Ticket #1104: smartctl-SAMSUNG-SSD_860_PRO_1TB.txt

File smartctl-SAMSUNG-SSD_860_PRO_1TB.txt, 6.4 KB (added by IT-PTT-Support, 6 years ago)
Line 
1smartctl 6.6 2017-11-05 r4594 [x86_64-x86pc-nto-qnx7.0.0] (local build)
2Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
3
4=== START OF INFORMATION SECTION ===
5Device Model: Samsung SSD 860 PRO 1TB
6Firmware Version: RVM01B6Q
7User Capacity: 1,024,209,543,168 bytes [1.02 TB]
8Sector Size: 512 bytes logical/physical
9Rotation Rate: Solid State Device
10Form Factor: 2.5 inches
11Device is: Not in smartctl database [for details use: -P showall]
12ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
13SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
14Local Time is: Fri Oct 12 11:38:16 2018 CEST
15SMART support is: Available - device has SMART capability.
16SMART support is: Enabled
17AAM feature is: Unavailable
18APM feature is: Unavailable
19Rd look-ahead is: Enabled
20Write cache is: Enabled
21DSN feature is: Unavailable
22ATA Security is: Disabled, frozen [SEC2]
23Write SCT (Get) Feature Control Command failed: No error
24Wt Cache Reorder: Unknown (SCT Feature Control command failed)
25
26=== START OF READ SMART DATA SECTION ===
27SMART overall-health self-assessment test result: PASSED
28
29General SMART Values:
30Offline data collection status: (0x00) Offline data collection activity
31 was never started.
32 Auto Offline Data Collection: Disabled.
33Self-test execution status: ( 0) The previous self-test routine completed
34 without error or no self-test has ever
35 been run.
36Total time to complete Offline
37data collection: ( 0) seconds.
38Offline data collection
39capabilities: (0x53) SMART execute Offline immediate.
40 Auto Offline data collection on/off support.
41 Suspend Offline collection upon new
42 command.
43 No Offline surface scan supported.
44 Self-test supported.
45 No Conveyance Self-test supported.
46 Selective Self-test supported.
47SMART capabilities: (0x0003) Saves SMART data before entering
48 power-saving mode.
49 Supports SMART auto save timer.
50Error logging capability: (0x01) Error logging supported.
51 General Purpose Logging supported.
52Short self-test routine
53recommended polling time: ( 2) minutes.
54Extended self-test routine
55recommended polling time: ( 85) minutes.
56SCT capabilities: (0x003d) SCT Status supported.
57 SCT Error Recovery Control supported.
58 SCT Feature Control supported.
59 SCT Data Table supported.
60
61SMART Attributes Data Structure revision number: 1
62Vendor Specific SMART Attributes with Thresholds:
63ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
64 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
65 9 Power_On_Hours -O--CK 100 100 000 - 0
66 12 Power_Cycle_Count -O--CK 099 099 000 - 2
67177 Wear_Leveling_Count PO--C- 100 100 000 - 0
68179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
69181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
70182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
71183 Runtime_Bad_Block PO--C- 100 100 010 - 0
72187 Reported_Uncorrect -O--CK 100 100 000 - 0
73190 Airflow_Temperature_Cel -O--CK 075 071 000 - 25
74195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
75199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
76235 Unknown_Attribute -O--C- 100 100 000 - 0
77241 Total_LBAs_Written -O--CK 100 100 000 - 0
78 ||||||_ K auto-keep
79 |||||__ C event count
80 ||||___ R error rate
81 |||____ S speed/performance
82 ||_____ O updated online
83 |______ P prefailure warning
84
85ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
86Read GP Log Directory failed
87
88SMART Log Directory Version 1 [multi-sector log support]
89Address Access R/W Size Description
900x00 SL R/O 1 Log Directory
910x01 SL R/O 1 Summary SMART error log
920x02 SL R/O 1 Comprehensive SMART error log
930x04 SL R/O 8 Device Statistics log
940x06 SL R/O 1 SMART self-test log
950x09 SL R/W 1 Selective self-test log
960x30 SL R/O 9 IDENTIFY DEVICE data log
970x80-0x9f SL R/W 16 Host vendor specific log
980xa1 SL VS 16 Device vendor specific log
990xa5 SL VS 16 Device vendor specific log
1000xce-0xcf SL VS 16 Device vendor specific log
1010xe0 SL R/W 1 SCT Command/Status
1020xe1 SL R/W 1 SCT Data Transfer
103
104SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
105
106SMART Error Log Version: 1
107No Errors Logged
108
109SMART Extended Self-test Log (GP Log 0x07) not supported
110
111SMART Self-test log structure revision number 1
112Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
113# 1 Short offline Completed without error 00% 0 -
114
115SMART Selective self-test log data structure revision number 1
116 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
117 1 0 0 Not_testing
118 2 0 0 Not_testing
119 3 0 0 Not_testing
120 4 0 0 Not_testing
121 5 0 0 Not_testing
122Selective self-test flags (0x0):
123 After scanning selected spans, do NOT read-scan remainder of disk.
124If Selective self-test is pending on power-up, resume after 0 minute delay.
125
126SCT Status Version: 3
127SCT Version (vendor specific): 256 (0x0100)
128SCT Support Level: 1
129Device State: Active (0)
130Current Temperature: 25 Celsius
131Power Cycle Min/Max Temperature: 22/22 Celsius
132Lifetime Min/Max Temperature: 40/40 Celsius
133Under/Over Temperature Limit Count: 0/0
134SMART Status: 0xc24f (PASSED)
135
136Write SCT Data Table failed: No error
137Read SCT Temperature History failed
138
139Write SCT (Get) Error Recovery Control Command failed: No error
140SCT (Get) Error Recovery Control command failed
141
142Device Statistics (SMART Log 0x04)
143Page Offset Size Value Flags Description
144ATA_SMART_READ_LOG failed: Multi-sector ATA commands not implemented
145Read Device Statistics pages 0x00-0x07 failed
146
147Pending Defects log (GP Log 0x0c) not supported
148
149ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
150Read SATA Phy Event Counters failed
151