87 48 ee 08 27d+11:58:59.004 WRITE DMA
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| 138 | ca 00 00 00 18 72 87 00 72 87 10 ee 08 27d+11:58:59.004 WRITE DMA
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| 139 | ca 00 00 00 08 72 86 e0 72 87 00 ee 08 27d+11:58:59.004 WRITE DMA
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| 140 |
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| 141 | SMART Extended Self-test Log Version: 1 (1 sectors)
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| 142 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 143 | # 1 Short offline Completed without error 00% 23249 -
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| 144 |
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| 145 | SMART Selective self-test log data structure revision number 1
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| 146 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 147 | 1 0 0 Not_testing
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| 148 | 2 0 0 Not_testing
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| 149 | 3 0 0 Not_testing
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| 150 | 4 0 0 Not_testing
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| 151 | 5 0 0 Not_testing
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| 152 | Selective self-test flags (0x0):
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| 153 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 154 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 155 |
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| 156 | SCT Status Version: 3
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| 157 | SCT Version (vendor specific): 3 (0x0003)
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| 158 | SCT Support Level: 0
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| 159 | Device State: Active (0)
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| 160 | Current Temperature: 26 Celsius
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| 161 | Power Cycle Min/Max Temperature: 23/28 Celsius
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| 162 | Lifetime Min/Max Temperature: 20/35 Celsius
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| 163 | Under/Over Temperature Limit Count: 0/0
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| 164 | Vendor specific:
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| 165 | 00 00 04 00 01 01 00 05 05 00 00 00 00 00 00 00
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| 166 | 00 02 00 00 fc 26 fd 04 02 02 00 00 00 00 00 06
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| 167 |
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| 168 | SCT Temperature History Version: 2
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| 169 | Temperature Sampling Period: 1 minute
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| 170 | Temperature Logging Interval: 1 minute
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| 171 | Min/Max recommended Temperature: 5/40 Celsius
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| 172 | Min/Max Temperature Limit: 0/80 Celsius
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| 173 | Temperature History Size (Index): 128 (6)
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| 174 |
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| 175 | Index Estimated Time Temperature Celsius
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| 176 | 7 2018-10-17 06:01 26 *******
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| 177 | 8 2018-10-17 06:02 25 ******
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| 178 | 9 2018-10-17 06:03 25 ******
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| 179 | 10 2018-10-17 06:04 26 *******
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| 180 | 11 2018-10-17 06:05 25 ******
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| 181 | 12 2018-10-17 06:06 26 *******
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| 182 | 13 2018-10-17 06:07 26 *******
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| 183 | 14 2018-10-17 06:08 26 *******
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| 184 | 15 2018-10-17 06:09 25 ******
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| 185 | 16 2018-10-17 06:10 26 *******
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| 186 | ... ..(108 skipped). .. *******
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| 187 | 125 2018-10-17 07:59 26 *******
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| 188 | 126 2018-10-17 08:00 28 *********
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| 189 | 127 2018-10-17 08:01 28 *********
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| 190 | 0 2018-10-17 08:02 27 ********
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| 191 | 1 2018-10-17 08:03 27 ********
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| 192 | 2 2018-10-17 08:04 27 ********
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| 193 | 3 2018-10-17 08:05 26 *******
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| 194 | ... ..( 2 skipped). .. *******
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| 195 | 6 2018-10-17 08:08 26 *******
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| 196 |
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| 197 | SCT Error Recovery Control:
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| 198 | Read: 600 (60.0 seconds)
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| 199 | Write: 600 (60.0 seconds)
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| 200 |
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| 201 | Device Statistics (GP Log 0x04)
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| 202 | Page Offset Size Value Flags Description
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| 203 | 0x01 ===== = = === == General Statistics (rev 2) ==
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| 204 | 0x01 0x008 4 76 --- Lifetime Power-On Resets
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| 205 | 0x01 0x018 6 4465687868 --- Logical Sectors Written
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| 206 | 0x01 0x020 6 61310078 --- Number of Write Commands
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| 207 | 0x01 0x028 6 824941262 --- Logical Sectors Read
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| 208 | 0x01 0x030 6 14270413 --- Number of Read Commands
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| 209 | 0x04 ===== = = === == General Errors Statistics (rev 1) ==
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| 210 | 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
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| 211 | 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion
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| 212 | 0x05 ===== = = === == Temperature Statistics (rev 1) ==
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| 213 | 0x05 0x008 1 26 --- Current Temperature
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| 214 | 0x05 0x010 1 24 --- Average Short Term Temperature
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| 215 | 0x05 0x018 1 24 --- Average Long Term Temperature
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| 216 | 0x05 0x020 1 32 --- Highest Temperature
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| 217 | 0x05 0x028 1 22 --- Lowest Temperature
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| 218 | 0x05 0x030 1 29 --- Highest Average Short Term Temperature
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| 219 | 0x05 0x038 1 22 --- Lowest Average Short Term Temperature
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| 220 | 0x05 0x040 1 26 --- Highest Average Long Term Temperature
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| 221 | 0x05 0x048 1 23 --- Lowest Average Long Term Temperature
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| 222 | 0x05 0x050 4 0 --- Time in Over-Temperature
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| 223 | 0x05 0x058 1 40 --- Specified Maximum Operating Temperature
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| 224 | 0x05 0x060 4 0 --- Time in Under-Temperature
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| 225 | 0x05 0x068 1 5 --- Specified Minimum Operating Temperature
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| 226 | 0x06 ===== = = === == Transport Statistics (rev 1) ==
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| 227 | 0x06 0x008 4 775 --- Number of Hardware Resets
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| 228 | 0x06 0x018 4 0 --- Number of Interface CRC Errors
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| 229 | 0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
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| 230 | 0x07 0x008 1 7 N-- Percentage Used Endurance Indicator
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| 231 | |||_ C monitored condition met
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| 232 | ||__ D supports DSN
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| 233 | |___ N normalized value
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| 234 |
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| 235 | SATA Phy Event Counters (GP Log 0x11)
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| 236 | ID Size Value Description
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| 237 | 0x0001 2 0 Command failed due to ICRC error
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| 238 | 0x0002 4 0 R_ERR response for data FIS
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| 239 | 0x0003 2 0 R_ERR response for device-to-host data FIS
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| 240 | 0x0004 2 0 R_ERR response for host-to-device data FIS
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| 241 | 0x0005 4 0 R_ERR response for non-data FIS
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| 242 | 0x0006 2 0 R_ERR response for device-to-host non-data FIS
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| 243 | 0x0007 2 0 R_ERR response for host-to-device non-data FIS
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| 244 | 0x0008 2 0 Device-to-host non-data FIS retries
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| 245 | 0x0009 4 18 Transition from drive PhyRdy to drive PhyNRdy
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| 246 | 0x000a 4 19 Device-to-host register FISes sent due to a COMRESET
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| 247 | 0x000b 4 0 CRC errors within host-to-device FIS
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| 248 | 0x000d 4 0 Non-CRC errors within host-to-device FIS
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| 249 | 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
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| 250 | 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
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| 251 | 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
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| 252 | 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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| 253 |
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