| 1 | smartctl 6.6 2017-11-05 r4594 [x86_64-x86pc-nto-qnx7.0.0] (local build)
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| 2 | Copyright (C) 2002-17, Bruce Allen, Christian Franke, www.smartmontools.org
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| 3 |
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| 4 | === START OF INFORMATION SECTION ===
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| 5 | Device Model: Samsung SSD 860 PRO 512GB
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| 6 | Firmware Version: RVM01B6Q
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| 7 | User Capacity: 512,110,190,592 bytes [512 GB]
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| 8 | Sector Size: 512 bytes logical/physical
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| 9 | Rotation Rate: Solid State Device
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| 10 | Form Factor: 2.5 inches
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| 11 | Device is: Not in smartctl database [for details use: -P showall]
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| 12 | ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5
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| 13 | SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
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| 14 | Local Time is: Fri Oct 12 11:27:46 2018 CEST
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| 15 | SMART support is: Available - device has SMART capability.
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| 16 | SMART support is: Enabled
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| 17 | AAM feature is: Unavailable
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| 18 | APM feature is: Unavailable
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| 19 | Rd look-ahead is: Enabled
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| 20 | Write cache is: Enabled
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| 21 | DSN feature is: Unavailable
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| 22 | ATA Security is: Disabled, frozen [SEC2]
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| 23 | Write SCT (Get) Feature Control Command failed: No error
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| 24 | Wt Cache Reorder: Unknown (SCT Feature Control command failed)
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| 25 |
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| 26 | === START OF READ SMART DATA SECTION ===
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| 27 | SMART overall-health self-assessment test result: PASSED
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| 28 |
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| 29 | General SMART Values:
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| 30 | Offline data collection status: (0x00) Offline data collection activity
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| 31 | was never started.
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| 32 | Auto Offline Data Collection: Disabled.
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| 33 | Self-test execution status: ( 0) The previous self-test routine completed
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| 34 | without error or no self-test has ever
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| 35 | been run.
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| 36 | Total time to complete Offline
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| 37 | data collection: ( 0) seconds.
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| 38 | Offline data collection
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| 39 | capabilities: (0x53) SMART execute Offline immediate.
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| 40 | Auto Offline data collection on/off support.
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| 41 | Suspend Offline collection upon new
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| 42 | command.
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| 43 | No Offline surface scan supported.
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| 44 | Self-test supported.
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| 45 | No Conveyance Self-test supported.
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| 46 | Selective Self-test supported.
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| 47 | SMART capabilities: (0x0003) Saves SMART data before entering
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| 48 | power-saving mode.
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| 49 | Supports SMART auto save timer.
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| 50 | Error logging capability: (0x01) Error logging supported.
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| 51 | General Purpose Logging supported.
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| 52 | Short self-test routine
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| 53 | recommended polling time: ( 2) minutes.
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| 54 | Extended self-test routine
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| 55 | recommended polling time: ( 85) minutes.
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| 56 | SCT capabilities: (0x003d) SCT Status supported.
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| 57 | SCT Error Recovery Control supported.
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| 58 | SCT Feature Control supported.
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| 59 | SCT Data Table supported.
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| 60 |
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| 61 | SMART Attributes Data Structure revision number: 1
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| 62 | Vendor Specific SMART Attributes with Thresholds:
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| 63 | ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
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| 64 | 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
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| 65 | 9 Power_On_Hours -O--CK 100 100 000 - 0
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| 66 | 12 Power_Cycle_Count -O--CK 099 099 000 - 3
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| 67 | 177 Wear_Leveling_Count PO--C- 100 100 000 - 0
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| 68 | 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
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| 69 | 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
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| 70 | 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
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| 71 | 183 Runtime_Bad_Block PO--C- 100 100 010 - 0
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| 72 | 187 Reported_Uncorrect -O--CK 100 100 000 - 0
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| 73 | 190 Airflow_Temperature_Cel -O--CK 072 064 000 - 28
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| 74 | 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
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| 75 | 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
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| 76 | 235 Unknown_Attribute -O--C- 099 099 000 - 1
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| 77 | 241 Total_LBAs_Written -O--CK 100 100 000 - 0
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| 78 | ||||||_ K auto-keep
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| 79 | |||||__ C event count
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| 80 | ||||___ R error rate
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| 81 | |||____ S speed/performance
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| 82 | ||_____ O updated online
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| 83 | |______ P prefailure warning
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| 84 |
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| 85 | ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
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| 86 | Read GP Log Directory failed
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| 87 |
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| 88 | SMART Log Directory Version 1 [multi-sector log support]
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| 89 | Address Access R/W Size Description
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| 90 | 0x00 SL R/O 1 Log Directory
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| 91 | 0x01 SL R/O 1 Summary SMART error log
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| 92 | 0x02 SL R/O 1 Comprehensive SMART error log
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| 93 | 0x04 SL R/O 8 Device Statistics log
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| 94 | 0x06 SL R/O 1 SMART self-test log
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| 95 | 0x09 SL R/W 1 Selective self-test log
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| 96 | 0x30 SL R/O 9 IDENTIFY DEVICE data log
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| 97 | 0x80-0x9f SL R/W 16 Host vendor specific log
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| 98 | 0xa1 SL VS 16 Device vendor specific log
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| 99 | 0xa5 SL VS 16 Device vendor specific log
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| 100 | 0xce-0xcf SL VS 16 Device vendor specific log
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| 101 | 0xe0 SL R/W 1 SCT Command/Status
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| 102 | 0xe1 SL R/W 1 SCT Data Transfer
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| 103 |
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| 104 | SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
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| 105 |
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| 106 | SMART Error Log Version: 1
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| 107 | No Errors Logged
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| 108 |
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| 109 | SMART Extended Self-test Log (GP Log 0x07) not supported
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| 110 |
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| 111 | SMART Self-test log structure revision number 1
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| 112 | Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
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| 113 | # 1 Short offline Completed without error 00% 0 -
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| 114 | # 2 Short offline Completed without error 00% 0 -
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| 115 |
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| 116 | SMART Selective self-test log data structure revision number 1
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| 117 | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
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| 118 | 1 0 0 Not_testing
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| 119 | 2 0 0 Not_testing
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| 120 | 3 0 0 Not_testing
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| 121 | 4 0 0 Not_testing
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| 122 | 5 0 0 Not_testing
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| 123 | Selective self-test flags (0x0):
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| 124 | After scanning selected spans, do NOT read-scan remainder of disk.
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| 125 | If Selective self-test is pending on power-up, resume after 0 minute delay.
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| 126 |
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| 127 | SCT Status Version: 3
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| 128 | SCT Version (vendor specific): 256 (0x0100)
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| 129 | SCT Support Level: 1
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| 130 | Device State: Active (0)
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| 131 | Current Temperature: 28 Celsius
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| 132 | Power Cycle Min/Max Temperature: 40/40 Celsius
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| 133 | Lifetime Min/Max Temperature: 26/40 Celsius
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| 134 | Under/Over Temperature Limit Count: 0/0
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| 135 | SMART Status: 0xc24f (PASSED)
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| 136 |
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| 137 | Write SCT Data Table failed: No error
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| 138 | Read SCT Temperature History failed
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| 139 |
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| 140 | Write SCT (Get) Error Recovery Control Command failed: No error
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| 141 | SCT (Get) Error Recovery Control command failed
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| 142 |
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| 143 | Device Statistics (SMART Log 0x04)
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| 144 | Page Offset Size Value Flags Description
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| 145 | ATA_SMART_READ_LOG failed: Multi-sector ATA commands not implemented
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| 146 | Read Device Statistics pages 0x00-0x07 failed
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| 147 |
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| 148 | Pending Defects log (GP Log 0x0c) not supported
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| 149 |
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| 150 | ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented
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| 151 | Read SATA Phy Event Counters failed
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| 152 |
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